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Artigo de periodico
The role of carbon impurities on the Si(001)-c(4X 4) surface reconstruction: Theoretical calculations (2009)
Miotto, R; Ferraz, A. C.
Source: Surface Science. Unidade: IF
Assunto: SUPERFÍCIE FÍSICA
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ABNT
MIOTTO, R e FERRAZ, A. C. The role of carbon impurities on the Si(001)-c(4X 4) surface reconstruction: Theoretical calculations. Surface Science, v. 603, n. 9, p. 1229-1235, 2009Tradução . . Disponível em: https://doi.org/10.1016/j.susc.2009.03.008. Acesso em: 09 ago. 2024.
APA
Miotto, R., & Ferraz, A. C. (2009). The role of carbon impurities on the Si(001)-c(4X 4) surface reconstruction: Theoretical calculations. Surface Science, 603( 9), 1229-1235. doi:10.1016/j.susc.2009.03.008
NLM
Miotto R, Ferraz AC. The role of carbon impurities on the Si(001)-c(4X 4) surface reconstruction: Theoretical calculations [Internet]. Surface Science. 2009 ; 603( 9): 1229-1235.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1016/j.susc.2009.03.008
Vancouver
Miotto R, Ferraz AC. The role of carbon impurities on the Si(001)-c(4X 4) surface reconstruction: Theoretical calculations [Internet]. Surface Science. 2009 ; 603( 9): 1229-1235.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1016/j.susc.2009.03.008
Artigo de periodico
Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy (2009)
Souza Neto, Narcizo M; Ramos, Aline Y; Tolentino, Helio C N; Martins, Alessandro; Santos, A. D.
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, SUPERFÍCIE FÍSICA, LUMINESCÊNCIA
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ABNT
SOUZA NETO, Narcizo M et al. Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy. Journal of Applied Crystallography, v. 42, n. 6, p. 1158-1164, 2009Tradução . . Disponível em: https://doi.org/10.1107/s0021889809042678. Acesso em: 09 ago. 2024.
APA
Souza Neto, N. M., Ramos, A. Y., Tolentino, H. C. N., Martins, A., & Santos, A. D. (2009). Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy. Journal of Applied Crystallography, 42( 6), 1158-1164. doi:10.1107/s0021889809042678
NLM
Souza Neto NM, Ramos AY, Tolentino HCN, Martins A, Santos AD. Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy [Internet]. Journal of Applied Crystallography. 2009 ; 42( 6): 1158-1164.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1107/s0021889809042678
Vancouver
Souza Neto NM, Ramos AY, Tolentino HCN, Martins A, Santos AD. Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy [Internet]. Journal of Applied Crystallography. 2009 ; 42( 6): 1158-1164.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1107/s0021889809042678
Artigo de periodico
Comparative study of the adsorption and dissociation of vinylacetic acid and acrylic acid on silicon (001) (2008)
Favero, P P; Ferraz, A. C.; Miotto, R
Source: Physical Review B. Unidade: IF
Assunto: SUPERFÍCIE FÍSICA
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ABNT
FAVERO, P P e FERRAZ, A. C. e MIOTTO, R. Comparative study of the adsorption and dissociation of vinylacetic acid and acrylic acid on silicon (001). Physical Review B, v. 77, n. 8, p. 085304/1-085304/7, 2008Tradução . . Disponível em: https://doi.org/10.1103/physrevb.77.085304. Acesso em: 09 ago. 2024.
APA
Favero, P. P., Ferraz, A. C., & Miotto, R. (2008). Comparative study of the adsorption and dissociation of vinylacetic acid and acrylic acid on silicon (001). Physical Review B, 77( 8), 085304/1-085304/7. doi:10.1103/physrevb.77.085304
NLM
Favero PP, Ferraz AC, Miotto R. Comparative study of the adsorption and dissociation of vinylacetic acid and acrylic acid on silicon (001) [Internet]. Physical Review B. 2008 ; 77( 8): 085304/1-085304/7.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1103/physrevb.77.085304
Vancouver
Favero PP, Ferraz AC, Miotto R. Comparative study of the adsorption and dissociation of vinylacetic acid and acrylic acid on silicon (001) [Internet]. Physical Review B. 2008 ; 77( 8): 085304/1-085304/7.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1103/physrevb.77.085304
Artigo de periodico
Novel method for measuring nanofriction by atomic force microscope (2008)
Salvadori, Maria Cecília Barbosa da Silveira; Lisboa, F S; Fernandes, Fernando Massa; Brown, I G
Source: Journal of Vacuum Science and Technology B. Unidade: IF
Subjects: SUPERFÍCIE FÍSICA, FILMES FINOS
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ABNT
SALVADORI, Maria Cecília Barbosa da Silveira et al. Novel method for measuring nanofriction by atomic force microscope. Journal of Vacuum Science and Technology B, v. 26, n. 2, p. 643-650, 2008Tradução . . Disponível em: https://doi.org/10.1116/1.2890694. Acesso em: 09 ago. 2024.
