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Artigo de periodico
Impulse and continuous control of peicewise deterministic Markov processes (2000)
Costa, Oswaldo Luiz do Valle ; Raymundo, A. B.
Source: Stochastics and Stochastics Reports. Unidade: EP
Assunto: PROCESSOS DE MARKOV
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ABNT
COSTA, Oswaldo Luiz do Valle e RAYMUNDO, A. B. Impulse and continuous control of peicewise deterministic Markov processes. Stochastics and Stochastics Reports, v. 70, p. 75-107, 2000Tradução . . Disponível em: https://doi.org/10.1080/17442500008834246. Acesso em: 06 nov. 2024.
APA
Costa, O. L. do V., & Raymundo, A. B. (2000). Impulse and continuous control of peicewise deterministic Markov processes. Stochastics and Stochastics Reports, 70, 75-107. doi:10.1080/17442500008834246
NLM
Costa OL do V, Raymundo AB. Impulse and continuous control of peicewise deterministic Markov processes [Internet]. Stochastics and Stochastics Reports. 2000 ; 70 75-107.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1080/17442500008834246
Vancouver
Costa OL do V, Raymundo AB. Impulse and continuous control of peicewise deterministic Markov processes [Internet]. Stochastics and Stochastics Reports. 2000 ; 70 75-107.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1080/17442500008834246
Artigo de periodico
Identification of the Jules-Atherton model parameters using random and deterministic searches (2000)
Del Moral Hernandez, Emilio ; Muranaka, Carlos S.; Cardoso, José Roberto
Source: Physica B. Unidade: EP
Assunto: MAGNETISMO
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DEL MORAL HERNANDEZ, Emilio e MURANAKA, Carlos S. e CARDOSO, José Roberto. Identification of the Jules-Atherton model parameters using random and deterministic searches. Physica B, v. 275, p. 212-215, 2000Tradução . . Disponível em: https://doi.org/10.1016/s0921-4526(99)00766-8. Acesso em: 06 nov. 2024.
APA
Del Moral Hernandez, E., Muranaka, C. S., & Cardoso, J. R. (2000). Identification of the Jules-Atherton model parameters using random and deterministic searches. Physica B, 275, 212-215. doi:10.1016/s0921-4526(99)00766-8
NLM
Del Moral Hernandez E, Muranaka CS, Cardoso JR. Identification of the Jules-Atherton model parameters using random and deterministic searches [Internet]. Physica B. 2000 ; 275 212-215.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0921-4526(99)00766-8
Vancouver
Del Moral Hernandez E, Muranaka CS, Cardoso JR. Identification of the Jules-Atherton model parameters using random and deterministic searches [Internet]. Physica B. 2000 ; 275 212-215.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0921-4526(99)00766-8
Artigo de periodico
Medium voltage SF6 circuit-break arc model application (2000)
Pinto, Lucilius Carlos; Zanetta Júnior, Luiz Cera
Source: Electric Power Systems Research. Unidade: EP
Assunto: CIRCUITOS ELETRÔNICOS
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PINTO, Lucilius Carlos e ZANETTA JÚNIOR, Luiz Cera. Medium voltage SF6 circuit-break arc model application. Electric Power Systems Research, v. 53, p. 67-71, 2000Tradução . . Disponível em: https://doi.org/10.1016/s0378-7796(99)00043-7. Acesso em: 06 nov. 2024.
