ReP USP - Resultado da busca

Artigo de periodico
A simple technique to reduce the influence of the series resistance on the BULK and SOI MOSFET parameter extraction (1997)
Nicolett, Aparecido Sirley; Martino, João Antonio
Source: Journal of Solid-State Devices and Circuits. Unidade: EP
Assunto: CIRCUITOS INTEGRADOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
NICOLETT, Aparecido Sirley e MARTINO, João Antonio. A simple technique to reduce the influence of the series resistance on the BULK and SOI MOSFET parameter extraction. Journal of Solid-State Devices and Circuits, v. 5, n. 1, p. 5-8, 1997Tradução . . Acesso em: 17 nov. 2025.
APA
Nicolett, A. S., & Martino, J. A. (1997). A simple technique to reduce the influence of the series resistance on the BULK and SOI MOSFET parameter extraction. Journal of Solid-State Devices and Circuits, 5( 1), 5-8.
NLM
Nicolett AS, Martino JA. A simple technique to reduce the influence of the series resistance on the BULK and SOI MOSFET parameter extraction. Journal of Solid-State Devices and Circuits. 1997 ;5( 1): 5-8.[citado 2025 nov. 17 ]
Vancouver
Nicolett AS, Martino JA. A simple technique to reduce the influence of the series resistance on the BULK and SOI MOSFET parameter extraction. Journal of Solid-State Devices and Circuits. 1997 ;5( 1): 5-8.[citado 2025 nov. 17 ]
Artigo de periodico
E-TSPC: extended true single-phase-clock MOS circuit technique for high speed applications (1997)
Soares Junior, João Navarro ; Van Noije, Wilhelmus Adrianus Maria
Source: Journal of Solid-State Devices and Circuits. Unidade: EP
Assunto: CIRCUITOS INTEGRADOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SOARES JUNIOR, João Navarro e VAN NOIJE, Wilhelmus Adrianus Maria. E-TSPC: extended true single-phase-clock MOS circuit technique for high speed applications. Journal of Solid-State Devices and Circuits, v. 5, n. 2, p. 21-26, 1997Tradução . . Acesso em: 17 nov. 2025.
APA
Soares Junior, J. N., & Van Noije, W. A. M. (1997). E-TSPC: extended true single-phase-clock MOS circuit technique for high speed applications. Journal of Solid-State Devices and Circuits, 5( 2), 21-26.
NLM
Soares Junior JN, Van Noije WAM. E-TSPC: extended true single-phase-clock MOS circuit technique for high speed applications. Journal of Solid-State Devices and Circuits. 1997 ; 5( 2): 21-26.[citado 2025 nov. 17 ]
Vancouver
Soares Junior JN, Van Noije WAM. E-TSPC: extended true single-phase-clock MOS circuit technique for high speed applications. Journal of Solid-State Devices and Circuits. 1997 ; 5( 2): 21-26.[citado 2025 nov. 17 ]
Artigo de periodico
Improved channel lenght and series resistance extraction for short-channel MOSFETs suffering from mobility degradation (1997)
Nicolett, Aparecido Sirley; Martino, João Antonio ; Simoen, Eddy ; Claeys, Cor
Source: Journal of Solid-State Devices and Circuits. Unidade: EP
Assunto: CIRCUITOS INTEGRADOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
NICOLETT, Aparecido Sirley et al. Improved channel lenght and series resistance extraction for short-channel MOSFETs suffering from mobility degradation. Journal of Solid-State Devices and Circuits, v. 5, n. 1, p. 1-4, 1997Tradução . . Acesso em: 17 nov. 2025.
APA
Nicolett, A. S., Martino, J. A., Simoen, E., & Claeys, C. (1997). Improved channel lenght and series resistance extraction for short-channel MOSFETs suffering from mobility degradation. Journal of Solid-State Devices and Circuits, 5( 1), 1-4.
NLM
Nicolett AS, Martino JA, Simoen E, Claeys C. Improved channel lenght and series resistance extraction for short-channel MOSFETs suffering from mobility degradation. Journal of Solid-State Devices and Circuits. 1997 ; 5( 1): 1-4.[citado 2025 nov. 17 ]
Vancouver
Nicolett AS, Martino JA, Simoen E, Claeys C. Improved channel lenght and series resistance extraction for short-channel MOSFETs suffering from mobility degradation. Journal of Solid-State Devices and Circuits. 1997 ; 5( 1): 1-4.[citado 2025 nov. 17 ]

USP Schools

ReP

Filtros

Authors