APA
Salvadori, M. C. B. da S., Lisboa, F. S., Fernandes, F. M., & Brown, I. G. (2008). Novel method for measuring nanofriction by atomic force microscope. Journal of Vacuum Science and Technology B, 26( 2), 643-650. doi:10.1116/1.2890694
NLM
Salvadori MCB da S, Lisboa FS, Fernandes FM, Brown IG. Novel method for measuring nanofriction by atomic force microscope [Internet]. Journal of Vacuum Science and Technology B. 2008 ; 26( 2): 643-650.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1116/1.2890694
Vancouver
Salvadori MCB da S, Lisboa FS, Fernandes FM, Brown IG. Novel method for measuring nanofriction by atomic force microscope [Internet]. Journal of Vacuum Science and Technology B. 2008 ; 26( 2): 643-650.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1116/1.2890694
Artigo de periodico
Competitive chemisorption of bifunctional carboxylic acids on H:Si(100): a first-principles study (2008)
Cucinotta, Clotilde S; Ruini, Alice; Molinari, Elisa; Pignedoli, Carlo A; Catellani, Alessandra; Caldas, Marília Junqueira
Source: Journal of Physical Chemistry C. Unidade: IF
Subjects: ESTRUTURA ELETRÔNICA, SUPERFÍCIE FÍSICA
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ABNT
CUCINOTTA, Clotilde S et al. Competitive chemisorption of bifunctional carboxylic acids on H:Si(100): a first-principles study. Journal of Physical Chemistry C, v. 112, n. 27, p. 10167-10175, 2008Tradução . . Disponível em: http://pubs.acs.org/doi/pdf/10.1021/jp711303j. Acesso em: 09 ago. 2024.
APA
Cucinotta, C. S., Ruini, A., Molinari, E., Pignedoli, C. A., Catellani, A., & Caldas, M. J. (2008). Competitive chemisorption of bifunctional carboxylic acids on H:Si(100): a first-principles study. Journal of Physical Chemistry C, 112( 27), 10167-10175. Recuperado de http://pubs.acs.org/doi/pdf/10.1021/jp711303j
NLM
Cucinotta CS, Ruini A, Molinari E, Pignedoli CA, Catellani A, Caldas MJ. Competitive chemisorption of bifunctional carboxylic acids on H:Si(100): a first-principles study [Internet]. Journal of Physical Chemistry C. 2008 ; 112( 27): 10167-10175.[citado 2024 ago. 09 ] Available from: http://pubs.acs.org/doi/pdf/10.1021/jp711303j
Vancouver
Cucinotta CS, Ruini A, Molinari E, Pignedoli CA, Catellani A, Caldas MJ. Competitive chemisorption of bifunctional carboxylic acids on H:Si(100): a first-principles study [Internet]. Journal of Physical Chemistry C. 2008 ; 112( 27): 10167-10175.[citado 2024 ago. 09 ] Available from: http://pubs.acs.org/doi/pdf/10.1021/jp711303j
Artigo de periodico
Electrical resistivity of very thin metallic films with isotropic and anisotropic surfaces (2007)
Cattani, Mauro Sérgio Dorsa ; Salvadori, Maria Cecília Barbosa da Silveira; Teixeira, Fernanda Sá; Wiederkehr, R S; Brown, I G
Source: Surface Review and Letters. Unidade: IF
Subjects: SUPERFÍCIE FÍSICA, FILMES FINOS
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ABNT
CATTANI, Mauro Sérgio Dorsa et al. Electrical resistivity of very thin metallic films with isotropic and anisotropic surfaces. Surface Review and Letters, v. 14, n. 3, p. 345-356, 2007Tradução . . Disponível em: http://db.worldscinet.com/worldscientific/Files/20080130013118099303[CAPES152@143.107.135.25]@page.pdf. Acesso em: 09 ago. 2024.