APA
Pinto, L. C., & Zanetta Júnior, L. C. (2000). Medium voltage SF6 circuit-break arc model application. Electric Power Systems Research, 53, 67-71. doi:10.1016/s0378-7796(99)00043-7
NLM
Pinto LC, Zanetta Júnior LC. Medium voltage SF6 circuit-break arc model application [Internet]. Electric Power Systems Research. 2000 ; 53 67-71.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0378-7796(99)00043-7
Vancouver
Pinto LC, Zanetta Júnior LC. Medium voltage SF6 circuit-break arc model application [Internet]. Electric Power Systems Research. 2000 ; 53 67-71.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0378-7796(99)00043-7
Artigo de periodico
Modified nodal analysis applied to electric circuits coupled with FEM in the simulation of a universal motor (2000)
Costa, Maurício Caldora; Nabeta, Silvio Ikuyo ; Cardoso, José Roberto
Source: IEEE Transactions on Magnetics. Unidade: EP
Subjects: MÁQUINAS ELÉTRICAS, MÉTODO DOS ELEMENTOS FINITOS
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COSTA, Maurício Caldora e NABETA, Silvio Ikuyo e CARDOSO, José Roberto. Modified nodal analysis applied to electric circuits coupled with FEM in the simulation of a universal motor. IEEE Transactions on Magnetics, v. 36, n. 4, p. 1431-1434, 2000Tradução . . Disponível em: https://doi.org/10.1109/20.877707. Acesso em: 06 nov. 2024.
APA
Costa, M. C., Nabeta, S. I., & Cardoso, J. R. (2000). Modified nodal analysis applied to electric circuits coupled with FEM in the simulation of a universal motor. IEEE Transactions on Magnetics, 36( 4), 1431-1434. doi:10.1109/20.877707
NLM
Costa MC, Nabeta SI, Cardoso JR. Modified nodal analysis applied to electric circuits coupled with FEM in the simulation of a universal motor [Internet]. IEEE Transactions on Magnetics. 2000 ;36( 4): 1431-1434.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1109/20.877707
Vancouver
Costa MC, Nabeta SI, Cardoso JR. Modified nodal analysis applied to electric circuits coupled with FEM in the simulation of a universal motor [Internet]. IEEE Transactions on Magnetics. 2000 ;36( 4): 1431-1434.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1109/20.877707
Artigo de periodico
Furfuryl alcohol conjugated oligomer pellicle formation (2000)
Batista, P. S.; Souza, Milton Ferreira de
Source: Polymer. Unidade: IFSC
Assunto: POLÍMEROS (QUÍMICA ORGÂNICA)
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BATISTA, P. S. e SOUZA, Milton Ferreira de. Furfuryl alcohol conjugated oligomer pellicle formation. Polymer, v. 41, p. 8263-8269, 2000Tradução . . Disponível em: https://doi.org/10.1016/s0032-3861(00)00178-6. Acesso em: 06 nov. 2024.
APA
Batista, P. S., & Souza, M. F. de. (2000). Furfuryl alcohol conjugated oligomer pellicle formation. Polymer, 41, 8263-8269. doi:10.1016/s0032-3861(00)00178-6
NLM
Batista PS, Souza MF de. Furfuryl alcohol conjugated oligomer pellicle formation [Internet]. Polymer. 2000 ; 41 8263-8269.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0032-3861(00)00178-6
Vancouver
Batista PS, Souza MF de. Furfuryl alcohol conjugated oligomer pellicle formation [Internet]. Polymer. 2000 ; 41 8263-8269.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0032-3861(00)00178-6
Artigo de periodico
Surface tension of polyethylene used in thermal coating (2000)
Demarquette, Nicole Raymonde ; Silva, Fábio Teodoro; Brandi, Sérgio Duarte ; Gouvêa, Douglas
Source: Polymer Engineering and Science. Unidade: EP
Subjects: ALUMÍNIO, REVESTIMENTO DE SUPERFÍCIES
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ABNT
DEMARQUETTE, Nicole Raymonde et al. Surface tension of polyethylene used in thermal coating. Polymer Engineering and Science, v. 40, n. 7, p. 1663-1671, 2000Tradução . . Disponível em: https://doi.org/10.1002/pen.11298. Acesso em: 06 nov. 2024.
