Filtros : "Mansano, Ronaldo Domingues" "ARTIGO DE PERIODICO" Removido: "MANSANO, RONALDO DOMINGUES" Limpar

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  • Source: Journal of Metastable and Nanocrystalline Materials. Unidade: IF

    Subjects: DIAMANTE, MATERIAIS NANOESTRUTURADOS, NANOTECNOLOGIA

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    • ABNT

      MARTINS, D R et al. Characterization of diamond replicas microfabricated silicon molds. Journal of Metastable and Nanocrystalline Materials, 2004Tradução . . Disponível em: http://publica-sbi.if.usp.br/PDFs/pd002.pdf. Acesso em: 26 ago. 2024.
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      Martins, D. R., Salvadori, M. C. B. da S., Mansano, R. D., & Verdonck, P. B. (2004). Characterization of diamond replicas microfabricated silicon molds. Journal of Metastable and Nanocrystalline Materials. Recuperado de http://publica-sbi.if.usp.br/PDFs/pd002.pdf
    • NLM

      Martins DR, Salvadori MCB da S, Mansano RD, Verdonck PB. Characterization of diamond replicas microfabricated silicon molds [Internet]. Journal of Metastable and Nanocrystalline Materials. 2004 ;[citado 2024 ago. 26 ] Available from: http://publica-sbi.if.usp.br/PDFs/pd002.pdf
    • Vancouver

      Martins DR, Salvadori MCB da S, Mansano RD, Verdonck PB. Characterization of diamond replicas microfabricated silicon molds [Internet]. Journal of Metastable and Nanocrystalline Materials. 2004 ;[citado 2024 ago. 26 ] Available from: http://publica-sbi.if.usp.br/PDFs/pd002.pdf
  • Source: Nuclear Instruments and Methods in Physics Research B. Unidade: IF

    Subjects: DETECÇÃO DE PARTÍCULAS, ÍONS, FEIXES, ELASTICIDADE, FILMES FINOS, ESPECTROSCOPIA DE RAIO X

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      ADDED, Nemitala et al. Light element analysis using ERDA method with an ionization chamber. Nuclear Instruments and Methods in Physics Research B, v. 175, p. 787-790, 2001Tradução . . Disponível em: https://doi.org/10.1016/s0168-583x(00)00604-2. Acesso em: 26 ago. 2024.
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      Added, N., Chubaci, J. F. D., Matsuoka, M., Castro, R. A., Radtke, M., Alonso, E., et al. (2001). Light element analysis using ERDA method with an ionization chamber. Nuclear Instruments and Methods in Physics Research B, 175, 787-790. doi:10.1016/s0168-583x(00)00604-2
    • NLM

      Added N, Chubaci JFD, Matsuoka M, Castro RA, Radtke M, Alonso E, Liguori Neto R, Rizzutto M de A, Tabacniks MH, Mansano RD. Light element analysis using ERDA method with an ionization chamber [Internet]. Nuclear Instruments and Methods in Physics Research B. 2001 ; 175 787-790.[citado 2024 ago. 26 ] Available from: https://doi.org/10.1016/s0168-583x(00)00604-2
    • Vancouver

      Added N, Chubaci JFD, Matsuoka M, Castro RA, Radtke M, Alonso E, Liguori Neto R, Rizzutto M de A, Tabacniks MH, Mansano RD. Light element analysis using ERDA method with an ionization chamber [Internet]. Nuclear Instruments and Methods in Physics Research B. 2001 ; 175 787-790.[citado 2024 ago. 26 ] Available from: https://doi.org/10.1016/s0168-583x(00)00604-2
  • Source: Applied Optics. Unidades: EESC, EP

    Assunto: ÓPTICA

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      GONÇALVES NETO, Luiz et al. Design and fabrication of a hybrid diffractive optical device for multiple-line generation over a wide angle. Applied Optics, v. 40, n. Ja 2001, p. 211-218, 2001Tradução . . Disponível em: https://doi.org/10.1364/ao.40.000211. Acesso em: 26 ago. 2024.
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      Gonçalves Neto, L., Roberto, L. B., Verdonck, P. B., Mansano, R. D., Cirino, G. A., & Stefani, M. A. (2001). Design and fabrication of a hybrid diffractive optical device for multiple-line generation over a wide angle. Applied Optics, 40( Ja 2001), 211-218. doi:10.1364/ao.40.000211
    • NLM

      Gonçalves Neto L, Roberto LB, Verdonck PB, Mansano RD, Cirino GA, Stefani MA. Design and fabrication of a hybrid diffractive optical device for multiple-line generation over a wide angle [Internet]. Applied Optics. 2001 ; 40( Ja 2001): 211-218.[citado 2024 ago. 26 ] Available from: https://doi.org/10.1364/ao.40.000211
    • Vancouver