APA
Cattani, M. S. D., Salvadori, M. C. B. da S., Teixeira, F. S., Wiederkehr, R. S., & Brown, I. G. (2007). Electrical resistivity of very thin metallic films with isotropic and anisotropic surfaces. Surface Review and Letters, 14( 3), 345-356. Recuperado de http://db.worldscinet.com/worldscientific/Files/20080130013118099303[CAPES152@143.107.135.25]@page.pdf
NLM
Cattani MSD, Salvadori MCB da S, Teixeira FS, Wiederkehr RS, Brown IG. Electrical resistivity of very thin metallic films with isotropic and anisotropic surfaces [Internet]. Surface Review and Letters. 2007 ; 14( 3): 345-356.[citado 2024 ago. 09 ] Available from: http://db.worldscinet.com/worldscientific/Files/20080130013118099303[CAPES152@143.107.135.25]@page.pdf
Vancouver
Cattani MSD, Salvadori MCB da S, Teixeira FS, Wiederkehr RS, Brown IG. Electrical resistivity of very thin metallic films with isotropic and anisotropic surfaces [Internet]. Surface Review and Letters. 2007 ; 14( 3): 345-356.[citado 2024 ago. 09 ] Available from: http://db.worldscinet.com/worldscientific/Files/20080130013118099303[CAPES152@143.107.135.25]@page.pdf
Artigo de periodico
Synchrotron x-ray renninger scanning for studying strain in InAs/GaAs quantum dot system (2007)
Freitas, Raul de Oliveira; Lamas, T. E.; Quivy, A. A.; Morelhão, Sérgio Luiz
Source: Physica Status Solidi A - Application and Materials Science. Unidade: IF
Assunto: SUPERFÍCIE FÍSICA
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ABNT
FREITAS, Raul de Oliveira et al. Synchrotron x-ray renninger scanning for studying strain in InAs/GaAs quantum dot system. Physica Status Solidi A - Application and Materials Science, v. 204, n. 8, p. 2548-2454, 2007Tradução . . Disponível em: https://doi.org/10.1002/pssa.200675673. Acesso em: 09 ago. 2024.
APA
Freitas, R. de O., Lamas, T. E., Quivy, A. A., & Morelhão, S. L. (2007). Synchrotron x-ray renninger scanning for studying strain in InAs/GaAs quantum dot system. Physica Status Solidi A - Application and Materials Science, 204( 8), 2548-2454. doi:10.1002/pssa.200675673
NLM
Freitas R de O, Lamas TE, Quivy AA, Morelhão SL. Synchrotron x-ray renninger scanning for studying strain in InAs/GaAs quantum dot system [Internet]. Physica Status Solidi A - Application and Materials Science. 2007 ; 204( 8): 2548-2454.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1002/pssa.200675673
Vancouver
Freitas R de O, Lamas TE, Quivy AA, Morelhão SL. Synchrotron x-ray renninger scanning for studying strain in InAs/GaAs quantum dot system [Internet]. Physica Status Solidi A - Application and Materials Science. 2007 ; 204( 8): 2548-2454.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1002/pssa.200675673
Artigo de periodico
Trimming Si surfaces for molecular electronics (2007)
Caldas, Marília Junqueira; Calzolari, A; Cucinotta, C S
Source: Journal of Applied Physics. Unidade: IF
Subjects: SEMICONDUTORES, SUPERFÍCIE FÍSICA
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ABNT
CALDAS, Marília Junqueira e CALZOLARI, A e CUCINOTTA, C S. Trimming Si surfaces for molecular electronics. Journal of Applied Physics, v. 101, n. 8, p. 081719/1-081719/5, 2007Tradução . . Disponível em: https://doi.org/10.1063/1.2723176. Acesso em: 09 ago. 2024.
APA
Caldas, M. J., Calzolari, A., & Cucinotta, C. S. (2007). Trimming Si surfaces for molecular electronics. Journal of Applied Physics, 101( 8), 081719/1-081719/5. doi:10.1063/1.2723176
NLM
Caldas MJ, Calzolari A, Cucinotta CS. Trimming Si surfaces for molecular electronics [Internet]. Journal of Applied Physics. 2007 ; 101( 8): 081719/1-081719/5.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1063/1.2723176
Vancouver
Caldas MJ, Calzolari A, Cucinotta CS. Trimming Si surfaces for molecular electronics [Internet]. Journal of Applied Physics. 2007 ; 101( 8): 081719/1-081719/5.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1063/1.2723176
Artigo de periodico
A comparative study of ethylene oxide and diethylene dioxide adsorption on silicon (001) (2007)
Ferraz, A. C.; Miotto, R
Source: Surface Science. Unidade: IF
Assunto: SUPERFÍCIE FÍSICA
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ABNT
FERRAZ, A. C. e MIOTTO, R. A comparative study of ethylene oxide and diethylene dioxide adsorption on silicon (001). Surface Science, v. 601, n. 13, p. 2576-2579, 2007Tradução . . Disponível em: https://doi.org/10.1016/j.susc.2006.11.081. Acesso em: 09 ago. 2024.
