Filtros : "IFSC031" "SILICONE" Removidos: "Indexado no PubMed" "GEOCIÊNCIAS" "HERNANDEZ, JOSE MAURO DA COSTA" "IQ005" "pa" "Materials Chemistry and Physics" "PATENTE" "EESC/IQSC/FMRP" Limpar

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  • Source: ACS Applied Nano Materials. Unidade: IFSC

    Subjects: SILICONE, FILMES FINOS, NANOPARTÍCULAS

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      LEIDENS, Leonardo Mathias et al. Nanotribology of hydrogenated amorphous silicon: sliding- dependent friction and implications for nanoelectromechanical systems. ACS Applied Nano Materials, v. 5, n. 10, p. 15546-15556 + supporting information: S1-S7, 2022Tradução . . Disponível em: https://doi.org/10.1021/acsanm.2c03603. Acesso em: 10 ago. 2024.
    • APA

      Leidens, L. M., Michels, A. F., Perotti, B. L., Alvarez, F., Zanatta, A. R., & Figueroa, C. A. (2022). Nanotribology of hydrogenated amorphous silicon: sliding- dependent friction and implications for nanoelectromechanical systems. ACS Applied Nano Materials, 5( 10), 15546-15556 + supporting information: S1-S7. doi:10.1021/acsanm.2c03603
    • NLM

      Leidens LM, Michels AF, Perotti BL, Alvarez F, Zanatta AR, Figueroa CA. Nanotribology of hydrogenated amorphous silicon: sliding- dependent friction and implications for nanoelectromechanical systems [Internet]. ACS Applied Nano Materials. 2022 ; 5( 10): 15546-15556 + supporting information: S1-S7.[citado 2024 ago. 10 ] Available from: https://doi.org/10.1021/acsanm.2c03603
    • Vancouver

      Leidens LM, Michels AF, Perotti BL, Alvarez F, Zanatta AR, Figueroa CA. Nanotribology of hydrogenated amorphous silicon: sliding- dependent friction and implications for nanoelectromechanical systems [Internet]. ACS Applied Nano Materials. 2022 ; 5( 10): 15546-15556 + supporting information: S1-S7.[citado 2024 ago. 10 ] Available from: https://doi.org/10.1021/acsanm.2c03603
  • Source: Journal of Physics: Condensed Matter. Unidade: IFSC

    Subjects: ENERGIA, FILMES FINOS, SILICONE

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      ZANATTA, Antonio Ricardo e KHAN, A. e KORDESCH, M. E. Red-green-blue light emission and energy transfer processes in amorphous SiN films doped with Sm and Tb. Journal of Physics: Condensed Matter, v. 19, n. 43, p. 436230-1-436230-8, 2007Tradução . . Disponível em: https://doi.org/10.1088/0953-8984/19/43/436230. Acesso em: 10 ago. 2024.
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      Zanatta, A. R., Khan, A., & Kordesch, M. E. (2007). Red-green-blue light emission and energy transfer processes in amorphous SiN films doped with Sm and Tb. Journal of Physics: Condensed Matter, 19( 43), 436230-1-436230-8. doi:10.1088/0953-8984/19/43/436230
    • NLM

      Zanatta AR, Khan A, Kordesch ME. Red-green-blue light emission and energy transfer processes in amorphous SiN films doped with Sm and Tb [Internet]. Journal of Physics: Condensed Matter. 2007 ; 19( 43): 436230-1-436230-8.[citado 2024 ago. 10 ] Available from: https://doi.org/10.1088/0953-8984/19/43/436230
    • Vancouver

      Zanatta AR, Khan A, Kordesch ME. Red-green-blue light emission and energy transfer processes in amorphous SiN films doped with Sm and Tb [Internet]. Journal of Physics: Condensed Matter. 2007 ; 19( 43): 436230-1-436230-8.[citado 2024 ago. 10 ] Available from: https://doi.org/10.1088/0953-8984/19/43/436230
  • Source: Applied Physics Letters. Unidades: EESC, IFSC

    Subjects: ESPECTROSCOPIA RAMAN, FILMES FINOS, SILICONE

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      PIZANI, Paulo Sérgio e JASINEVICIUS, Renato Goulart e ZANATTA, Antonio Ricardo. Effect of the initial structure of silicon surface on the generation of multiple structural phases by cyclic microindentation. Applied Physics Letters, v. 89, n. 3, p. 031917-1-031917-3, 2006Tradução . . Disponível em: https://doi.org/10.1063/1.2227644. Acesso em: 10 ago. 2024.
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      Pizani, P. S., Jasinevicius, R. G., & Zanatta, A. R. (2006). Effect of the initial structure of silicon surface on the generation of multiple structural phases by cyclic microindentation. Applied Physics Letters, 89( 3), 031917-1-031917-3. doi:10.1063/1.2227644
    • NLM

      Pizani PS, Jasinevicius RG, Zanatta AR. Effect of the initial structure of silicon surface on the generation of multiple structural phases by cyclic microindentation [Internet]. Applied Physics Letters. 2006 ; 89( 3): 031917-1-031917-3.[citado 2024 ago. 10 ] Available from: https://doi.org/10.1063/1.2227644
    • Vancouver

      Pizani PS, Jasinevicius RG, Zanatta AR. Effect of the initial structure of silicon surface on the generation of multiple structural phases by cyclic microindentation [Internet]. Applied Physics Letters. 2006 ; 89( 3): 031917-1-031917-3.[citado 2024 ago. 10 ] Available from: https://doi.org/10.1063/1.2227644
  • Source: Defect and Diffusion Forum. Unidades: EESC, IFSC

