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Trabalho de evento-anais periodico
Dynamics of ion migration in hybrid halide perovskite thin films grown by EB-PVD for photonics applications (Poster + Paper) (2025)
Huaman, Jose Luis Clabel ; Siu Li, Máximo ; Manzani, Danilo ; Mendonça, Cleber Renato
Source: Proceedings of SPIE. Conference titles: Organic Photonics + Electronics. Unidades: IFSC, IQSC
Subjects: FILMES FINOS, ESPECTROSCOPIA RAMAN, FOTÔNICA
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ABNT
HUAMAN, Jose Luis Clabel et al. Dynamics of ion migration in hybrid halide perovskite thin films grown by EB-PVD for photonics applications (Poster + Paper). Proceedings of SPIE. Bellingham: Instituto de Física de São Carlos, Universidade de São Paulo. Disponível em: https://doi.org/10.1117/12.3063863. Acesso em: 09 nov. 2025. , 2025
APA
Huaman, J. L. C., Siu Li, M., Manzani, D., & Mendonça, C. R. (2025). Dynamics of ion migration in hybrid halide perovskite thin films grown by EB-PVD for photonics applications (Poster + Paper). Proceedings of SPIE. Bellingham: Instituto de Física de São Carlos, Universidade de São Paulo. doi:10.1117/12.3063863
NLM
Huaman JLC, Siu Li M, Manzani D, Mendonça CR. Dynamics of ion migration in hybrid halide perovskite thin films grown by EB-PVD for photonics applications (Poster + Paper) [Internet]. Proceedings of SPIE. 2025 ; 13589 1358908-1-1358908-2.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1117/12.3063863
Vancouver
Huaman JLC, Siu Li M, Manzani D, Mendonça CR. Dynamics of ion migration in hybrid halide perovskite thin films grown by EB-PVD for photonics applications (Poster + Paper) [Internet]. Proceedings of SPIE. 2025 ; 13589 1358908-1-1358908-2.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1117/12.3063863
Trabalho de evento-anais periodico
High near-infrared emission intensity of Er3+-doped zirconium oxide films on a Si(100) substrate (2013)
Rivera, V. A. G.; Ferri, F. A.; Clabel H., J. L.; Kawamura, M. K.; Silva, Marcelo de Assumpção Pereira da ; Nunes, Luiz Antônio de Oliveira ; Siu Li, Máximo ; Marega Junior, Euclydes
Source: Proceedings of SPIE. Conference titles: Optical Components and Materials. Unidade: IFSC
Subjects: FILMES FINOS, ESPECTROSCOPIA, TERRAS RARAS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
RIVERA, V. A. G. et al. High near-infrared emission intensity of Er3+-doped zirconium oxide films on a Si(100) substrate. Proceedings of SPIE. Bellingham: International Society for Optical Engineering - SPIE. Disponível em: https://doi.org/10.1117/12.2004783. Acesso em: 09 nov. 2025. , 2013
APA
Rivera, V. A. G., Ferri, F. A., Clabel H., J. L., Kawamura, M. K., Silva, M. de A. P. da, Nunes, L. A. de O., et al. (2013). High near-infrared emission intensity of Er3+-doped zirconium oxide films on a Si(100) substrate. Proceedings of SPIE. Bellingham: International Society for Optical Engineering - SPIE. doi:10.1117/12.2004783
NLM
Rivera VAG, Ferri FA, Clabel H. JL, Kawamura MK, Silva M de AP da, Nunes LA de O, Siu Li M, Marega Junior E. High near-infrared emission intensity of Er3+-doped zirconium oxide films on a Si(100) substrate [Internet]. Proceedings of SPIE. 2013 ; 8621 86211K-1-86211K-9.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1117/12.2004783
Vancouver
Rivera VAG, Ferri FA, Clabel H. JL, Kawamura MK, Silva M de AP da, Nunes LA de O, Siu Li M, Marega Junior E. High near-infrared emission intensity of Er3+-doped zirconium oxide films on a Si(100) substrate [Internet]. Proceedings of SPIE. 2013 ; 8621 86211K-1-86211K-9.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1117/12.2004783
Trabalho de evento-anais periodico
Photoreflectance characterization of 'gama'-doped p-GaAs (1990)
Bernussi, Ayrton A.; Iikawa, F.; Motisuke, Paulo; Basmaji, Pierre; Siu Li, Máximo ; Hipólito, Oscar
Source: Proceedings of SPIE. Conference titles: International Conference of Modulation Spectroscopy. Unidade: IFQSC
Assunto: FÍSICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
BERNUSSI, Ayrton A. et al. Photoreflectance characterization of 'gama'-doped p-GaAs. Proceedings of SPIE. Bellingham: International Society for Optical Engineering - SPIE. Disponível em: https://doi.org/10.1117/12.20864. Acesso em: 09 nov. 2025. , 1990
APA
Bernussi, A. A., Iikawa, F., Motisuke, P., Basmaji, P., Siu Li, M., & Hipólito, O. (1990). Photoreflectance characterization of 'gama'-doped p-GaAs. Proceedings of SPIE. Bellingham: International Society for Optical Engineering - SPIE. doi:10.1117/12.20864
NLM
Bernussi AA, Iikawa F, Motisuke P, Basmaji P, Siu Li M, Hipólito O. Photoreflectance characterization of 'gama'-doped p-GaAs [Internet]. Proceedings of SPIE. 1990 ; 1286 348-358.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1117/12.20864
Vancouver
Bernussi AA, Iikawa F, Motisuke P, Basmaji P, Siu Li M, Hipólito O. Photoreflectance characterization of 'gama'-doped p-GaAs [Internet]. Proceedings of SPIE. 1990 ; 1286 348-358.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1117/12.20864

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