APA
Ferraz, A. C., & Miotto, R. (2007). A comparative study of ethylene oxide and diethylene dioxide adsorption on silicon (001). Surface Science, 601( 13), 2576-2579. doi:10.1016/j.susc.2006.11.081
NLM
Ferraz AC, Miotto R. A comparative study of ethylene oxide and diethylene dioxide adsorption on silicon (001) [Internet]. Surface Science. 2007 ; 601( 13): 2576-2579.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1016/j.susc.2006.11.081
Vancouver
Ferraz AC, Miotto R. A comparative study of ethylene oxide and diethylene dioxide adsorption on silicon (001) [Internet]. Surface Science. 2007 ; 601( 13): 2576-2579.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1016/j.susc.2006.11.081
Artigo de periodico
Anomalous vibrational properties induced by surface effects in capped Pt nanoparticles (2007)
Giovanetti, Lisandro J; Ramallo-Lopez, Jose M; Requejo, Félix G; Garcia-Gutierrez, Domingo I; Jose-Yacaman, Miguel; Craievich, Aldo Felix
Source: Journal of Physical Chemistry C. Unidade: IF
Subjects: ESPECTROSCOPIA, SUPERFÍCIE FÍSICA
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ABNT
GIOVANETTI, Lisandro J et al. Anomalous vibrational properties induced by surface effects in capped Pt nanoparticles. Journal of Physical Chemistry C, v. 111, n. 21, p. 7599-7604, 2007Tradução . . Disponível em: http://pubs.acs.org/cgi-bin/article.cgi/jpccck/2007/111/i21/pdf/jp068419k.p. Acesso em: 09 ago. 2024.
APA
Giovanetti, L. J., Ramallo-Lopez, J. M., Requejo, F. G., Garcia-Gutierrez, D. I., Jose-Yacaman, M., & Craievich, A. F. (2007). Anomalous vibrational properties induced by surface effects in capped Pt nanoparticles. Journal of Physical Chemistry C, 111( 21), 7599-7604. Recuperado de http://pubs.acs.org/cgi-bin/article.cgi/jpccck/2007/111/i21/pdf/jp068419k.p
NLM
Giovanetti LJ, Ramallo-Lopez JM, Requejo FG, Garcia-Gutierrez DI, Jose-Yacaman M, Craievich AF. Anomalous vibrational properties induced by surface effects in capped Pt nanoparticles [Internet]. Journal of Physical Chemistry C. 2007 ; 111( 21): 7599-7604.[citado 2024 ago. 09 ] Available from: http://pubs.acs.org/cgi-bin/article.cgi/jpccck/2007/111/i21/pdf/jp068419k.p
Vancouver
Giovanetti LJ, Ramallo-Lopez JM, Requejo FG, Garcia-Gutierrez DI, Jose-Yacaman M, Craievich AF. Anomalous vibrational properties induced by surface effects in capped Pt nanoparticles [Internet]. Journal of Physical Chemistry C. 2007 ; 111( 21): 7599-7604.[citado 2024 ago. 09 ] Available from: http://pubs.acs.org/cgi-bin/article.cgi/jpccck/2007/111/i21/pdf/jp068419k.p
Artigo de periodico
Chaotic bubbling and nonstagnant foams (2007)
Tufaile, Alberto; Sartorelli, J. C.; Jeandet, Philippe; Liger-Belair, Gerard
Source: Physical Review E. Unidades: EACH, IF
Subjects: CAOS (SISTEMAS DINÂMICOS), SUPERFÍCIE FÍSICA
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ABNT
TUFAILE, Alberto et al. Chaotic bubbling and nonstagnant foams. Physical Review E, v. 75, n. 6, p. 066216/1-066216/5, 2007Tradução . . Disponível em: https://doi.org/10.1103/physreve.75.066216. Acesso em: 09 ago. 2024.
APA
Tufaile, A., Sartorelli, J. C., Jeandet, P., & Liger-Belair, G. (2007). Chaotic bubbling and nonstagnant foams. Physical Review E, 75( 6), 066216/1-066216/5. doi:10.1103/physreve.75.066216
NLM
Tufaile A, Sartorelli JC, Jeandet P, Liger-Belair G. Chaotic bubbling and nonstagnant foams [Internet]. Physical Review E. 2007 ; 75( 6): 066216/1-066216/5.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1103/physreve.75.066216
Vancouver
Tufaile A, Sartorelli JC, Jeandet P, Liger-Belair G. Chaotic bubbling and nonstagnant foams [Internet]. Physical Review E. 2007 ; 75( 6): 066216/1-066216/5.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1103/physreve.75.066216
Artigo de periodico
Electric contribution to the surface tension of a dielectric liquid containing ions (2007)
Barbero, Giovanni; Figueiredo Neto, Antônio Martins; Digabel, J
Source: Physics Letters A. Unidade: IF
Subjects: SUPERFÍCIE FÍSICA, CRISTAIS LÍQUIDOS
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ABNT
BARBERO, Giovanni e FIGUEIREDO NETO, Antônio Martins e DIGABEL, J. Electric contribution to the surface tension of a dielectric liquid containing ions. Physics Letters A, v. 361, n. 1-2, p. 146-151, 2007Tradução . . Disponível em: https://doi.org/10.1016/j.physleta.2006.09.018. Acesso em: 09 ago. 2024.