      Gonçalves Neto L, Roberto LB, Verdonck PB, Mansano RD, Cirino GA, Stefani MA. Design and fabrication of a hybrid diffractive optical device for multiple-line generation over a wide angle [Internet]. Applied Optics. 2001 ; 40( Ja 2001): 211-218.[citado 2024 ago. 26 ] Available from: https://doi.org/10.1364/ao.40.000211
  • Source: Thin Solid Films. Unidade: EP

    Assunto: FILMES

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      MANSANO, Ronaldo Domingues et al. Effects of the methane content on the characteristics of diamond-like carbon films produced by sputtering. Thin Solid Films, n. 373, p. 243-246, 2000Tradução . . Disponível em: https://doi.org/10.1016/s0040-6090(00)01088-9. Acesso em: 26 ago. 2024.
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      Mansano, R. D., Massi, M., Zambom, L. da S., Verdonck, P. B., Nogueira, P. M., Maciel, H. S., & Otani, C. (2000). Effects of the methane content on the characteristics of diamond-like carbon films produced by sputtering. Thin Solid Films, ( 373), 243-246. doi:10.1016/s0040-6090(00)01088-9
    • NLM

      Mansano RD, Massi M, Zambom L da S, Verdonck PB, Nogueira PM, Maciel HS, Otani C. Effects of the methane content on the characteristics of diamond-like carbon films produced by sputtering [Internet]. Thin Solid Films. 2000 ;( 373): 243-246.[citado 2024 ago. 26 ] Available from: https://doi.org/10.1016/s0040-6090(00)01088-9
    • Vancouver

      Mansano RD, Massi M, Zambom L da S, Verdonck PB, Nogueira PM, Maciel HS, Otani C. Effects of the methane content on the characteristics of diamond-like carbon films produced by sputtering [Internet]. Thin Solid Films. 2000 ;( 373): 243-246.[citado 2024 ago. 26 ] Available from: https://doi.org/10.1016/s0040-6090(00)01088-9
  • Source: Journal of Vacuum Science and Technology B. Unidade: EP

    Assunto: SEMICONDUTORES

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      VERDONCK, Patrick Bernard e HASENACK, Claus Martin e MANSANO, Ronaldo Domingues. Metal contamination of silicon wafers induced by reactive ion etching plasmas and its behavior upon subsequent cleaning procedures. Journal of Vacuum Science and Technology B, v. 14, n. 1 , p. 538-42, 1996Tradução . . Disponível em: https://doi.org/10.1116/1.588426. Acesso em: 26 ago. 2024.
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      Verdonck, P. B., Hasenack, C. M., & Mansano, R. D. (1996). Metal contamination of silicon wafers induced by reactive ion etching plasmas and its behavior upon subsequent cleaning procedures. Journal of Vacuum Science and Technology B, 14( 1 ), 538-42. doi:10.1116/1.588426
    • NLM

      Verdonck PB, Hasenack CM, Mansano RD. Metal contamination of silicon wafers induced by reactive ion etching plasmas and its behavior upon subsequent cleaning procedures [Internet]. Journal of Vacuum Science and Technology B. 1996 ;14( 1 ): 538-42.[citado 2024 ago. 26 ] Available from: https://doi.org/10.1116/1.588426
    • Vancouver

      Verdonck PB, Hasenack CM, Mansano RD. Metal contamination of silicon wafers induced by reactive ion etching plasmas and its behavior upon subsequent cleaning procedures [Internet]. Journal of Vacuum Science and Technology B. 1996 ;14( 1 ): 538-42.[citado 2024 ago. 26 ] Available from: https://doi.org/10.1116/1.588426
  • Source: Applied Surface Science. Unidade: EP

    Assunto: CIRCUITOS INTEGRADOS

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      MANSANO, Ronaldo Domingues e VERDONCK, Patrick Bernard e MACIEL, H. S. Deep trench etching in silicon with fluorine containing plasmas. Applied Surface Science, v. 100-1, p. 583-6, 1996Tradução . . Disponível em: https://doi.org/10.1016/0169-4332(96)00343-1. Acesso em: 26 ago. 2024.
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      Mansano, R. D., Verdonck, P. B., & Maciel, H. S. (1996). Deep trench etching in silicon with fluorine containing plasmas. Applied Surface Science, 100-1, 583-6. doi:10.1016/0169-4332(96)00343-1
    • NLM

      Mansano RD, Verdonck PB, Maciel HS. Deep trench etching in silicon with fluorine containing plasmas [Internet]. Applied Surface Science. 1996 ;100-1 583-6.[citado 2024 ago. 26 ] Available from: https://doi.org/10.1016/0169-4332(96)00343-1
    • Vancouver

      Mansano RD, Verdonck PB, Maciel HS. Deep trench etching in silicon with fluorine containing plasmas [Internet]. Applied Surface Science. 1996 ;100-1 583-6.[citado 2024 ago. 26 ] Available from: https://doi.org/10.1016/0169-4332(96)00343-1

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