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Artigo de periodico
Influence of substrate surface topography in the deposition of nanostructured diamond-like carbon films by high density plasma chemical vapor deposition (2009)
Mousinho, Ana Paulo; Mansano, Ronaldo Domingues ; Salvadori, Maria Cecília Barbosa da Silveira
Source: Surface & Coatings Technology. Unidades: EP, IF
Subjects: NANOTECNOLOGIA, FILMES FINOS
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ABNT
MOUSINHO, Ana Paulo e MANSANO, Ronaldo Domingues e SALVADORI, Maria Cecília Barbosa da Silveira. Influence of substrate surface topography in the deposition of nanostructured diamond-like carbon films by high density plasma chemical vapor deposition. Surface & Coatings Technology, v. 203, n. 9, p. 1193-1198, 2009Tradução . . Disponível em: https://doi.org/10.1016/j.surfcoat.2008.10.025. Acesso em: 01 nov. 2024.
APA
Mousinho, A. P., Mansano, R. D., & Salvadori, M. C. B. da S. (2009). Influence of substrate surface topography in the deposition of nanostructured diamond-like carbon films by high density plasma chemical vapor deposition. Surface & Coatings Technology, 203( 9), 1193-1198. doi:10.1016/j.surfcoat.2008.10.025
NLM
Mousinho AP, Mansano RD, Salvadori MCB da S. Influence of substrate surface topography in the deposition of nanostructured diamond-like carbon films by high density plasma chemical vapor deposition [Internet]. Surface & Coatings Technology. 2009 ; 203( 9): 1193-1198.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/j.surfcoat.2008.10.025
Vancouver
Mousinho AP, Mansano RD, Salvadori MCB da S. Influence of substrate surface topography in the deposition of nanostructured diamond-like carbon films by high density plasma chemical vapor deposition [Internet]. Surface & Coatings Technology. 2009 ; 203( 9): 1193-1198.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/j.surfcoat.2008.10.025
Artigo de periodico
The gas flow rate increase obtained by an oscillating piezoelectric actuator on a micronozzle (2008)
Wiederkehr, Rodrigo Sérgio; Salvadori, Maria Cecília Barbosa da Silveira; Brugger, J; Degasperi, Francisco Tadeu; Cattani, Mauro Sérgio Dorsa
Source: Sensors and Actuators A-Physical. Unidade: IF
Assunto: FILMES FINOS
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ABNT
WIEDERKEHR, Rodrigo Sérgio et al. The gas flow rate increase obtained by an oscillating piezoelectric actuator on a micronozzle. Sensors and Actuators A-Physical, v. 144, n. 1, p. 154-160, 2008Tradução . . Disponível em: https://doi.org/10.1016/j.sna.2007.12.024. Acesso em: 01 nov. 2024.
APA
Wiederkehr, R. S., Salvadori, M. C. B. da S., Brugger, J., Degasperi, F. T., & Cattani, M. S. D. (2008). The gas flow rate increase obtained by an oscillating piezoelectric actuator on a micronozzle. Sensors and Actuators A-Physical, 144( 1), 154-160. doi:10.1016/j.sna.2007.12.024
NLM
Wiederkehr RS, Salvadori MCB da S, Brugger J, Degasperi FT, Cattani MSD. The gas flow rate increase obtained by an oscillating piezoelectric actuator on a micronozzle [Internet]. Sensors and Actuators A-Physical. 2008 ; 144( 1): 154-160.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/j.sna.2007.12.024
Vancouver
Wiederkehr RS, Salvadori MCB da S, Brugger J, Degasperi FT, Cattani MSD. The gas flow rate increase obtained by an oscillating piezoelectric actuator on a micronozzle [Internet]. Sensors and Actuators A-Physical. 2008 ; 144( 1): 154-160.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/j.sna.2007.12.024
Artigo de periodico
Platinum and gold thin films deposited by filtered vacuum arc: morphological and crystallographic grain sizes (2006)
Salvadori, Maria Cecília Barbosa da Silveira; Melo, L L; Vaz, A R; Wiederkehr, R S; Teixeira, F S; Cattani, Mauro Sérgio Dorsa
Source: Surface & Coatings Technology. Unidade: IF
Subjects: FILMES FINOS, RESISTÊNCIA ELÉTRICA, ESTRUTURA ELETRÔNICA
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ABNT
SALVADORI, Maria Cecília Barbosa da Silveira et al. Platinum and gold thin films deposited by filtered vacuum arc: morphological and crystallographic grain sizes. Surface & Coatings Technology, v. 200, n. 9, p. 2965-2969, 2006Tradução . . Disponível em: https://doi.org/10.1016/j.surfcoat.2004.08.068. Acesso em: 01 nov. 2024.