APA
Barbero, G., Figueiredo Neto, A. M., & Digabel, J. (2007). Electric contribution to the surface tension of a dielectric liquid containing ions. Physics Letters A, 361( 1-2), 146-151. doi:10.1016/j.physleta.2006.09.018
NLM
Barbero G, Figueiredo Neto AM, Digabel J. Electric contribution to the surface tension of a dielectric liquid containing ions [Internet]. Physics Letters A. 2007 ; 361( 1-2): 146-151.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1016/j.physleta.2006.09.018
Vancouver
Barbero G, Figueiredo Neto AM, Digabel J. Electric contribution to the surface tension of a dielectric liquid containing ions [Internet]. Physics Letters A. 2007 ; 361( 1-2): 146-151.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1016/j.physleta.2006.09.018
Artigo de periodico
Optical characterization of urethane/urea elastomers undoped and doped with magnetic nanoparticles subjected to a uniaxial strain (2007)
Sena, C; Godinho, M H; Figueiredo Neto, Antônio Martins
Source: Journal of Applied Physics. Unidade: IF
Subjects: SUPERFÍCIE FÍSICA, NANOPARTÍCULAS
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ABNT
SENA, C e GODINHO, M H e FIGUEIREDO NETO, Antônio Martins. Optical characterization of urethane/urea elastomers undoped and doped with magnetic nanoparticles subjected to a uniaxial strain. Journal of Applied Physics, v. 102, n. 7, p. 073524/1-073524/6, 2007Tradução . . Disponível em: https://doi.org/10.1063/1.2786921. Acesso em: 09 ago. 2024.
APA
Sena, C., Godinho, M. H., & Figueiredo Neto, A. M. (2007). Optical characterization of urethane/urea elastomers undoped and doped with magnetic nanoparticles subjected to a uniaxial strain. Journal of Applied Physics, 102( 7), 073524/1-073524/6. doi:10.1063/1.2786921
NLM
Sena C, Godinho MH, Figueiredo Neto AM. Optical characterization of urethane/urea elastomers undoped and doped with magnetic nanoparticles subjected to a uniaxial strain [Internet]. Journal of Applied Physics. 2007 ; 102( 7): 073524/1-073524/6.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1063/1.2786921
Vancouver
Sena C, Godinho MH, Figueiredo Neto AM. Optical characterization of urethane/urea elastomers undoped and doped with magnetic nanoparticles subjected to a uniaxial strain [Internet]. Journal of Applied Physics. 2007 ; 102( 7): 073524/1-073524/6.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1063/1.2786921
Artigo de periodico
Surface nanopatterning through styrene adsorption on Si(100) (2006)
Calzolari, A; Ruini, A; Molinari, E; Caldas, Marília Junqueira
Source: Physical Review B. Unidade: IF
Subjects: MATÉRIA CONDENSADA, SUPERFÍCIE FÍSICA, SEMICONDUTORES, NANOTECNOLOGIA
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ABNT
CALZOLARI, A et al. Surface nanopatterning through styrene adsorption on Si(100). Physical Review B, v. 73, n. 12, p. 125420/1-125420/7, 2006Tradução . . Disponível em: https://doi.org/10.1103/physrevb.73.125420. Acesso em: 09 ago. 2024.
