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Trabalho de evento-resumo
Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices (2019)
Aguiar, Vitor Ângelo Paulino de ; Medina, Nilberto Heder ; Added, Nemitala; Macchione, Eduardo Luiz Augusto ; Alberton, Saulo Gabriel Pereira Nascimento; Scarduelli, Valdir Brunetti; Allegro, Paula Rangel Pestana; Escudeiro, Rafael; Santos, Hellen Cristine dos ; Silva, Tiago Fiorini da ; Rodrigues, Cleber Lima ; Leite, Alisson Rodolfo; Santos, Osvaldo Camargo Botelho dos
Source: Abstracts. Conference titles: Reunião de Trabalho sobre Física Nuclear no Brasil. Unidade: IF
Assunto: RADIAÇÃO IONIZANTE
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ABNT
AGUIAR, Vitor Ângelo Paulino de et al. Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices. 2019, Anais.. São Paulo: Sociedade Brasileira de Física, 2019. . Acesso em: 07 jul. 2024.
APA
Aguiar, V. Â. P. de, Medina, N. H., Added, N., Macchione, E. L. A., Alberton, S. G. P. N., Scarduelli, V. B., et al. (2019). Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices. In Abstracts. São Paulo: Sociedade Brasileira de Física.
NLM
Aguiar VÂP de, Medina NH, Added N, Macchione ELA, Alberton SGPN, Scarduelli VB, Allegro PRP, Escudeiro R, Santos HC dos, Silva TF da, Rodrigues CL, Leite AR, Santos OCB dos. Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices. Abstracts. 2019 ;[citado 2024 jul. 07 ]
Vancouver
Aguiar VÂP de, Medina NH, Added N, Macchione ELA, Alberton SGPN, Scarduelli VB, Allegro PRP, Escudeiro R, Santos HC dos, Silva TF da, Rodrigues CL, Leite AR, Santos OCB dos. Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices. Abstracts. 2019 ;[citado 2024 jul. 07 ]
Artigo de periodico
Characterization of a system that combines energy dispersive X-ray diffraction with X-ray fluorescence and its potential applications in archeometry (2019)
Santos, Hellen Cristine ; Silva, Tiago Fiorini da ; Leite, Alisson Rodolfo ; Assis, Renan Ferreira de; Campos, Pedro Herzilio Ottoni Viviani de ; Rizzutto, Marcia de Almeida ; Tabacniks, Manfredo Harri
Source: Journal of Applied Physics. Unidade: IF
Subjects: ÍONS, RAIOS X, FLUORESCÊNCIA, ENERGIA, DIFRAÇÃO POR RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SANTOS, Hellen Cristine et al. Characterization of a system that combines energy dispersive X-ray diffraction with X-ray fluorescence and its potential applications in archeometry. Journal of Applied Physics, v. 126, n. 4, 2019Tradução . . Disponível em: https://doi.org/10.1063/1.5108746. Acesso em: 07 jul. 2024.
APA
Santos, H. C., Silva, T. F. da, Leite, A. R., Assis, R. F. de, Campos, P. H. O. V. de, Rizzutto, M. de A., & Tabacniks, M. H. (2019). Characterization of a system that combines energy dispersive X-ray diffraction with X-ray fluorescence and its potential applications in archeometry. Journal of Applied Physics, 126( 4). doi:10.1063/1.5108746
NLM
Santos HC, Silva TF da, Leite AR, Assis RF de, Campos PHOV de, Rizzutto M de A, Tabacniks MH. Characterization of a system that combines energy dispersive X-ray diffraction with X-ray fluorescence and its potential applications in archeometry [Internet]. Journal of Applied Physics. 2019 ; 126( 4):[citado 2024 jul. 07 ] Available from: https://doi.org/10.1063/1.5108746
Vancouver
Santos HC, Silva TF da, Leite AR, Assis RF de, Campos PHOV de, Rizzutto M de A, Tabacniks MH. Characterization of a system that combines energy dispersive X-ray diffraction with X-ray fluorescence and its potential applications in archeometry [Internet]. Journal of Applied Physics. 2019 ; 126( 4):[citado 2024 jul. 07 ] Available from: https://doi.org/10.1063/1.5108746
Trabalho de evento-resumo
Characterization of a system that combines EDXRD with EDXRF and its potential applications in archaeometry (2019)
Santos, Hellen Cristine dos ; Silva, Tiago Fiorini da ; Leite, Alisson Rodolfo; Assis, Renan Ferreira de; Leite, Alisson RodolfoAssis, Renan Ferreira deCampos, Pedro Herzílio Ottoni Viviani de; Rizzutto, Márcia de Almeida ; Tabacniks, Manfredo Harri
Source: Abstracts. Conference titles: Reunião de Trabalho sobre Física Nuclear no Brasil. Unidade: IF
Assunto: ARQUEOMETRIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SANTOS, Hellen Cristine dos et al. Characterization of a system that combines EDXRD with EDXRF and its potential applications in archaeometry. 2019, Anais.. São Paulo: Sociedade Brasileira de Física, 2019. . Acesso em: 07 jul. 2024.
