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Artigo de periodico
SiC Structural Analysis on Energized Microlamps in Micrometric Scale (2025)
Cassimiro, Vinicius R S ; Cunha Júnior, Rubens M; Rehder, Gustavo P ; Pereyra, Inés ; Carreño, Marcelo N P ; Alayo, Marco I. ; Trcera, Nicolas ; Scopel, Wanderla L ; Pérez, Carlos A. ; Rodrigues, Cleber L. ; Fantini, Márcia Carvalho de Abreu
Fonte: ECS Journal of Solid State Science and Technology. Unidades: EP, IF
Assunto: FILMES FINOS
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ABNT
CASSIMIRO, Vinicius R S et al. SiC Structural Analysis on Energized Microlamps in Micrometric Scale. ECS Journal of Solid State Science and Technology, 2025Tradução . . Disponível em: https://doi.org/10.1149/2162-8777/adc2d1. Acesso em: 28 nov. 2025.
APA
Cassimiro, V. R. S., Cunha Júnior, R. M., Rehder, G. P., Pereyra, I., Carreño, M. N. P., Alayo, M. I., et al. (2025). SiC Structural Analysis on Energized Microlamps in Micrometric Scale. ECS Journal of Solid State Science and Technology. doi:https://doi.org/10.1149/2162-8777/adc2d1
NLM
Cassimiro VRS, Cunha Júnior RM, Rehder GP, Pereyra I, Carreño MNP, Alayo MI, Trcera N, Scopel WL, Pérez CA, Rodrigues CL, Fantini MC de A. SiC Structural Analysis on Energized Microlamps in Micrometric Scale [Internet]. ECS Journal of Solid State Science and Technology. 2025 ;[citado 2025 nov. 28 ] Available from: https://doi.org/10.1149/2162-8777/adc2d1
Vancouver
Cassimiro VRS, Cunha Júnior RM, Rehder GP, Pereyra I, Carreño MNP, Alayo MI, Trcera N, Scopel WL, Pérez CA, Rodrigues CL, Fantini MC de A. SiC Structural Analysis on Energized Microlamps in Micrometric Scale [Internet]. ECS Journal of Solid State Science and Technology. 2025 ;[citado 2025 nov. 28 ] Available from: https://doi.org/10.1149/2162-8777/adc2d1
Artigo de periodico
Urea detection using commercial field effect transistors (2018)
Silva, G. O.; Mulato, Marcelo
Fonte: ECS Journal of Solid State Science and Technology. Unidade: FFCLRP
Assuntos: SENSORES BIOMÉDICOS, UREIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SILVA, G. O. e MULATO, Marcelo. Urea detection using commercial field effect transistors. ECS Journal of Solid State Science and Technology, v. 7, n. 7, p. Q3014 - Q3019, 2018Tradução . . Disponível em: https://doi.org/10.1149/2.0031807jss. Acesso em: 28 nov. 2025.
APA
Silva, G. O., & Mulato, M. (2018). Urea detection using commercial field effect transistors. ECS Journal of Solid State Science and Technology, 7( 7), Q3014 - Q3019. doi:10.1149/2.0031807jss
NLM
Silva GO, Mulato M. Urea detection using commercial field effect transistors [Internet]. ECS Journal of Solid State Science and Technology. 2018 ; 7( 7): Q3014 - Q3019.[citado 2025 nov. 28 ] Available from: https://doi.org/10.1149/2.0031807jss
Vancouver
Silva GO, Mulato M. Urea detection using commercial field effect transistors [Internet]. ECS Journal of Solid State Science and Technology. 2018 ; 7( 7): Q3014 - Q3019.[citado 2025 nov. 28 ] Available from: https://doi.org/10.1149/2.0031807jss
Artigo de periodico
Low-Frequency Noise Studies on Fully Depleted UTBOX Silicon-on-Insulator nMOSFETs: Challenges and Opportunities (2013)
Simoen, Eddy ; Martino, João Antonio ; Aoulaiche, Marc; Santos, Sara Dereste dos; Strobel, V; Cretu, B; Routoure, J.-M; Carin, R; Tejada, Julián; Claeys, Cor ; Rodríguez, A. Luque
Fonte: ECS Journal of Solid State Science and Technology. Unidade: EP
Assuntos: SILÍCIO, FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SIMOEN, Eddy et al. Low-Frequency Noise Studies on Fully Depleted UTBOX Silicon-on-Insulator nMOSFETs: Challenges and Opportunities. ECS Journal of Solid State Science and Technology, v. 2, n. 11, p. Q205-Q210, 2013Tradução . . Disponível em: https://doi.org/10.1149/2.011311jss. Acesso em: 28 nov. 2025.