APA
Calzolari, A., Ruini, A., Molinari, E., & Caldas, M. J. (2006). Surface nanopatterning through styrene adsorption on Si(100). Physical Review B, 73( 12), 125420/1-125420/7. doi:10.1103/physrevb.73.125420
NLM
Calzolari A, Ruini A, Molinari E, Caldas MJ. Surface nanopatterning through styrene adsorption on Si(100) [Internet]. Physical Review B. 2006 ;73( 12): 125420/1-125420/7.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1103/physrevb.73.125420
Vancouver
Calzolari A, Ruini A, Molinari E, Caldas MJ. Surface nanopatterning through styrene adsorption on Si(100) [Internet]. Physical Review B. 2006 ;73( 12): 125420/1-125420/7.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1103/physrevb.73.125420
Artigo de periodico
Thionin adsorption on silicon (100): structural analysis (2006)
Miotto, R; Cunha, J F R; Silva, S W da; Soler, Maria Aparecida Godoy ; Morais, P C; Ferraz, A. C.; Tada, Dayane B; Petri, Denise Freitas Siqueira ; Baptista, Maurício da Silva
Source: Applied Surface Science. Unidades: IF, IQ
Subjects: SUPERFÍCIE FÍSICA, ESPECTROSCOPIA RAMAN
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ABNT
MIOTTO, R et al. Thionin adsorption on silicon (100): structural analysis. Applied Surface Science, v. 253, n. 4, p. 1978-1982, 2006Tradução . . Disponível em: http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6THY-4JVSV81-8-21&_cdi=5295&_user=972067&_orig=browse&_coverDate=12%2F15%2F2006&_sk=997469995&view=c&wchp=dGLbVlb-zSkzV&md5=acc94b55ddd7242377aad57aa86d3b8d&ie=/sdarticle.pdf. Acesso em: 09 ago. 2024.
APA
Miotto, R., Cunha, J. F. R., Silva, S. W. da, Soler, M. A. G., Morais, P. C., Ferraz, A. C., et al. (2006). Thionin adsorption on silicon (100): structural analysis. Applied Surface Science, 253( 4), 1978-1982. Recuperado de http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6THY-4JVSV81-8-21&_cdi=5295&_user=972067&_orig=browse&_coverDate=12%2F15%2F2006&_sk=997469995&view=c&wchp=dGLbVlb-zSkzV&md5=acc94b55ddd7242377aad57aa86d3b8d&ie=/sdarticle.pdf
NLM
Miotto R, Cunha JFR, Silva SW da, Soler MAG, Morais PC, Ferraz AC, Tada DB, Petri DFS, Baptista M da S. Thionin adsorption on silicon (100): structural analysis [Internet]. Applied Surface Science. 2006 ; 253( 4): 1978-1982.[citado 2024 ago. 09 ] Available from: http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6THY-4JVSV81-8-21&_cdi=5295&_user=972067&_orig=browse&_coverDate=12%2F15%2F2006&_sk=997469995&view=c&wchp=dGLbVlb-zSkzV&md5=acc94b55ddd7242377aad57aa86d3b8d&ie=/sdarticle.pdf
Vancouver
Miotto R, Cunha JFR, Silva SW da, Soler MAG, Morais PC, Ferraz AC, Tada DB, Petri DFS, Baptista M da S. Thionin adsorption on silicon (100): structural analysis [Internet]. Applied Surface Science. 2006 ; 253( 4): 1978-1982.[citado 2024 ago. 09 ] Available from: http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6THY-4JVSV81-8-21&_cdi=5295&_user=972067&_orig=browse&_coverDate=12%2F15%2F2006&_sk=997469995&view=c&wchp=dGLbVlb-zSkzV&md5=acc94b55ddd7242377aad57aa86d3b8d&ie=/sdarticle.pdf
Artigo de periodico
Electronic and structural properties of "C IND.59" Si on the monohydride Si(100) surface (2005)
Zanella, Ivana; Fazzio, Adalberto; Silva, Antonio Jose Roque da
Source: International Journal of Quantum Chemistry. Unidade: IF
Subjects: FÍSICO-QUÍMICA, SUPERFÍCIE FÍSICA, ESTRUTURA ELETRÔNICA, PROPRIEDADES DOS MATERIAIS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
ZANELLA, Ivana e FAZZIO, Adalberto e SILVA, Antonio Jose Roque da. Electronic and structural properties of "C IND.59" Si on the monohydride Si(100) surface. International Journal of Quantum Chemistry, v. 103, n. 5, p. 557-561, 2005Tradução . . Disponível em: https://doi.org/10.1002/qua.20528. Acesso em: 09 ago. 2024.