APA
Demarquette, N. R., Silva, F. T., Brandi, S. D., & Gouvêa, D. (2000). Surface tension of polyethylene used in thermal coating. Polymer Engineering and Science, 40( 7), 1663-1671. doi:10.1002/pen.11298
NLM
Demarquette NR, Silva FT, Brandi SD, Gouvêa D. Surface tension of polyethylene used in thermal coating [Internet]. Polymer Engineering and Science. 2000 ; 40( 7): 1663-1671.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1002/pen.11298
Vancouver
Demarquette NR, Silva FT, Brandi SD, Gouvêa D. Surface tension of polyethylene used in thermal coating [Internet]. Polymer Engineering and Science. 2000 ; 40( 7): 1663-1671.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1002/pen.11298
Artigo de periodico
Dynamic failure of structural joint systems (2000)
Birch, R S; Alves, Marcílio
Source: Thin-Walled Structures. Unidade: EP
Subjects: FADIGA DAS ESTRUTURAS, RESISTÊNCIA DOS MATERIAIS
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BIRCH, R S e ALVES, Marcílio. Dynamic failure of structural joint systems. Thin-Walled Structures, v. 36, n. 2, 2000Tradução . . Disponível em: https://doi.org/10.1016/s0263-8231(99)00040-3. Acesso em: 06 nov. 2024.
APA
Birch, R. S., & Alves, M. (2000). Dynamic failure of structural joint systems. Thin-Walled Structures, 36( 2). doi:10.1016/s0263-8231(99)00040-3
NLM
Birch RS, Alves M. Dynamic failure of structural joint systems [Internet]. Thin-Walled Structures. 2000 ; 36( 2):[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0263-8231(99)00040-3
Vancouver
Birch RS, Alves M. Dynamic failure of structural joint systems [Internet]. Thin-Walled Structures. 2000 ; 36( 2):[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0263-8231(99)00040-3
Trabalho de evento-anais periodico
An analytical-FDTD method for near LEMP calculation (2000)
Sartori, Carlos Antonio França; Cardoso, José Roberto
Source: IEEE Transactions on Magnetics. Conference titles: Simpósio Brasileiro de Computação Gráfica e Processamento de Imagens - SIBGRAPI 99. Unidade: EP
Assunto: ELETROMAGNETISMO
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ABNT
SARTORI, Carlos Antonio França e CARDOSO, José Roberto. An analytical-FDTD method for near LEMP calculation. IEEE Transactions on Magnetics. New York: IEEE. . Acesso em: 06 nov. 2024. , 2000
APA
Sartori, C. A. F., & Cardoso, J. R. (2000). An analytical-FDTD method for near LEMP calculation. IEEE Transactions on Magnetics. New York: IEEE.
NLM
Sartori CAF, Cardoso JR. An analytical-FDTD method for near LEMP calculation. IEEE Transactions on Magnetics. 2000 ; 36( 4): 1631-1634.[citado 2024 nov. 06 ]
Vancouver
Sartori CAF, Cardoso JR. An analytical-FDTD method for near LEMP calculation. IEEE Transactions on Magnetics. 2000 ; 36( 4): 1631-1634.[citado 2024 nov. 06 ]
Artigo de periodico
Binary operator design by k-nearest neighbor learning with application to image resolution increasing (2000)
Hae, Yong Kim
Source: International Journal of Imaging Systems and Technology. Unidade: EP
Assunto: RECONHECIMENTO DE PADRÕES
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ABNT
HAE, Yong Kim. Binary operator design by k-nearest neighbor learning with application to image resolution increasing. International Journal of Imaging Systems and Technology, v. 11, n. 5, p. 331-339, 2000Tradução . . Disponível em: https://doi.org/10.1002/ima.1017. Acesso em: 06 nov. 2024.
APA
Hae, Y. K. (2000). Binary operator design by k-nearest neighbor learning with application to image resolution increasing. International Journal of Imaging Systems and Technology, 11( 5), 331-339. doi:10.1002/ima.1017
NLM
Hae YK. Binary operator design by k-nearest neighbor learning with application to image resolution increasing [Internet]. International Journal of Imaging Systems and Technology. 2000 ; 11( 5): 331-339.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1002/ima.1017
Vancouver
Hae YK. Binary operator design by k-nearest neighbor learning with application to image resolution increasing [Internet]. International Journal of Imaging Systems and Technology. 2000 ; 11( 5): 331-339.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1002/ima.1017
Artigo de periodico
Simultaneous extraction of the silicon film and front oxide thicknesses on fully depleted SOI nMOSFETs (2000)
Nicolett, Aparecido Sirley; Martino, João Antonio ; Simoen, Eddy ; Claeys, Cor
Source: Solid-State Electronics. Unidade: EP
Assunto: CIRCUITOS INTEGRADOS
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ABNT
NICOLETT, Aparecido Sirley et al. Simultaneous extraction of the silicon film and front oxide thicknesses on fully depleted SOI nMOSFETs. Solid-State Electronics, v. No 2000, n. 11, p. 1961-1969, 2000Tradução . . Disponível em: https://doi.org/10.1016/s0038-1101(00)00166-0. Acesso em: 06 nov. 2024.