APA
Salvadori, M. C. B. da S., Melo, L. L., Vaz, A. R., Wiederkehr, R. S., Teixeira, F. S., & Cattani, M. S. D. (2006). Platinum and gold thin films deposited by filtered vacuum arc: morphological and crystallographic grain sizes. Surface & Coatings Technology, 200( 9), 2965-2969. doi:10.1016/j.surfcoat.2004.08.068
NLM
Salvadori MCB da S, Melo LL, Vaz AR, Wiederkehr RS, Teixeira FS, Cattani MSD. Platinum and gold thin films deposited by filtered vacuum arc: morphological and crystallographic grain sizes [Internet]. Surface & Coatings Technology. 2006 ; 200( 9): 2965-2969.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/j.surfcoat.2004.08.068
Vancouver
Salvadori MCB da S, Melo LL, Vaz AR, Wiederkehr RS, Teixeira FS, Cattani MSD. Platinum and gold thin films deposited by filtered vacuum arc: morphological and crystallographic grain sizes [Internet]. Surface & Coatings Technology. 2006 ; 200( 9): 2965-2969.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/j.surfcoat.2004.08.068
Artigo de periodico
Residual stresses in titanium nitride thin films deposited by direct current and pulsed direct current unbalanced magnetron sputtering (2006)
Benegra, Marjorie ; Lamas, D G; Fernández de Rapp, M E; Mingolo, N; Kunrath, A O; Souza, Roberto Martins de
Source: Thin Solid Films. Unidade: EP
Subjects: FILMES FINOS, TENSÃO RESIDUAL, RESISTÊNCIA DOS MATERIAIS, PLASMA (PROCESSOS), TITÂNIO, NITRATOS
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ABNT
BENEGRA, Marjorie et al. Residual stresses in titanium nitride thin films deposited by direct current and pulsed direct current unbalanced magnetron sputtering. Thin Solid Films, v. 494, n. Ja 2006, p. 146-150, 2006Tradução . . Disponível em: https://doi.org/10.1016/j.tsf.2005.08.214. Acesso em: 01 nov. 2024.
APA
Benegra, M., Lamas, D. G., Fernández de Rapp, M. E., Mingolo, N., Kunrath, A. O., & Souza, R. M. de. (2006). Residual stresses in titanium nitride thin films deposited by direct current and pulsed direct current unbalanced magnetron sputtering. Thin Solid Films, 494( Ja 2006), 146-150. doi:10.1016/j.tsf.2005.08.214
NLM
Benegra M, Lamas DG, Fernández de Rapp ME, Mingolo N, Kunrath AO, Souza RM de. Residual stresses in titanium nitride thin films deposited by direct current and pulsed direct current unbalanced magnetron sputtering [Internet]. Thin Solid Films. 2006 ; 494( Ja 2006): 146-150.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/j.tsf.2005.08.214
Vancouver
Benegra M, Lamas DG, Fernández de Rapp ME, Mingolo N, Kunrath AO, Souza RM de. Residual stresses in titanium nitride thin films deposited by direct current and pulsed direct current unbalanced magnetron sputtering [Internet]. Thin Solid Films. 2006 ; 494( Ja 2006): 146-150.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/j.tsf.2005.08.214
Artigo de periodico
DLC coating roughness as a function of film thickness (2006)
Salvadori, Maria Cecília Barbosa da Silveira; Martins, D R; Cattani, Mauro Sérgio Dorsa
Source: Surfaces & Coatings Technology. Unidade: IF
Subjects: MATERIAIS, FILMES FINOS, MICROSCOPIA ELETRÔNICA
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ABNT
SALVADORI, Maria Cecília Barbosa da Silveira e MARTINS, D R e CATTANI, Mauro Sérgio Dorsa. DLC coating roughness as a function of film thickness. Surfaces & Coatings Technology, v. 200, n. 16-17, p. 5119-5122, 2006Tradução . . Disponível em: https://doi.org/10.1016/j.surfcoat.2005.05.030. Acesso em: 01 nov. 2024.
APA
Salvadori, M. C. B. da S., Martins, D. R., & Cattani, M. S. D. (2006). DLC coating roughness as a function of film thickness. Surfaces & Coatings Technology, 200( 16-17), 5119-5122. doi:10.1016/j.surfcoat.2005.05.030
NLM
Salvadori MCB da S, Martins DR, Cattani MSD. DLC coating roughness as a function of film thickness [Internet]. Surfaces & Coatings Technology. 2006 ; 200( 16-17): 5119-5122.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/j.surfcoat.2005.05.030
Vancouver
Salvadori MCB da S, Martins DR, Cattani MSD. DLC coating roughness as a function of film thickness [Internet]. Surfaces & Coatings Technology. 2006 ; 200( 16-17): 5119-5122.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/j.surfcoat.2005.05.030
Artigo de periodico
Micro-abrasive wear of DC and pulsed DC titanium nitride thin films with different levels of film residual stresses (2006)
Cozza, Ronaldo Câmara ; Tanaka, Deniol Katsuki; Souza, Roberto Martins de
Source: Surface & Coatings Technology. Unidade: EP
Subjects: FILMES FINOS, TRIBOLOGIA, TENSÃO RESIDUAL
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ABNT
COZZA, Ronaldo Câmara e TANAKA, Deniol Katsuki e SOUZA, Roberto Martins de. Micro-abrasive wear of DC and pulsed DC titanium nitride thin films with different levels of film residual stresses. Surface & Coatings Technology, v. 201, n. 7 , p. 4242-4246, 2006Tradução . . Disponível em: https://doi.org/10.1016/j.surfcoat.2006.08.044. Acesso em: 01 nov. 2024.