APA
Zanella, I., Fazzio, A., & Silva, A. J. R. da. (2005). Electronic and structural properties of "C IND.59" Si on the monohydride Si(100) surface. International Journal of Quantum Chemistry, 103( 5), 557-561. doi:10.1002/qua.20528
NLM
Zanella I, Fazzio A, Silva AJR da. Electronic and structural properties of "C IND.59" Si on the monohydride Si(100) surface [Internet]. International Journal of Quantum Chemistry. 2005 ; 103( 5): 557-561.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1002/qua.20528
Vancouver
Zanella I, Fazzio A, Silva AJR da. Electronic and structural properties of "C IND.59" Si on the monohydride Si(100) surface [Internet]. International Journal of Quantum Chemistry. 2005 ; 103( 5): 557-561.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1002/qua.20528
Artigo de periodico
Structure, morphology and composition of thin Pd and Ni films deposited by dc magnetron sputtering on polycrystalline Ni and Pd foils (2005)
Pinheiro, L M P; Maluf, S S; Gobbi, A L; Paulin Filho, P I; Fantini, Márcia Carvalho de Abreu ; Nascente, P A P
Source: Journal of Physics D - Applied Physics. Unidade: IF
Subjects: SUPERFÍCIE FÍSICA, CRISTALOGRAFIA FÍSICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
PINHEIRO, L M P et al. Structure, morphology and composition of thin Pd and Ni films deposited by dc magnetron sputtering on polycrystalline Ni and Pd foils. Journal of Physics D - Applied Physics, v. 38, n. 23, p. 4241-4244, 2005Tradução . . Disponível em: https://doi.org/10.1088/0022-3727/38/23/016. Acesso em: 09 ago. 2024.
APA
Pinheiro, L. M. P., Maluf, S. S., Gobbi, A. L., Paulin Filho, P. I., Fantini, M. C. de A., & Nascente, P. A. P. (2005). Structure, morphology and composition of thin Pd and Ni films deposited by dc magnetron sputtering on polycrystalline Ni and Pd foils. Journal of Physics D - Applied Physics, 38( 23), 4241-4244. doi:10.1088/0022-3727/38/23/016
NLM
Pinheiro LMP, Maluf SS, Gobbi AL, Paulin Filho PI, Fantini MC de A, Nascente PAP. Structure, morphology and composition of thin Pd and Ni films deposited by dc magnetron sputtering on polycrystalline Ni and Pd foils [Internet]. Journal of Physics D - Applied Physics. 2005 ; 38( 23): 4241-4244.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1088/0022-3727/38/23/016
Vancouver
Pinheiro LMP, Maluf SS, Gobbi AL, Paulin Filho PI, Fantini MC de A, Nascente PAP. Structure, morphology and composition of thin Pd and Ni films deposited by dc magnetron sputtering on polycrystalline Ni and Pd foils [Internet]. Journal of Physics D - Applied Physics. 2005 ; 38( 23): 4241-4244.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1088/0022-3727/38/23/016
Artigo de periodico
The quantum mobility of a two-dimensional electron gas in selectively doped GaAs/InGaAs quantum wells with embedded quantum dots (2005)
Silva, E C F; Quivy, A. A.
Source: Journal of applied physics. Unidade: IF
Subjects: SUPERFÍCIE FÍSICA, ESPECTROSCOPIA POR ABSORÇÃO ELETRÔNICA, ESTRUTURA ELETRÔNICA, DISPOSITIVOS ELETRÔNICOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SILVA, E C F e QUIVY, A. A. The quantum mobility of a two-dimensional electron gas in selectively doped GaAs/InGaAs quantum wells with embedded quantum dots. Journal of applied physics, v. 97, n. 11, p. 113709/1-113709/6, 2005Tradução . . Disponível em: https://doi.org/10.1063/1.1925329. Acesso em: 09 ago. 2024.
APA
Silva, E. C. F., & Quivy, A. A. (2005). The quantum mobility of a two-dimensional electron gas in selectively doped GaAs/InGaAs quantum wells with embedded quantum dots. Journal of applied physics, 97( 11), 113709/1-113709/6. doi:10.1063/1.1925329
NLM
Silva ECF, Quivy AA. The quantum mobility of a two-dimensional electron gas in selectively doped GaAs/InGaAs quantum wells with embedded quantum dots [Internet]. Journal of applied physics. 2005 ; 97( 11): 113709/1-113709/6.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1063/1.1925329
Vancouver
Silva ECF, Quivy AA. The quantum mobility of a two-dimensional electron gas in selectively doped GaAs/InGaAs quantum wells with embedded quantum dots [Internet]. Journal of applied physics. 2005 ; 97( 11): 113709/1-113709/6.[citado 2024 ago. 09 ] Available from: https://doi.org/10.1063/1.1925329
Artigo de periodico
The relative stability of the two isomers of "AlP IND.3" (2005)
Malaspina, Thaciana; Coutinho, Kaline Rabelo; Canuto, Sylvio
Source: Chemical Physics Letters. Unidade: IF
Subjects: FÍSICO-QUÍMICA, ESTRUTURA ELETRÔNICA, SUPERFÍCIE FÍSICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MALASPINA, Thaciana e COUTINHO, Kaline Rabelo e CANUTO, Sylvio. The relative stability of the two isomers of "AlP IND.3". Chemical Physics Letters, v. 411, n. 1-3, p. 14-17, 2005Tradução . . Disponível em: http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TFN-4GFV5TK-8-7&_cdi=5231&_user=972067&_orig=browse&_coverDate=08%2F05%2F2005&_sk=995889998&view=c&wchp=dGLzVlz-zSkzS&md5=98443bb3a8afabc44dfe61423f5b4034&ie=/sdarticle.pdf. Acesso em: 09 ago. 2024.