APA
Nicolett, A. S., Martino, J. A., Simoen, E., & Claeys, C. (2000). Simultaneous extraction of the silicon film and front oxide thicknesses on fully depleted SOI nMOSFETs. Solid-State Electronics, No 2000( 11), 1961-1969. doi:10.1016/s0038-1101(00)00166-0
NLM
Nicolett AS, Martino JA, Simoen E, Claeys C. Simultaneous extraction of the silicon film and front oxide thicknesses on fully depleted SOI nMOSFETs [Internet]. Solid-State Electronics. 2000 ; No 2000( 11): 1961-1969.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0038-1101(00)00166-0
Vancouver
Nicolett AS, Martino JA, Simoen E, Claeys C. Simultaneous extraction of the silicon film and front oxide thicknesses on fully depleted SOI nMOSFETs [Internet]. Solid-State Electronics. 2000 ; No 2000( 11): 1961-1969.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0038-1101(00)00166-0
Artigo de periodico
Robust H2 - control for discrete time Markovian jump linear systems (2000)
Costa, Oswaldo Luiz do Valle ; Marques, Ricardo Paulino
Source: International Journal of Control. Unidade: EP
Assunto: CONTROLE (TEORIA DE SISTEMAS E CONTROLE)
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ABNT
COSTA, Oswaldo Luiz do Valle e MARQUES, Ricardo Paulino. Robust H2 - control for discrete time Markovian jump linear systems. International Journal of Control, v. 73, n. 1, p. 11-21. 2000, 2000Tradução . . Disponível em: https://doi.org/10.1080/002071700219894. Acesso em: 06 nov. 2024.
APA
Costa, O. L. do V., & Marques, R. P. (2000). Robust H2 - control for discrete time Markovian jump linear systems. International Journal of Control, 73( 1), 11-21. 2000. doi:10.1080/002071700219894
NLM
Costa OL do V, Marques RP. Robust H2 - control for discrete time Markovian jump linear systems [Internet]. International Journal of Control. 2000 ; 73( 1): 11-21. 2000.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1080/002071700219894
Vancouver
Costa OL do V, Marques RP. Robust H2 - control for discrete time Markovian jump linear systems [Internet]. International Journal of Control. 2000 ; 73( 1): 11-21. 2000.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1080/002071700219894
Artigo de periodico
On the elastic modulus degradation in continuum damage mechanics (2000)
Alves, Marcílio ; Yu, Jilin; Jones, Norman
Source: Computers & Structures. Unidade: EP
Subjects: MECÂNICA DA FRATURA, MECÂNICA DAS ESTRUTURAS
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ABNT
ALVES, Marcílio e YU, Jilin e JONES, Norman. On the elastic modulus degradation in continuum damage mechanics. Computers & Structures, v. 76, n. 6, p. 703-712, 2000Tradução . . Disponível em: https://doi.org/10.1016/s0045-7949(99)00187-x. Acesso em: 06 nov. 2024.
