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Artigo de periodico
Determination of film thickness though simulation of vickes hardness testing (2017)
Libório, Maxwell Santana; Dias, Avelino Manuel da Silva; Souza, Roberto Martins de
Source: Materials Research. Unidade: EP
Subjects: FILMES FINOS, RESISTÊNCIA DOS MATERIAIS, ENSAIOS DOS MATERIAIS, MÉTODOS NUMÉRICOS
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ABNT
LIBÓRIO, Maxwell Santana e DIAS, Avelino Manuel da Silva e SOUZA, Roberto Martins de. Determination of film thickness though simulation of vickes hardness testing. Materials Research, v. 20, n. 3, p. 755-767, 2017Tradução . . Disponível em: https://doi.org/10.1590/1980-5373-MR-2015-0783. Acesso em: 14 nov. 2024.
APA
Libório, M. S., Dias, A. M. da S., & Souza, R. M. de. (2017). Determination of film thickness though simulation of vickes hardness testing. Materials Research, 20( 3), 755-767. doi:10.1590/1980-5373-MR-2015-0783
NLM
Libório MS, Dias AM da S, Souza RM de. Determination of film thickness though simulation of vickes hardness testing [Internet]. Materials Research. 2017 ; 20( 3): 755-767.[citado 2024 nov. 14 ] Available from: https://doi.org/10.1590/1980-5373-MR-2015-0783
Vancouver
Libório MS, Dias AM da S, Souza RM de. Determination of film thickness though simulation of vickes hardness testing [Internet]. Materials Research. 2017 ; 20( 3): 755-767.[citado 2024 nov. 14 ] Available from: https://doi.org/10.1590/1980-5373-MR-2015-0783
Artigo de periodico
Residual stresses in titanium nitride thin films deposited by direct current and pulsed direct current unbalanced magnetron sputtering (2006)
Benegra, Marjorie ; Lamas, D G; Fernández de Rapp, M E; Mingolo, N; Kunrath, A O; Souza, Roberto Martins de
Source: Thin Solid Films. Unidade: EP
Subjects: FILMES FINOS, TENSÃO RESIDUAL, RESISTÊNCIA DOS MATERIAIS, PLASMA (PROCESSOS), TITÂNIO, NITRATOS
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ABNT
BENEGRA, Marjorie et al. Residual stresses in titanium nitride thin films deposited by direct current and pulsed direct current unbalanced magnetron sputtering. Thin Solid Films, v. 494, n. Ja 2006, p. 146-150, 2006Tradução . . Disponível em: https://doi.org/10.1016/j.tsf.2005.08.214. Acesso em: 14 nov. 2024.
APA
Benegra, M., Lamas, D. G., Fernández de Rapp, M. E., Mingolo, N., Kunrath, A. O., & Souza, R. M. de. (2006). Residual stresses in titanium nitride thin films deposited by direct current and pulsed direct current unbalanced magnetron sputtering. Thin Solid Films, 494( Ja 2006), 146-150. doi:10.1016/j.tsf.2005.08.214
NLM
Benegra M, Lamas DG, Fernández de Rapp ME, Mingolo N, Kunrath AO, Souza RM de. Residual stresses in titanium nitride thin films deposited by direct current and pulsed direct current unbalanced magnetron sputtering [Internet]. Thin Solid Films. 2006 ; 494( Ja 2006): 146-150.[citado 2024 nov. 14 ] Available from: https://doi.org/10.1016/j.tsf.2005.08.214
Vancouver
Benegra M, Lamas DG, Fernández de Rapp ME, Mingolo N, Kunrath AO, Souza RM de. Residual stresses in titanium nitride thin films deposited by direct current and pulsed direct current unbalanced magnetron sputtering [Internet]. Thin Solid Films. 2006 ; 494( Ja 2006): 146-150.[citado 2024 nov. 14 ] Available from: https://doi.org/10.1016/j.tsf.2005.08.214
Trabalho de evento-resumo
Characterization of tin and tic films deposited by magnetron sputtering using nanoindentation and atomic force microscopy (2006)
Recco, Abel André Cândido ; Kunioshi, Clarice Terui; Moré Farías, María Cristina ; Oliveira, I. C.; Maciel, Homero Santiago; Souza, Roberto Martins de ; Tschiptschin, André Paulo
Source: Final Program. Conference titles: Encontro da Sociedade Brasileira de Pesquisas em Materiais (SBPMat. Unidade: EP
Subjects: FILMES FINOS, RESISTÊNCIA DOS MATERIAIS, PROPRIEDADES DOS MATERIAIS
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ABNT
RECCO, Abel André Cândido et al. Characterization of tin and tic films deposited by magnetron sputtering using nanoindentation and atomic force microscopy. 2006, Anais.. Rio de Janeiro: SBPMat, 2006. Disponível em: https://repositorio.usp.br/directbitstream/df438757-77b2-458b-a0f7-0382b3952f0e/Souza_RM-2006-characterization%20of%20tin%20and%20tic%20films.pdf. Acesso em: 14 nov. 2024.