APA
Simoen, E., Martino, J. A., Aoulaiche, M., Santos, S. D. dos, Strobel, V., Cretu, B., et al. (2013). Low-Frequency Noise Studies on Fully Depleted UTBOX Silicon-on-Insulator nMOSFETs: Challenges and Opportunities. ECS Journal of Solid State Science and Technology, 2( 11), Q205-Q210. doi:10.1149/2.011311jss
NLM
Simoen E, Martino JA, Aoulaiche M, Santos SD dos, Strobel V, Cretu B, Routoure J-M, Carin R, Tejada J, Claeys C, Rodríguez AL. Low-Frequency Noise Studies on Fully Depleted UTBOX Silicon-on-Insulator nMOSFETs: Challenges and Opportunities [Internet]. ECS Journal of Solid State Science and Technology. 2013 ; 2( 11): Q205-Q210.[citado 2025 nov. 28 ] Available from: https://doi.org/10.1149/2.011311jss
Vancouver
Simoen E, Martino JA, Aoulaiche M, Santos SD dos, Strobel V, Cretu B, Routoure J-M, Carin R, Tejada J, Claeys C, Rodríguez AL. Low-Frequency Noise Studies on Fully Depleted UTBOX Silicon-on-Insulator nMOSFETs: Challenges and Opportunities [Internet]. ECS Journal of Solid State Science and Technology. 2013 ; 2( 11): Q205-Q210.[citado 2025 nov. 28 ] Available from: https://doi.org/10.1149/2.011311jss
Artigo de periodico
V2O5/WO3 mixed oxide films as pH-EGFET sensor: sequential Re-usage and fabrication volume analysis (2012)
Guidelli, Éder José; Guerra, Elidia Maria; Mulato, Marcelo
Fonte: ECS Journal of Solid State Science and Technology. Unidade: FFCLRP
Assuntos: TUNGSTÊNIO, VANÁDIO, PROCESSO SOL-GEL, SENSORES QUÍMICOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
GUIDELLI, Éder José e GUERRA, Elidia Maria e MULATO, Marcelo. V2O5/WO3 mixed oxide films as pH-EGFET sensor: sequential Re-usage and fabrication volume analysis. ECS Journal of Solid State Science and Technology, v. 1, n. 3, p. N39-N44, 2012Tradução . . Disponível em: https://doi.org/10.1149/2.007203jss. Acesso em: 28 nov. 2025.
APA
Guidelli, É. J., Guerra, E. M., & Mulato, M. (2012). V2O5/WO3 mixed oxide films as pH-EGFET sensor: sequential Re-usage and fabrication volume analysis. ECS Journal of Solid State Science and Technology, 1( 3), N39-N44. doi:10.1149/2.007203jss
NLM
Guidelli ÉJ, Guerra EM, Mulato M. V2O5/WO3 mixed oxide films as pH-EGFET sensor: sequential Re-usage and fabrication volume analysis [Internet]. ECS Journal of Solid State Science and Technology. 2012 ; 1( 3): N39-N44.[citado 2025 nov. 28 ] Available from: https://doi.org/10.1149/2.007203jss
Vancouver
Guidelli ÉJ, Guerra EM, Mulato M. V2O5/WO3 mixed oxide films as pH-EGFET sensor: sequential Re-usage and fabrication volume analysis [Internet]. ECS Journal of Solid State Science and Technology. 2012 ; 1( 3): N39-N44.[citado 2025 nov. 28 ] Available from: https://doi.org/10.1149/2.007203jss

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