APA
Alves, M., Yu, J., & Jones, N. (2000). On the elastic modulus degradation in continuum damage mechanics. Computers & Structures, 76( 6), 703-712. doi:10.1016/s0045-7949(99)00187-x
NLM
Alves M, Yu J, Jones N. On the elastic modulus degradation in continuum damage mechanics [Internet]. Computers & Structures. 2000 ; 76( 6): 703-712.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0045-7949(99)00187-x
Vancouver
Alves M, Yu J, Jones N. On the elastic modulus degradation in continuum damage mechanics [Internet]. Computers & Structures. 2000 ; 76( 6): 703-712.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0045-7949(99)00187-x
Artigo de periodico
Graded-channel fully depleted silicon-on-insulator nMOSFET for reducing the parasitic bipolar effects (2000)
Pavanello, Marcelo Antonio ; Martino, João Antonio ; Flandre, Denis
Source: Solid-State Electronics. Unidade: EP
Assunto: CIRCUITOS INTEGRADOS
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ABNT
PAVANELLO, Marcelo Antonio e MARTINO, João Antonio e FLANDRE, Denis. Graded-channel fully depleted silicon-on-insulator nMOSFET for reducing the parasitic bipolar effects. Solid-State Electronics, v. 44, n. 6, p. 917-922, 2000Tradução . . Disponível em: https://doi.org/10.1016/s0038-1101(00)00032-0. Acesso em: 06 nov. 2024.
APA
Pavanello, M. A., Martino, J. A., & Flandre, D. (2000). Graded-channel fully depleted silicon-on-insulator nMOSFET for reducing the parasitic bipolar effects. Solid-State Electronics, 44( 6), 917-922. doi:10.1016/s0038-1101(00)00032-0
NLM
Pavanello MA, Martino JA, Flandre D. Graded-channel fully depleted silicon-on-insulator nMOSFET for reducing the parasitic bipolar effects [Internet]. Solid-State Electronics. 2000 ; 44( 6): 917-922.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0038-1101(00)00032-0
Vancouver
Pavanello MA, Martino JA, Flandre D. Graded-channel fully depleted silicon-on-insulator nMOSFET for reducing the parasitic bipolar effects [Internet]. Solid-State Electronics. 2000 ; 44( 6): 917-922.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0038-1101(00)00032-0
Artigo de periodico
Fierz-Pauli higher derivative gravity (2000)
Accioly, A; Ragusa, Silvestre; Mukai, H; Neto, E D
Source: Brazilian Journal of Physics. Unidade: IFSC
Assunto: RELATIVIDADE E GRAVITACAO
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ABNT
ACCIOLY, A et al. Fierz-Pauli higher derivative gravity. Brazilian Journal of Physics, v. 30, n. 3, p. 544-553, 2000Tradução . . Disponível em: https://doi.org/10.1590/s0103-97332000000300011. Acesso em: 06 nov. 2024.
APA
Accioly, A., Ragusa, S., Mukai, H., & Neto, E. D. (2000). Fierz-Pauli higher derivative gravity. Brazilian Journal of Physics, 30( 3), 544-553. doi:10.1590/s0103-97332000000300011
NLM
Accioly A, Ragusa S, Mukai H, Neto ED. Fierz-Pauli higher derivative gravity [Internet]. Brazilian Journal of Physics. 2000 ; 30( 3): 544-553.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1590/s0103-97332000000300011
Vancouver
Accioly A, Ragusa S, Mukai H, Neto ED. Fierz-Pauli higher derivative gravity [Internet]. Brazilian Journal of Physics. 2000 ; 30( 3): 544-553.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1590/s0103-97332000000300011
Artigo de periodico
Tetraethylorthosilicate SiO2 films deposited at a low temperature (2000)
Silva, Ana Neilde Rodrigues da; Morimoto, Nilton Itiro ; Bonnaud, Olivier
Source: Microelectronics and Realiability. Unidade: EP
Assunto: CIRCUITOS ELETRÔNICOS
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ABNT
SILVA, Ana Neilde Rodrigues da e MORIMOTO, Nilton Itiro e BONNAUD, Olivier. Tetraethylorthosilicate SiO2 films deposited at a low temperature. Microelectronics and Realiability, v. 40, p. 621-624, 2000Tradução . . Disponível em: https://doi.org/10.1016/s0026-2714(99)00296-6. Acesso em: 06 nov. 2024.
