ReP USP - Resultado da busca

Filtros : "European Conference on Radiation and its Effects on Components and Systems (RADECS)" Removido: "Imdexado na Web of Science" Limpar

Filtros

Trabalho de evento
Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA (2022)
Benevenuti, Fabio ; Oliveira, Ádria ; Lopes, Israel da Costa ; Kastensmidt, Fernanda ; Medina, Nilberto Heder ; Added, Nemitala ; Aguiar, Vitor Ângelo Paulino de ; Guazzelli, Marcilei Aparecida
Conference titles: European Conference on Radiation and its Effects on Components and Systems (RADECS). Unidade: IF
Subjects: FÍSICA NUCLEAR, RADIAÇÃO IONIZANTE, ELETRÔNICA QUÂNTICA, NANOTECNOLOGIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
BENEVENUTI, Fabio et al. Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA. 2022, Anais.. New York: IEEE, 2022. Disponível em: https://doi.org/10.1109/RADECS47380.2019.9745650. Acesso em: 15 out. 2025.
APA
Benevenuti, F., Oliveira, Á., Lopes, I. da C., Kastensmidt, F., Medina, N. H., Added, N., et al. (2022). Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA. In . New York: IEEE. doi:10.1109/RADECS47380.2019.9745650
NLM
Benevenuti F, Oliveira Á, Lopes I da C, Kastensmidt F, Medina NH, Added N, Aguiar VÂP de, Guazzelli MA. Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA [Internet]. 2022 ;[citado 2025 out. 15 ] Available from: https://doi.org/10.1109/RADECS47380.2019.9745650
Vancouver
Benevenuti F, Oliveira Á, Lopes I da C, Kastensmidt F, Medina NH, Added N, Aguiar VÂP de, Guazzelli MA. Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA [Internet]. 2022 ;[citado 2025 out. 15 ] Available from: https://doi.org/10.1109/RADECS47380.2019.9745650
Trabalho de evento
Radiation Hardness of GaN HEMTs to TID Effects: COTS for harsh environments (2022)
Vilas Bôas, Alexis C; Melo, M A A de; Santos, R B B; Giacomini, R; Medina, Nilberto Heder ; Seixas, L E; Finco, S; Palomo, F R; Romero-Maestre, A; Guazzelli, Marcilei A.
Conference titles: European Conference on Radiation and its Effects on Components and Systems (RADECS). Unidade: IF
Subjects: FÍSICA NUCLEAR, RADIAÇÃO IONIZANTE, ELETRÔNICA QUÂNTICA, NANOTECNOLOGIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
VILAS BÔAS, Alexis C et al. Radiation Hardness of GaN HEMTs to TID Effects: COTS for harsh environments. 2022, Anais.. New York: IEEE, 2022. Disponível em: https://doi.org/10.1109/RADECS47380.2019.9745697. Acesso em: 15 out. 2025.
APA
Vilas Bôas, A. C., Melo, M. A. A. de, Santos, R. B. B., Giacomini, R., Medina, N. H., Seixas, L. E., et al. (2022). Radiation Hardness of GaN HEMTs to TID Effects: COTS for harsh environments. In . New York: IEEE. doi:10.1109/RADECS47380.2019.9745697
NLM
Vilas Bôas AC, Melo MAA de, Santos RBB, Giacomini R, Medina NH, Seixas LE, Finco S, Palomo FR, Romero-Maestre A, Guazzelli MA. Radiation Hardness of GaN HEMTs to TID Effects: COTS for harsh environments [Internet]. 2022 ;[citado 2025 out. 15 ] Available from: https://doi.org/10.1109/RADECS47380.2019.9745697
Vancouver
Vilas Bôas AC, Melo MAA de, Santos RBB, Giacomini R, Medina NH, Seixas LE, Finco S, Palomo FR, Romero-Maestre A, Guazzelli MA. Radiation Hardness of GaN HEMTs to TID Effects: COTS for harsh environments [Internet]. 2022 ;[citado 2025 out. 15 ] Available from: https://doi.org/10.1109/RADECS47380.2019.9745697

Digital Library of Intellectual Production of Universidade de São Paulo 2012 - 2025