Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications (2003)
Source: Book of Abstracts. Conference titles: International Meeting on Applied Physics. Unidade: IF
Subjects: MEDICINA NUCLEAR, SEMICONDUTORES, ESPECTROSCOPIA DE RAIO X
ABNT
FREITAS, M B e MEDEIROS, Fernando Homem de Mello e YOSHIMURA, Elisabeth Mateus. Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications. 2003, Anais.. Badajoz: APHYS, 2003. . Acesso em: 07 set. 2024.APA
Freitas, M. B., Medeiros, F. H. de M., & Yoshimura, E. M. (2003). Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications. In Book of Abstracts. Badajoz: APHYS.NLM
Freitas MB, Medeiros FH de M, Yoshimura EM. Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications. Book of Abstracts. 2003 ;[citado 2024 set. 07 ]Vancouver
Freitas MB, Medeiros FH de M, Yoshimura EM. Detection properties of CdZnTe semiconductor for diagnostic X-ray spectroscopic applications. Book of Abstracts. 2003 ;[citado 2024 set. 07 ]