Fonte: Applied Physics A. Unidade: IFSC
Assuntos: FILMES FINOS, POLÍMEROS (MATERIAIS), NANOTECNOLOGIA, MICROSCOPIA, RAIOS X
ABNT
LEITE, Fábio L. et al. TEM, XRD and AFM study of poly(o-ethoxyaniline) films: new evidence for the formation of conducting islands. Applied Physics A, v. No 2008, n. 2, p. 537-542, 2008Tradução . . Disponível em: https://doi.org/10.1007/s00339-008-4686-9. Acesso em: 20 ago. 2024.APA
Leite, F. L., Alves, W. F., Mir, M., Mascarenhas, Y. P., Herrmann, P. S. P., Mattoso, L. H. C., & Oliveira Junior, O. N. de. (2008). TEM, XRD and AFM study of poly(o-ethoxyaniline) films: new evidence for the formation of conducting islands. Applied Physics A, No 2008( 2), 537-542. doi:10.1007/s00339-008-4686-9NLM
Leite FL, Alves WF, Mir M, Mascarenhas YP, Herrmann PSP, Mattoso LHC, Oliveira Junior ON de. TEM, XRD and AFM study of poly(o-ethoxyaniline) films: new evidence for the formation of conducting islands [Internet]. Applied Physics A. 2008 ; No 2008( 2): 537-542.[citado 2024 ago. 20 ] Available from: https://doi.org/10.1007/s00339-008-4686-9Vancouver
Leite FL, Alves WF, Mir M, Mascarenhas YP, Herrmann PSP, Mattoso LHC, Oliveira Junior ON de. TEM, XRD and AFM study of poly(o-ethoxyaniline) films: new evidence for the formation of conducting islands [Internet]. Applied Physics A. 2008 ; No 2008( 2): 537-542.[citado 2024 ago. 20 ] Available from: https://doi.org/10.1007/s00339-008-4686-9