Quantitative depth profile study of polyaniline films by photothermal spectroscopies

Quantitative depth profile study of polyaniline films by photothermal spectroscopies (2007)

Authors:
USP affiliated authors: BALOGH, DEBORA TEREZIA - IFSC ; FARIA, ROBERTO MENDONCA - IFSC
School: IFSC
DOI: 10.1007/s00339-006-3789-4
Subjects: ÓPTICA; ESPECTROSCOPIA; FILMES FINOS
Language: Inglês
Imprenta:
- Publisher: Springer
- Place of publication: New York
- Date published: 2007
Source:
- Título do periódico: Applied Physics A
- ISSN: 0947-8396
- Volume/Número/Paginação/Ano: v. 86, n. 3, p. 395-401, Mar. 2007

Informações sobre o DOI: 10.1007/s00339-006-3789-4 (Fonte: oaDOI API)

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ABNT

ALBUQUERQUE, J. E.; BALOGH, Débora Terezia; FARIA, Roberto Mendonça. Quantitative depth profile study of polyaniline films by photothermal spectroscopies. Applied Physics A, New York, Springer, v. 86, n. 3, p. 395-401, 2007. DOI: 10.1007/s00339-006-3789-4.
APA

Albuquerque, J. E., Balogh, D. T., & Faria, R. M. (2007). Quantitative depth profile study of polyaniline films by photothermal spectroscopies. Applied Physics A, 86( 3), 395-401. doi:10.1007/s00339-006-3789-4
NLM

Albuquerque JE, Balogh DT, Faria RM. Quantitative depth profile study of polyaniline films by photothermal spectroscopies. Applied Physics A. 2007 ; 86( 3): 395-401.
Vancouver

Albuquerque JE, Balogh DT, Faria RM. Quantitative depth profile study of polyaniline films by photothermal spectroscopies. Applied Physics A. 2007 ; 86( 3): 395-401.