    Subjects: SILICONE, ESPECTROSCOPIA RAMAN, MUDANÇA DE FASE

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    • ABNT

      PIZANI, Paulo Sérgio e JASINEVICIUS, Renato Goulart e ZANATTA, Ricardo Antonio. Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering. Defect and Diffusion Forum, v. 258-260, p. 276-281, 2006Tradução . . Acesso em: 10 ago. 2024.
    • APA

      Pizani, P. S., Jasinevicius, R. G., & Zanatta, R. A. (2006). Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering. Defect and Diffusion Forum, 258-260, 276-281.
    • NLM

      Pizani PS, Jasinevicius RG, Zanatta RA. Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering. Defect and Diffusion Forum. 2006 ; 258-260 276-281.[citado 2024 ago. 10 ]
    • Vancouver

      Pizani PS, Jasinevicius RG, Zanatta RA. Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering. Defect and Diffusion Forum. 2006 ; 258-260 276-281.[citado 2024 ago. 10 ]
  • Source: Journal of Physics: Condensed Matter. Unidade: IFSC

    Subjects: ÓPTICA, SILICONE, FILMES FINOS, FÍSICA DA MATÉRIA CONDENSADA

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      OLIVEIRA, V. I. e FREIRE JUNIOR, Fernando Lázaro e ZANATTA, Antonio Ricardo. Optical properties of Er and Er + Yb doped hydrogenated amorphous silicon films. Journal of Physics: Condensed Matter, v. 18, n. 32, p. 7709-7716, 2006Tradução . . Disponível em: https://doi.org/10.1088/0953-8984/18/32/018. Acesso em: 10 ago. 2024.
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      Oliveira, V. I., Freire Junior, F. L., & Zanatta, A. R. (2006). Optical properties of Er and Er + Yb doped hydrogenated amorphous silicon films. Journal of Physics: Condensed Matter, 18( 32), 7709-7716. doi:10.1088/0953-8984/18/32/018
    • NLM

      Oliveira VI, Freire Junior FL, Zanatta AR. Optical properties of Er and Er + Yb doped hydrogenated amorphous silicon films [Internet]. Journal of Physics: Condensed Matter. 2006 ; 18( 32): 7709-7716.[citado 2024 ago. 10 ] Available from: https://doi.org/10.1088/0953-8984/18/32/018
    • Vancouver

      Oliveira VI, Freire Junior FL, Zanatta AR. Optical properties of Er and Er + Yb doped hydrogenated amorphous silicon films [Internet]. Journal of Physics: Condensed Matter. 2006 ; 18( 32): 7709-7716.[citado 2024 ago. 10 ] Available from: https://doi.org/10.1088/0953-8984/18/32/018
  • Source: Journal of Non-Crystalline Solids. Conference titles: International Conference on Amorphous and Nanocrystalline Semicondutors - Science and Technology - ICANS. Unidade: IFSC

    Subjects: FILMES FINOS, SEMICONDUTORES, ESPECTROSCOPIA ÓPTICA, SILICONE

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      RIBEIRO, Cristina Tereza Monteiro e ZANATTA, Antonio Ricardo. Spectroscopic investigation of Nd-doped amorphous SiN films. Journal of Non-Crystalline Solids. Amsterdam: Elsevier Science BV. . Acesso em: 10 ago. 2024. , 2006
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      Ribeiro, C. T. M., & Zanatta, A. R. (2006). Spectroscopic investigation of Nd-doped amorphous SiN films. Journal of Non-Crystalline Solids. Amsterdam: Elsevier Science BV.
    • NLM

      Ribeiro CTM, Zanatta AR. Spectroscopic investigation of Nd-doped amorphous SiN films. Journal of Non-Crystalline Solids. 2006 ; 352( Ju 2006): 1286-1289.[citado 2024 ago. 10 ]
    • Vancouver

      Ribeiro CTM, Zanatta AR. Spectroscopic investigation of Nd-doped amorphous SiN films. Journal of Non-Crystalline Solids. 2006 ; 352( Ju 2006): 1286-1289.[citado 2024 ago. 10 ]
  • Source: Journal of Applied Physics. Unidade: IFSC

    Subjects: ESPECTROSCOPIA RAMAN, SEMICONDUTORES, FOTOLUMINESCÊNCIA, LUMINESCÊNCIA, SILICONE, FILMES FINOS

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      ZANATTA, Antonio Ricardo e RIBEIRO, Cristina Teresa M. e JAHN, U. Optoelectronic and structural characteristics of Er-doped amorphous AIN films. Journal of Applied Physics, v. No 2005, n. 9, p. 093514-1-093514-8, 2005Tradução . . Disponível em: https://doi.org/10.1063/1.2127120. Acesso em: 10 ago. 2024.
    • APA

      Zanatta, A. R., Ribeiro, C. T. M., & Jahn, U. (2005). Optoelectronic and structural characteristics of Er-doped amorphous AIN films. Journal of Applied Physics, No 2005( 9), 093514-1-093514-8. doi:10.1063/1.2127120
    • NLM

      Zanatta AR, Ribeiro CTM, Jahn U. Optoelectronic and structural characteristics of Er-doped amorphous AIN films [Internet]. Journal of Applied Physics. 2005 ; No 2005( 9): 093514-1-093514-8.[citado 2024 ago. 10 ] Available from: https://doi.org/10.1063/1.2127120
    • Vancouver

      Zanatta AR, Ribeiro CTM, Jahn U. Optoelectronic and structural characteristics of Er-doped amorphous AIN films [Internet]. Journal of Applied Physics. 2005 ; No 2005( 9): 093514-1-093514-8.[citado 2024 ago. 10 ] Available from: https://doi.org/10.1063/1.2127120

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