APA
Malaspina, T., Coutinho, K. R., & Canuto, S. (2005). The relative stability of the two isomers of "AlP IND.3". Chemical Physics Letters, 411( 1-3), 14-17. Recuperado de http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TFN-4GFV5TK-8-7&_cdi=5231&_user=972067&_orig=browse&_coverDate=08%2F05%2F2005&_sk=995889998&view=c&wchp=dGLzVlz-zSkzS&md5=98443bb3a8afabc44dfe61423f5b4034&ie=/sdarticle.pdf
NLM
Malaspina T, Coutinho KR, Canuto S. The relative stability of the two isomers of "AlP IND.3" [Internet]. Chemical Physics Letters. 2005 ; 411( 1-3): 14-17.[citado 2024 ago. 09 ] Available from: http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TFN-4GFV5TK-8-7&_cdi=5231&_user=972067&_orig=browse&_coverDate=08%2F05%2F2005&_sk=995889998&view=c&wchp=dGLzVlz-zSkzS&md5=98443bb3a8afabc44dfe61423f5b4034&ie=/sdarticle.pdf
Vancouver
Malaspina T, Coutinho KR, Canuto S. The relative stability of the two isomers of "AlP IND.3" [Internet]. Chemical Physics Letters. 2005 ; 411( 1-3): 14-17.[citado 2024 ago. 09 ] Available from: http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TFN-4GFV5TK-8-7&_cdi=5231&_user=972067&_orig=browse&_coverDate=08%2F05%2F2005&_sk=995889998&view=c&wchp=dGLzVlz-zSkzS&md5=98443bb3a8afabc44dfe61423f5b4034&ie=/sdarticle.pdf
Artigo de periodico
Monte Carlo simulations applied to "Al IND.X" "Ga IND.Y" "In IND.1-X-Y" X quaternary alloys (X=As, P, N): a comparative study (2005)
Marques, M; Ferreira, L G; Teles, L. K.; Scolfaro, Luisa Maria Ribeiro
Source: Physical Review B. Unidade: IF
Subjects: MATÉRIA CONDENSADA, ESTRUTURA ELETRÔNICA, MÉTODO DE MONTE CARLO, MUDANÇA DE FASE, SUPERFÍCIE FÍSICA, SEMICONDUTORES
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MARQUES, M et al. Monte Carlo simulations applied to "Al IND.X" "Ga IND.Y" "In IND.1-X-Y" X quaternary alloys (X=As, P, N): a comparative study. Physical Review B, v. 71, n. 20, p. 205204/1-205204/11, 2005Tradução . . Disponível em: http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=PRBMDO000071000020205204000001&idtype=cvips&prog=normal. Acesso em: 09 ago. 2024.
APA
Marques, M., Ferreira, L. G., Teles, L. K., & Scolfaro, L. M. R. (2005). Monte Carlo simulations applied to "Al IND.X" "Ga IND.Y" "In IND.1-X-Y" X quaternary alloys (X=As, P, N): a comparative study. Physical Review B, 71( 20), 205204/1-205204/11. Recuperado de http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=PRBMDO000071000020205204000001&idtype=cvips&prog=normal
NLM
Marques M, Ferreira LG, Teles LK, Scolfaro LMR. Monte Carlo simulations applied to "Al IND.X" "Ga IND.Y" "In IND.1-X-Y" X quaternary alloys (X=As, P, N): a comparative study [Internet]. Physical Review B. 2005 ; 71( 20): 205204/1-205204/11.[citado 2024 ago. 09 ] Available from: http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=PRBMDO000071000020205204000001&idtype=cvips&prog=normal
Vancouver
Marques M, Ferreira LG, Teles LK, Scolfaro LMR. Monte Carlo simulations applied to "Al IND.X" "Ga IND.Y" "In IND.1-X-Y" X quaternary alloys (X=As, P, N): a comparative study [Internet]. Physical Review B. 2005 ; 71( 20): 205204/1-205204/11.[citado 2024 ago. 09 ] Available from: http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=PRBMDO000071000020205204000001&idtype=cvips&prog=normal

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