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Leakage current and threshold voltage alteration due to X-rays and proton beam in nMOSFETs with different geometries. (2011)
Silveira, Marcilei Aparecida Guazzelli da ; Medina, N H; Added, N; Tabacniks, Manfredo Harri ; Santos, R B; Cirne, Karin Huscher; Gimenez, S P; Lima, J A De; Seixas, L E
Source: Resumo. Conference titles: Latin American Symposium on Nuclear Physics and Applications. Unidade: IF
Assunto: RAIOS X
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ABNT
SILVEIRA, Marcilei Aparecida Guazzelli da et al. Leakage current and threshold voltage alteration due to X-rays and proton beam in nMOSFETs with different geometries. 2011, Anais.. Quito: LASNPA, 2011. Disponível em: http://www.lasnpa-quito2011.org/abstract_export.php?id=49. Acesso em: 14 out. 2024.
APA
Silveira, M. A. G. da, Medina, N. H., Added, N., Tabacniks, M. H., Santos, R. B., Cirne, K. H., et al. (2011). Leakage current and threshold voltage alteration due to X-rays and proton beam in nMOSFETs with different geometries. In Resumo. Quito: LASNPA. Recuperado de http://www.lasnpa-quito2011.org/abstract_export.php?id=49
NLM
Silveira MAG da, Medina NH, Added N, Tabacniks MH, Santos RB, Cirne KH, Gimenez SP, Lima JAD, Seixas LE. Leakage current and threshold voltage alteration due to X-rays and proton beam in nMOSFETs with different geometries. [Internet]. Resumo. 2011 ;[citado 2024 out. 14 ] Available from: http://www.lasnpa-quito2011.org/abstract_export.php?id=49
Vancouver
Silveira MAG da, Medina NH, Added N, Tabacniks MH, Santos RB, Cirne KH, Gimenez SP, Lima JAD, Seixas LE. Leakage current and threshold voltage alteration due to X-rays and proton beam in nMOSFETs with different geometries. [Internet]. Resumo. 2011 ;[citado 2024 out. 14 ] Available from: http://www.lasnpa-quito2011.org/abstract_export.php?id=49
Artigo de periodico
Trace element concentrations from Sao Francisco River - PR analyzed with PIXE technique (2006)
Rizzutto, Marcia de Almeida; Added, N; Tabacniks, Manfredo Harri ; Espinoza-Quinones, F R; Palácio, S M; Galante, R M; Rossi, N.; Zenatti, D C; Rossi, F L; Welter, R A; Módenes, A N
Source: Journal of Radionalytical and Nuclear Chemistry. Unidade: IF
Subjects: FÍSICA NUCLEAR, DIFRAÇÃO POR RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
RIZZUTTO, Marcia de Almeida et al. Trace element concentrations from Sao Francisco River - PR analyzed with PIXE technique. Journal of Radionalytical and Nuclear Chemistry, v. 269, n. 3, p. 727-731, 2006Tradução . . Disponível em: https://doi.org/10.1007/s10967-006-0422-0. Acesso em: 14 out. 2024.
APA
Rizzutto, M. de A., Added, N., Tabacniks, M. H., Espinoza-Quinones, F. R., Palácio, S. M., Galante, R. M., et al. (2006). Trace element concentrations from Sao Francisco River - PR analyzed with PIXE technique. Journal of Radionalytical and Nuclear Chemistry, 269( 3), 727-731. doi:10.1007/s10967-006-0422-0
NLM
Rizzutto M de A, Added N, Tabacniks MH, Espinoza-Quinones FR, Palácio SM, Galante RM, Rossi N, Zenatti DC, Rossi FL, Welter RA, Módenes AN. Trace element concentrations from Sao Francisco River - PR analyzed with PIXE technique [Internet]. Journal of Radionalytical and Nuclear Chemistry. 2006 ; 269( 3): 727-731.[citado 2024 out. 14 ] Available from: https://doi.org/10.1007/s10967-006-0422-0
Vancouver
Rizzutto M de A, Added N, Tabacniks MH, Espinoza-Quinones FR, Palácio SM, Galante RM, Rossi N, Zenatti DC, Rossi FL, Welter RA, Módenes AN. Trace element concentrations from Sao Francisco River - PR analyzed with PIXE technique [Internet]. Journal of Radionalytical and Nuclear Chemistry. 2006 ; 269( 3): 727-731.[citado 2024 out. 14 ] Available from: https://doi.org/10.1007/s10967-006-0422-0
Artigo de periodico
Teeth characterization using ion beam analysis (2006)
Rizzutto, Marcia de Almeida; Added, N; Tabacniks, Manfredo Harri ; Falla-Sotelo, F; Curado, J F; Francci, C; Markarian, R A; Quinelato, A; Youssef, F; Mori, M.; Youssef, M
Source: Journal of Radionalytical and Nuclear Chemistry. Unidades: IF, FO
Subjects: FÍSICA NUCLEAR, FEIXES, ÍONS PESADOS, DIFRAÇÃO POR RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
RIZZUTTO, Marcia de Almeida et al. Teeth characterization using ion beam analysis. Journal of Radionalytical and Nuclear Chemistry, v. 269, n. 3, p. 683-687, 2006Tradução . . Disponível em: https://doi.org/10.1007/s10967-006-0286-3. Acesso em: 14 out. 2024.
APA
Rizzutto, M. de A., Added, N., Tabacniks, M. H., Falla-Sotelo, F., Curado, J. F., Francci, C., et al. (2006). Teeth characterization using ion beam analysis. Journal of Radionalytical and Nuclear Chemistry, 269( 3), 683-687. doi:10.1007/s10967-006-0286-3
NLM
Rizzutto M de A, Added N, Tabacniks MH, Falla-Sotelo F, Curado JF, Francci C, Markarian RA, Quinelato A, Youssef F, Mori M, Youssef M. Teeth characterization using ion beam analysis [Internet]. Journal of Radionalytical and Nuclear Chemistry. 2006 ; 269( 3): 683-687.[citado 2024 out. 14 ] Available from: https://doi.org/10.1007/s10967-006-0286-3
Vancouver
Rizzutto M de A, Added N, Tabacniks MH, Falla-Sotelo F, Curado JF, Francci C, Markarian RA, Quinelato A, Youssef F, Mori M, Youssef M. Teeth characterization using ion beam analysis [Internet]. Journal of Radionalytical and Nuclear Chemistry. 2006 ; 269( 3): 683-687.[citado 2024 out. 14 ] Available from: https://doi.org/10.1007/s10967-006-0286-3

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