Nicoletti, Talitha; Martino, João Antonio 
; Santos, S; Almeida, L; Aoulaiche, Marc; Veloso, A; Jurczak, Michael J; Simoen, Eddy ; Claeys, Cor
Fonte: Proceedings of the conference. Nome do evento: International Conference on Ultimate Integration on Silicon. Unidade: EP
Assunto: CIRCUITOS INTEGRADOS
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ABNT
NICOLETTI, Talitha et al. The impact of gate length scaling on UTBOX FDSOI devices: the digital/analog performance of extension-less structures. 2012, Anais.. Piscataway: IEEE, 2012. Disponível em: https://doi.org/10.1109/ULIS.2012.6193372. Acesso em: 16 nov. 2025.APA
Nicoletti, T., Martino, J. A., Santos, S., Almeida, L., Aoulaiche, M., Veloso, A., et al. (2012). The impact of gate length scaling on UTBOX FDSOI devices: the digital/analog performance of extension-less structures. In Proceedings of the conference. Piscataway: IEEE. doi:10.1109/ULIS.2012.6193372NLM
Nicoletti T, Martino JA, Santos S, Almeida L, Aoulaiche M, Veloso A, Jurczak MJ, Simoen E, Claeys C. The impact of gate length scaling on UTBOX FDSOI devices: the digital/analog performance of extension-less structures [Internet]. Proceedings of the conference. 2012 ;[citado 2025 nov. 16 ] Available from: https://doi.org/10.1109/ULIS.2012.6193372Vancouver
Nicoletti T, Martino JA, Santos S, Almeida L, Aoulaiche M, Veloso A, Jurczak MJ, Simoen E, Claeys C. The impact of gate length scaling on UTBOX FDSOI devices: the digital/analog performance of extension-less structures [Internet]. Proceedings of the conference. 2012 ;[citado 2025 nov. 16 ] Available from: https://doi.org/10.1109/ULIS.2012.6193372