APA
Santos, H. C. dos, Silva, T. F. da, Leite, A. R., Assis, R. F. de, Leite, A. R. A., Rizzutto, M. de A., & Tabacniks, M. H. (2019). Characterization of a system that combines EDXRD with EDXRF and its potential applications in archaeometry. In Abstracts. São Paulo: Sociedade Brasileira de Física.
NLM
Santos HC dos, Silva TF da, Leite AR, Assis RF de, Leite ARA, Rizzutto M de A, Tabacniks MH. Characterization of a system that combines EDXRD with EDXRF and its potential applications in archaeometry. Abstracts. 2019 ;[citado 2024 jul. 07 ]
Vancouver
Santos HC dos, Silva TF da, Leite AR, Assis RF de, Leite ARA, Rizzutto M de A, Tabacniks MH. Characterization of a system that combines EDXRD with EDXRF and its potential applications in archaeometry. Abstracts. 2019 ;[citado 2024 jul. 07 ]
Trabalho de evento-resumo
Passivation layer and charge collection depth in electronic devices (2018)
Aguiar, Vitor Ângelo Paulino de ; Medina, Nilberto Heder; Added, Nemitala; Macchione, Eduardo Luiz Augusto ; Leite, Alisson Rodolfo; Silva, Tiago Fiorini da; Rodrigues, Cleber Lima; Escudeiro, Rafael; Allegro, Paula Rangel Pestana; Santos, Hellen Cristine dos; Alberton, Saulo Gabriel Pereira Nascimento; Scarduelli, Valdir Brunetti; Silveira, Marcilei Aparecida Guazzelli da; Melo, M A A de; Santos, R B B; Giacomini, Renato; Oliveira, J A; Leite, F G H
Source: Abstracts. Conference titles: Brazilian Meeting on Nuclear Physics. Unidade: IF
Subjects: FÍSICA NUCLEAR, ÍONS PESADOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
AGUIAR, Vitor Ângelo Paulino de et al. Passivation layer and charge collection depth in electronic devices. 2018, Anais.. São Paulo: SBF, 2018. Disponível em: https://sec.sbfisica.org.br/eventos/rtfnb/xli/sys/resumos/R0013-1.pdf. Acesso em: 07 jul. 2024.
APA
Aguiar, V. Â. P. de, Medina, N. H., Added, N., Macchione, E. L. A., Leite, A. R., Silva, T. F. da, et al. (2018). Passivation layer and charge collection depth in electronic devices. In Abstracts. São Paulo: SBF. Recuperado de https://sec.sbfisica.org.br/eventos/rtfnb/xli/sys/resumos/R0013-1.pdf
NLM
Aguiar VÂP de, Medina NH, Added N, Macchione ELA, Leite AR, Silva TF da, Rodrigues CL, Escudeiro R, Allegro PRP, Santos HC dos, Alberton SGPN, Scarduelli VB, Silveira MAG da, Melo MAA de, Santos RBB, Giacomini R, Oliveira JA, Leite FGH. Passivation layer and charge collection depth in electronic devices [Internet]. Abstracts. 2018 ;[citado 2024 jul. 07 ] Available from: https://sec.sbfisica.org.br/eventos/rtfnb/xli/sys/resumos/R0013-1.pdf
Vancouver
Aguiar VÂP de, Medina NH, Added N, Macchione ELA, Leite AR, Silva TF da, Rodrigues CL, Escudeiro R, Allegro PRP, Santos HC dos, Alberton SGPN, Scarduelli VB, Silveira MAG da, Melo MAA de, Santos RBB, Giacomini R, Oliveira JA, Leite FGH. Passivation layer and charge collection depth in electronic devices [Internet]. Abstracts. 2018 ;[citado 2024 jul. 07 ] Available from: https://sec.sbfisica.org.br/eventos/rtfnb/xli/sys/resumos/R0013-1.pdf

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