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Trabalho de evento-anais periodico
Mapping of Bragg-surface diffraction of InP/GaAs (100) structure (1998)
Avanci, L H; Hayashi, M A; Cardoso, L P; Morelhão, Sérgio Luiz; Riesz, F; Rakennus, K; Hakkarainen, T
Source: Journal Crystal Growth. Conference titles: International Conference on Chemical Beam Epitaxy and Related Growth Techniques. Unidade: IF
Assunto: CRISTALOGRAFIA
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ABNT
AVANCI, L H et al. Mapping of Bragg-surface diffraction of InP/GaAs (100) structure. Journal Crystal Growth. Amsterdam: North-Holland. . Acesso em: 18 out. 2024. , 1998
APA
Avanci, L. H., Hayashi, M. A., Cardoso, L. P., Morelhão, S. L., Riesz, F., Rakennus, K., & Hakkarainen, T. (1998). Mapping of Bragg-surface diffraction of InP/GaAs (100) structure. Journal Crystal Growth. Amsterdam: North-Holland.
NLM
Avanci LH, Hayashi MA, Cardoso LP, Morelhão SL, Riesz F, Rakennus K, Hakkarainen T. Mapping of Bragg-surface diffraction of InP/GaAs (100) structure. Journal Crystal Growth. 1998 ; 188( 1-4): 220-224.[citado 2024 out. 18 ]
Vancouver
Avanci LH, Hayashi MA, Cardoso LP, Morelhão SL, Riesz F, Rakennus K, Hakkarainen T. Mapping of Bragg-surface diffraction of InP/GaAs (100) structure. Journal Crystal Growth. 1998 ; 188( 1-4): 220-224.[citado 2024 out. 18 ]
Artigo de periodico
Observation of coherent hybrid reflection with synchrotron radiation (1998)
Morelhão, S L; Avanci, L H; Hayashi, M A; Cardoso, L P; Collins, S P
Source: Applied Physics Letters. Unidade: IF
Assunto: FÍSICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MORELHÃO, S L et al. Observation of coherent hybrid reflection with synchrotron radiation. Applied Physics Letters, v. 73, n. 15, p. 2194-2196, 1998Tradução . . Disponível em: https://doi.org/10.1063/1.122420. Acesso em: 18 out. 2024.
APA
Morelhão, S. L., Avanci, L. H., Hayashi, M. A., Cardoso, L. P., & Collins, S. P. (1998). Observation of coherent hybrid reflection with synchrotron radiation. Applied Physics Letters, 73( 15), 2194-2196. doi:10.1063/1.122420
NLM
Morelhão SL, Avanci LH, Hayashi MA, Cardoso LP, Collins SP. Observation of coherent hybrid reflection with synchrotron radiation [Internet]. Applied Physics Letters. 1998 ; 73( 15): 2194-2196.[citado 2024 out. 18 ] Available from: https://doi.org/10.1063/1.122420
Vancouver
Morelhão SL, Avanci LH, Hayashi MA, Cardoso LP, Collins SP. Observation of coherent hybrid reflection with synchrotron radiation [Internet]. Applied Physics Letters. 1998 ; 73( 15): 2194-2196.[citado 2024 out. 18 ] Available from: https://doi.org/10.1063/1.122420
Artigo de periodico
Sensitivity Bragg surface diffraction to analyze ion-implanted semiconductors (1997)
Hayashi, M A; Morelhão, Sérgio Luiz; Avanci, L H; Cardoso, L P; Sasaki, J M; Kretly, L C; Chang, S L
Source: Applied Physics Letters. Unidade: IF
Assunto: SEMICONDUTORES
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
HAYASHI, M A et al. Sensitivity Bragg surface diffraction to analyze ion-implanted semiconductors. Applied Physics Letters, v. 71, n. 18, p. 2614-2616. 1997, 1997Tradução . . Disponível em: https://doi.org/10.1063/1.120157. Acesso em: 18 out. 2024.
APA
Hayashi, M. A., Morelhão, S. L., Avanci, L. H., Cardoso, L. P., Sasaki, J. M., Kretly, L. C., & Chang, S. L. (1997). Sensitivity Bragg surface diffraction to analyze ion-implanted semiconductors. Applied Physics Letters, 71( 18), 2614-2616. 1997. doi:10.1063/1.120157
NLM
Hayashi MA, Morelhão SL, Avanci LH, Cardoso LP, Sasaki JM, Kretly LC, Chang SL. Sensitivity Bragg surface diffraction to analyze ion-implanted semiconductors [Internet]. Applied Physics Letters. 1997 ; 71( 18): 2614-2616. 1997.[citado 2024 out. 18 ] Available from: https://doi.org/10.1063/1.120157
Vancouver
Hayashi MA, Morelhão SL, Avanci LH, Cardoso LP, Sasaki JM, Kretly LC, Chang SL. Sensitivity Bragg surface diffraction to analyze ion-implanted semiconductors [Internet]. Applied Physics Letters. 1997 ; 71( 18): 2614-2616. 1997.[citado 2024 out. 18 ] Available from: https://doi.org/10.1063/1.120157

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