APA
Silva, A. N. R. da, Morimoto, N. I., & Bonnaud, O. (2000). Tetraethylorthosilicate SiO2 films deposited at a low temperature. Microelectronics and Realiability, 40, 621-624. doi:10.1016/s0026-2714(99)00296-6
NLM
Silva ANR da, Morimoto NI, Bonnaud O. Tetraethylorthosilicate SiO2 films deposited at a low temperature [Internet]. Microelectronics and Realiability. 2000 ; 40 621-624.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0026-2714(99)00296-6
Vancouver
Silva ANR da, Morimoto NI, Bonnaud O. Tetraethylorthosilicate SiO2 films deposited at a low temperature [Internet]. Microelectronics and Realiability. 2000 ; 40 621-624.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0026-2714(99)00296-6
Artigo de periodico
An asymmetric channel SOI nMOSFET for reducing parasitic effects and improving output characteristics (2000)
Pavanello, Marcelo Antonio ; Martino, João Antonio ; Dessard, Vincent; Flandre, Denis
Source: Electrochemical and Solid-State Letters. Unidade: EP
Assunto: CIRCUITOS INTEGRADOS MOS
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ABNT
PAVANELLO, Marcelo Antonio et al. An asymmetric channel SOI nMOSFET for reducing parasitic effects and improving output characteristics. Electrochemical and Solid-State Letters, v. 3, n. Ja 2000, p. 50-52, 2000Tradução . . Disponível em: https://doi.org/10.1149/1.1390955. Acesso em: 06 nov. 2024.
APA
Pavanello, M. A., Martino, J. A., Dessard, V., & Flandre, D. (2000). An asymmetric channel SOI nMOSFET for reducing parasitic effects and improving output characteristics. Electrochemical and Solid-State Letters, 3( Ja 2000), 50-52. doi:10.1149/1.1390955
NLM
Pavanello MA, Martino JA, Dessard V, Flandre D. An asymmetric channel SOI nMOSFET for reducing parasitic effects and improving output characteristics [Internet]. Electrochemical and Solid-State Letters. 2000 ; 3( Ja 2000): 50-52.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1149/1.1390955
Vancouver
Pavanello MA, Martino JA, Dessard V, Flandre D. An asymmetric channel SOI nMOSFET for reducing parasitic effects and improving output characteristics [Internet]. Electrochemical and Solid-State Letters. 2000 ; 3( Ja 2000): 50-52.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1149/1.1390955
Artigo de periodico
Comparison of fluorescent lamp stabilization methods in the current-fed push-pull inverter (2000)
Sierra, Jorge A.; Kaiser, Walter
Source: IEEE Transactions on Industry Applications. Unidade: EP
Assunto: ENGENHARIA ELÉTRICA
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ABNT
SIERRA, Jorge A. e KAISER, Walter. Comparison of fluorescent lamp stabilization methods in the current-fed push-pull inverter. IEEE Transactions on Industry Applications, v. 36, p. 105-110, 2000Tradução . . Disponível em: https://doi.org/10.1109/ias.1998.729966. Acesso em: 06 nov. 2024.
APA
Sierra, J. A., & Kaiser, W. (2000). Comparison of fluorescent lamp stabilization methods in the current-fed push-pull inverter. IEEE Transactions on Industry Applications, 36, 105-110. doi:10.1109/ias.1998.729966
NLM
Sierra JA, Kaiser W. Comparison of fluorescent lamp stabilization methods in the current-fed push-pull inverter [Internet]. IEEE Transactions on Industry Applications. 2000 ; 36 105-110.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1109/ias.1998.729966
Vancouver
Sierra JA, Kaiser W. Comparison of fluorescent lamp stabilization methods in the current-fed push-pull inverter [Internet]. IEEE Transactions on Industry Applications. 2000 ; 36 105-110.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1109/ias.1998.729966
Artigo de periodico
Robust skeletonization through exact Euclidean distance transform and its application to neuromorphometry (2000)
Costa, Luciano da Fontoura
Source: Real-Time Imaging. Unidade: IFSC
Subjects: INSTRUMENTAÇÃO (FÍSICA), SIMULAÇÃO, COMPUTAÇÃO APLICADA
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ABNT
COSTA, Luciano da Fontoura. Robust skeletonization through exact Euclidean distance transform and its application to neuromorphometry. Real-Time Imaging, v. 6, p. 415-431, 2000Tradução . . Acesso em: 06 nov. 2024.