APA
Recco, A. A. C., Kunioshi, C. T., Moré Farías, M. C., Oliveira, I. C., Maciel, H. S., Souza, R. M. de, & Tschiptschin, A. P. (2006). Characterization of tin and tic films deposited by magnetron sputtering using nanoindentation and atomic force microscopy. In Final Program. Rio de Janeiro: SBPMat. Recuperado de https://repositorio.usp.br/directbitstream/df438757-77b2-458b-a0f7-0382b3952f0e/Souza_RM-2006-characterization%20of%20tin%20and%20tic%20films.pdf
NLM
Recco AAC, Kunioshi CT, Moré Farías MC, Oliveira IC, Maciel HS, Souza RM de, Tschiptschin AP. Characterization of tin and tic films deposited by magnetron sputtering using nanoindentation and atomic force microscopy [Internet]. Final Program. 2006 ;[citado 2024 nov. 14 ] Available from: https://repositorio.usp.br/directbitstream/df438757-77b2-458b-a0f7-0382b3952f0e/Souza_RM-2006-characterization%20of%20tin%20and%20tic%20films.pdf
Vancouver
Recco AAC, Kunioshi CT, Moré Farías MC, Oliveira IC, Maciel HS, Souza RM de, Tschiptschin AP. Characterization of tin and tic films deposited by magnetron sputtering using nanoindentation and atomic force microscopy [Internet]. Final Program. 2006 ;[citado 2024 nov. 14 ] Available from: https://repositorio.usp.br/directbitstream/df438757-77b2-458b-a0f7-0382b3952f0e/Souza_RM-2006-characterization%20of%20tin%20and%20tic%20films.pdf
Artigo de periodico
Numerical and experimental analyses on the indentation of coated systems with substrates with different mechanical properties (2005)
Piana, L A; Pérez Ruiz, Eduardo Alberto ; Souza, Roberto Martins de ; Kunrath, A O; Strohaecker, Telmo Roberto
Source: Thin Solid Films. Unidade: EP
Subjects: FILMES FINOS, MECÂNICA DA FRATURA, PROPRIEDADES DOS MATERIAIS, COMPUTAÇÃO APLICADA, AÇO, RESISTÊNCIA DOS MATERIAIS, TITÂNIO, NITRATOS
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ABNT
PIANA, L A et al. Numerical and experimental analyses on the indentation of coated systems with substrates with different mechanical properties. Thin Solid Films, v. No 2005, n. 1-2, p. 197-203, 2005Tradução . . Disponível em: https://doi.org/10.1016/j.tsf.2005.06.025. Acesso em: 14 nov. 2024.
APA
Piana, L. A., Pérez Ruiz, E. A., Souza, R. M. de, Kunrath, A. O., & Strohaecker, T. R. (2005). Numerical and experimental analyses on the indentation of coated systems with substrates with different mechanical properties. Thin Solid Films, No 2005( 1-2), 197-203. doi:10.1016/j.tsf.2005.06.025
NLM
Piana LA, Pérez Ruiz EA, Souza RM de, Kunrath AO, Strohaecker TR. Numerical and experimental analyses on the indentation of coated systems with substrates with different mechanical properties [Internet]. Thin Solid Films. 2005 ; No 2005( 1-2): 197-203.[citado 2024 nov. 14 ] Available from: https://doi.org/10.1016/j.tsf.2005.06.025
Vancouver
Piana LA, Pérez Ruiz EA, Souza RM de, Kunrath AO, Strohaecker TR. Numerical and experimental analyses on the indentation of coated systems with substrates with different mechanical properties [Internet]. Thin Solid Films. 2005 ; No 2005( 1-2): 197-203.[citado 2024 nov. 14 ] Available from: https://doi.org/10.1016/j.tsf.2005.06.025
Artigo de periodico
Finite element analysis on the effect of indenter diameter and load on the contact stresses during indentation of coated systems (2004)
Pérez Ruiz, Eduardo Alberto ; Souza, Roberto Martins de
Source: Journal of Metastable and Nanocrystalline Materials. Unidade: EP
Subjects: FILMES FINOS, LIGAS METÁLICAS, DEFORMAÇÃO E ESTRESSES, FADIGA DE CONTATO, DEFORMAÇÃO ELÁSTICA, RESISTÊNCIA DOS MATERIAIS, MÉTODO DOS ELEMENTOS FINITOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
PÉREZ RUIZ, Eduardo Alberto e SOUZA, Roberto Martins de. Finite element analysis on the effect of indenter diameter and load on the contact stresses during indentation of coated systems. Journal of Metastable and Nanocrystalline Materials, 2004Tradução . . Disponível em: https://doi.org/10.4028/www.scientific.net/JMNM.20-21.763. Acesso em: 14 nov. 2024.
