Source: Surface Review and Letters. Unidade: IF
Assunto: FILMES FINOS
ABNT
CATTANI, Mauro Sérgio Dorsa et al. Influence of electron scattering from morphological granularity and surface roughness on thin film electrical resistivity. Surface Review and Letters, v. 14, n. 1, p. 87-91, 2007Tradução . . Disponível em: http://db.worldscinet.com/worldscientific/Files/20080117040740835290[000000@143.107.135.25]@page.pdf. Acesso em: 20 out. 2024.APA
Cattani, M. S. D., Vaz, A. R., Wiederkehr, R. S., Teixeira, F. de S., Salvadori, M. C. B. da S., & Brown, I. G. (2007). Influence of electron scattering from morphological granularity and surface roughness on thin film electrical resistivity. Surface Review and Letters, 14( 1), 87-91. Recuperado de http://db.worldscinet.com/worldscientific/Files/20080117040740835290[000000@143.107.135.25]@page.pdfNLM
Cattani MSD, Vaz AR, Wiederkehr RS, Teixeira F de S, Salvadori MCB da S, Brown IG. Influence of electron scattering from morphological granularity and surface roughness on thin film electrical resistivity [Internet]. Surface Review and Letters. 2007 ; 14( 1): 87-91.[citado 2024 out. 20 ] Available from: http://db.worldscinet.com/worldscientific/Files/20080117040740835290[000000@143.107.135.25]@page.pdfVancouver
Cattani MSD, Vaz AR, Wiederkehr RS, Teixeira F de S, Salvadori MCB da S, Brown IG. Influence of electron scattering from morphological granularity and surface roughness on thin film electrical resistivity [Internet]. Surface Review and Letters. 2007 ; 14( 1): 87-91.[citado 2024 out. 20 ] Available from: http://db.worldscinet.com/worldscientific/Files/20080117040740835290[000000@143.107.135.25]@page.pdf