APA
Costa, L. da F. (2000). Robust skeletonization through exact Euclidean distance transform and its application to neuromorphometry. Real-Time Imaging, 6, 415-431.
NLM
Costa L da F. Robust skeletonization through exact Euclidean distance transform and its application to neuromorphometry. Real-Time Imaging. 2000 ;6 415-431.[citado 2024 nov. 06 ]
Vancouver
Costa L da F. Robust skeletonization through exact Euclidean distance transform and its application to neuromorphometry. Real-Time Imaging. 2000 ;6 415-431.[citado 2024 nov. 06 ]
Artigo de periodico
Amorphous lead titanate: a new wide-band gap semiconductor with photoluminescence at room temperature (2000)
Leite, E R; Pontes, F M; Paris, E C; Paskocimas, C A; Lee, E J H; Longo, Elson; Pizani, Paulo Sérgio; Varella, J A; Mastelaro, Valmor Roberto
Source: Advanced Materials for Optics and Electronics. Unidade: IFSC
Assunto: MATÉRIA CONDENSADA
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ABNT
LEITE, E R et al. Amorphous lead titanate: a new wide-band gap semiconductor with photoluminescence at room temperature. Advanced Materials for Optics and Electronics, v. 10, p. 235-240, 2000Tradução . . Disponível em: https://doi.org/10.1002/1099-0712(200011/12)10:6%3C235::aid-amo409%3E3.0.co;2-6. Acesso em: 06 nov. 2024.
APA
Leite, E. R., Pontes, F. M., Paris, E. C., Paskocimas, C. A., Lee, E. J. H., Longo, E., et al. (2000). Amorphous lead titanate: a new wide-band gap semiconductor with photoluminescence at room temperature. Advanced Materials for Optics and Electronics, 10, 235-240. doi:10.1002/1099-0712(200011/12)10:6%3C235::aid-amo409%3E3.0.co;2-6
NLM
Leite ER, Pontes FM, Paris EC, Paskocimas CA, Lee EJH, Longo E, Pizani PS, Varella JA, Mastelaro VR. Amorphous lead titanate: a new wide-band gap semiconductor with photoluminescence at room temperature [Internet]. Advanced Materials for Optics and Electronics. 2000 ;10 235-240.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1002/1099-0712(200011/12)10:6%3C235::aid-amo409%3E3.0.co;2-6
Vancouver
Leite ER, Pontes FM, Paris EC, Paskocimas CA, Lee EJH, Longo E, Pizani PS, Varella JA, Mastelaro VR. Amorphous lead titanate: a new wide-band gap semiconductor with photoluminescence at room temperature [Internet]. Advanced Materials for Optics and Electronics. 2000 ;10 235-240.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1002/1099-0712(200011/12)10:6%3C235::aid-amo409%3E3.0.co;2-6
Artigo de periodico-carta/editorial
Guest editorial: special issue on the Hough transform. Has the Hough transform come of age? (2000)
Costa, Luciano da Fontoura ; Wechsler, Harry
Source: Real-Time Imaging. Unidade: IFSC
Subjects: COMPUTAÇÃO APLICADA, COMPUTAÇÃO GRÁFICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
COSTA, Luciano da Fontoura e WECHSLER, Harry. Guest editorial: special issue on the Hough transform. Has the Hough transform come of age?. Real-Time Imaging. London: Instituto de Física de São Carlos, Universidade de São Paulo. . Acesso em: 06 nov. 2024. , 2000
APA
Costa, L. da F., & Wechsler, H. (2000). Guest editorial: special issue on the Hough transform. Has the Hough transform come of age? Real-Time Imaging. London: Instituto de Física de São Carlos, Universidade de São Paulo.
NLM
Costa L da F, Wechsler H. Guest editorial: special issue on the Hough transform. Has the Hough transform come of age? Real-Time Imaging. 2000 ; 6 77-78.[citado 2024 nov. 06 ]
Vancouver
Costa L da F, Wechsler H. Guest editorial: special issue on the Hough transform. Has the Hough transform come of age? Real-Time Imaging. 2000 ; 6 77-78.[citado 2024 nov. 06 ]

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