APA
Pérez Ruiz, E. A., & Souza, R. M. de. (2004). Finite element analysis on the effect of indenter diameter and load on the contact stresses during indentation of coated systems. Journal of Metastable and Nanocrystalline Materials. doi:10.4028/www.scientific.net/JMNM.20-21.763
NLM
Pérez Ruiz EA, Souza RM de. Finite element analysis on the effect of indenter diameter and load on the contact stresses during indentation of coated systems [Internet]. Journal of Metastable and Nanocrystalline Materials. 2004 ;[citado 2024 nov. 14 ] Available from: https://doi.org/10.4028/www.scientific.net/JMNM.20-21.763
Vancouver
Pérez Ruiz EA, Souza RM de. Finite element analysis on the effect of indenter diameter and load on the contact stresses during indentation of coated systems [Internet]. Journal of Metastable and Nanocrystalline Materials. 2004 ;[citado 2024 nov. 14 ] Available from: https://doi.org/10.4028/www.scientific.net/JMNM.20-21.763
Trabalho de evento
Effect of load and indenter diameter on the amount of film cracks developed during the indentification of coated systems. (2003)
Gomez de Lamadrid , Patricia Bacheschi; Pérez Ruiz, Eduardo Alberto ; Souza, Roberto Martins de
Source: COBEM 2003: proceedings. Conference titles: International Congress of Mechanical Engineering. Unidade: EP
Subjects: FILMES FINOS, RUPTURA DOS MATERIAIS, RESISTÊNCIA DOS MATERIAIS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
GOMEZ DE LAMADRID , Patricia Bacheschi e PÉREZ RUIZ, Eduardo Alberto e SOUZA, Roberto Martins de. Effect of load and indenter diameter on the amount of film cracks developed during the indentification of coated systems. 2003, Anais.. São Paulo: ABCM, 2003. Disponível em: https://repositorio.usp.br/directbitstream/3dfa2613-ec17-49ba-b9e3-0ff7fe117402/Souza_RM-2003-Effect%20of%20load%20and%20indenter%20diameter%20on%20the%20amount%20of%20film%20cracks%20developed%20during%20ok.pdf. Acesso em: 14 nov. 2024.
APA
Gomez de Lamadrid , P. B., Pérez Ruiz, E. A., & Souza, R. M. de. (2003). Effect of load and indenter diameter on the amount of film cracks developed during the indentification of coated systems. In COBEM 2003: proceedings. São Paulo: ABCM. Recuperado de https://repositorio.usp.br/directbitstream/3dfa2613-ec17-49ba-b9e3-0ff7fe117402/Souza_RM-2003-Effect%20of%20load%20and%20indenter%20diameter%20on%20the%20amount%20of%20film%20cracks%20developed%20during%20ok.pdf
NLM
Gomez de Lamadrid PB, Pérez Ruiz EA, Souza RM de. Effect of load and indenter diameter on the amount of film cracks developed during the indentification of coated systems. [Internet]. COBEM 2003: proceedings. 2003 ;[citado 2024 nov. 14 ] Available from: https://repositorio.usp.br/directbitstream/3dfa2613-ec17-49ba-b9e3-0ff7fe117402/Souza_RM-2003-Effect%20of%20load%20and%20indenter%20diameter%20on%20the%20amount%20of%20film%20cracks%20developed%20during%20ok.pdf
Vancouver
Gomez de Lamadrid PB, Pérez Ruiz EA, Souza RM de. Effect of load and indenter diameter on the amount of film cracks developed during the indentification of coated systems. [Internet]. COBEM 2003: proceedings. 2003 ;[citado 2024 nov. 14 ] Available from: https://repositorio.usp.br/directbitstream/3dfa2613-ec17-49ba-b9e3-0ff7fe117402/Souza_RM-2003-Effect%20of%20load%20and%20indenter%20diameter%20on%20the%20amount%20of%20film%20cracks%20developed%20during%20ok.pdf

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