Filtros : "CIRCUITOS INTEGRADOS MOS" "Indexado no COMPENDEX" Limpar

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  • Source: IEEE Transactions on Electron Devices. Unidade: EP

    Assunto: CIRCUITOS INTEGRADOS MOS

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      CERDEIRA, Antonio et al. Advantages of the graded-channel SOI FD MOSFET for application as a quasi-linear resistor. IEEE Transactions on Electron Devices, v. 52, n. 5, p. 967-972, 2005Tradução . . Disponível em: https://doi.org/10.1109/ted.2005.846327. Acesso em: 16 nov. 2025.
    • APA

      Cerdeira, A., Alemán, M. A., Pavanello, M. A., Martino, J. A., Flandre, D., & Vancaillie, L. (2005). Advantages of the graded-channel SOI FD MOSFET for application as a quasi-linear resistor. IEEE Transactions on Electron Devices, 52( 5), 967-972. doi:10.1109/ted.2005.846327
    • NLM

      Cerdeira A, Alemán MA, Pavanello MA, Martino JA, Flandre D, Vancaillie L. Advantages of the graded-channel SOI FD MOSFET for application as a quasi-linear resistor [Internet]. IEEE Transactions on Electron Devices. 2005 ;52( 5): 967-972.[citado 2025 nov. 16 ] Available from: https://doi.org/10.1109/ted.2005.846327
    • Vancouver

      Cerdeira A, Alemán MA, Pavanello MA, Martino JA, Flandre D, Vancaillie L. Advantages of the graded-channel SOI FD MOSFET for application as a quasi-linear resistor [Internet]. IEEE Transactions on Electron Devices. 2005 ;52( 5): 967-972.[citado 2025 nov. 16 ] Available from: https://doi.org/10.1109/ted.2005.846327
  • Source: Electrochemical and Solid-State Letters. Unidade: EP

    Assunto: CIRCUITOS INTEGRADOS MOS

    How to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      SONNENBERG, Victor e MARTINO, João Antonio. A simple method for minimizing the transient effect in SOI nMOSFETs at low temperature. Electrochemical and Solid-State Letters, v. 2, n. 11, p. 585-586, 1999Tradução . . Acesso em: 16 nov. 2025.
    • APA

      Sonnenberg, V., & Martino, J. A. (1999). A simple method for minimizing the transient effect in SOI nMOSFETs at low temperature. Electrochemical and Solid-State Letters, 2( 11), 585-586.
    • NLM

      Sonnenberg V, Martino JA. A simple method for minimizing the transient effect in SOI nMOSFETs at low temperature. Electrochemical and Solid-State Letters. 1999 ;2( 11): 585-586.[citado 2025 nov. 16 ]
    • Vancouver

      Sonnenberg V, Martino JA. A simple method for minimizing the transient effect in SOI nMOSFETs at low temperature. Electrochemical and Solid-State Letters. 1999 ;2( 11): 585-586.[citado 2025 nov. 16 ]

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