An improved model for the triangular SOI misalignment test structure (2004)
Source: Microelectronics technology and devices SBMicro 2004. Proceedings, v. 2004-03. Conference titles: Symposium on Microelectronics Technology and Devices SBMICRO. Unidade: EP
Subjects: MICROELETRÔNICA, ELETROQUÍMICA, CIRCUITOS INTEGRADOS MOS
ABNT
GIACOMINI, Renato Camargo e MARTINO, João Antonio. An improved model for the triangular SOI misalignment test structure. 2004, Anais.. Pennington: The Electrochemical Society, 2004. . Acesso em: 09 out. 2024.APA
Giacomini, R. C., & Martino, J. A. (2004). An improved model for the triangular SOI misalignment test structure. In Microelectronics technology and devices SBMicro 2004. Proceedings, v. 2004-03. Pennington: The Electrochemical Society.NLM
Giacomini RC, Martino JA. An improved model for the triangular SOI misalignment test structure. Microelectronics technology and devices SBMicro 2004. Proceedings, v. 2004-03. 2004 ;[citado 2024 out. 09 ]Vancouver
Giacomini RC, Martino JA. An improved model for the triangular SOI misalignment test structure. Microelectronics technology and devices SBMicro 2004. Proceedings, v. 2004-03. 2004 ;[citado 2024 out. 09 ]