APA
Cozza, R. C., Tanaka, D. K., & Souza, R. M. de. (2006). Micro-abrasive wear of DC and pulsed DC titanium nitride thin films with different levels of film residual stresses. Surface & Coatings Technology, 201( 7 ), 4242-4246. doi:10.1016/j.surfcoat.2006.08.044
NLM
Cozza RC, Tanaka DK, Souza RM de. Micro-abrasive wear of DC and pulsed DC titanium nitride thin films with different levels of film residual stresses [Internet]. Surface & Coatings Technology. 2006 ; 201( 7 ): 4242-4246.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/j.surfcoat.2006.08.044
Vancouver
Cozza RC, Tanaka DK, Souza RM de. Micro-abrasive wear of DC and pulsed DC titanium nitride thin films with different levels of film residual stresses [Internet]. Surface & Coatings Technology. 2006 ; 201( 7 ): 4242-4246.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/j.surfcoat.2006.08.044
Artigo de periodico
Numerical and experimental analyses on the indentation of coated systems with substrates with different mechanical properties (2005)
Piana, L A; Pérez Ruiz, Eduardo Alberto ; Souza, Roberto Martins de ; Kunrath, A O; Strohaecker, Telmo Roberto
Source: Thin Solid Films. Unidade: EP
Subjects: FILMES FINOS, MECÂNICA DA FRATURA, PROPRIEDADES DOS MATERIAIS, COMPUTAÇÃO APLICADA, AÇO, RESISTÊNCIA DOS MATERIAIS, TITÂNIO, NITRATOS
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ABNT
PIANA, L A et al. Numerical and experimental analyses on the indentation of coated systems with substrates with different mechanical properties. Thin Solid Films, v. No 2005, n. 1-2, p. 197-203, 2005Tradução . . Disponível em: https://doi.org/10.1016/j.tsf.2005.06.025. Acesso em: 01 nov. 2024.
APA
Piana, L. A., Pérez Ruiz, E. A., Souza, R. M. de, Kunrath, A. O., & Strohaecker, T. R. (2005). Numerical and experimental analyses on the indentation of coated systems with substrates with different mechanical properties. Thin Solid Films, No 2005( 1-2), 197-203. doi:10.1016/j.tsf.2005.06.025
NLM
Piana LA, Pérez Ruiz EA, Souza RM de, Kunrath AO, Strohaecker TR. Numerical and experimental analyses on the indentation of coated systems with substrates with different mechanical properties [Internet]. Thin Solid Films. 2005 ; No 2005( 1-2): 197-203.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/j.tsf.2005.06.025
Vancouver
Piana LA, Pérez Ruiz EA, Souza RM de, Kunrath AO, Strohaecker TR. Numerical and experimental analyses on the indentation of coated systems with substrates with different mechanical properties [Internet]. Thin Solid Films. 2005 ; No 2005( 1-2): 197-203.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/j.tsf.2005.06.025
Artigo de periodico
Protective carbon layer for chemical corrosion of stainless steel (2003)
Mansano, Ronaldo Domingues ; Massi, Marcos; Santos, Ana Paula Mousinho dos; Zambom, Luís da Silva ; Gonçalves Neto, Luíz
Source: Diamond and Related Materials. Unidades: EESC, EP
Subjects: FILMES FINOS, CORROSÃO DOS MATERIAIS, AÇO INOXIDÁVEL
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ABNT
MANSANO, Ronaldo Domingues et al. Protective carbon layer for chemical corrosion of stainless steel. Diamond and Related Materials, v. 12, n. 3-7, p. 749-752, 2003Tradução . . Disponível em: https://doi.org/10.1016/s0925-9635(02)00270-4. Acesso em: 01 nov. 2024.
APA
Mansano, R. D., Massi, M., Santos, A. P. M. dos, Zambom, L. da S., & Gonçalves Neto, L. (2003). Protective carbon layer for chemical corrosion of stainless steel. Diamond and Related Materials, 12( 3-7), 749-752. doi:10.1016/s0925-9635(02)00270-4
NLM
Mansano RD, Massi M, Santos APM dos, Zambom L da S, Gonçalves Neto L. Protective carbon layer for chemical corrosion of stainless steel [Internet]. Diamond and Related Materials. 2003 ; 12( 3-7): 749-752.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/s0925-9635(02)00270-4
Vancouver
Mansano RD, Massi M, Santos APM dos, Zambom L da S, Gonçalves Neto L. Protective carbon layer for chemical corrosion of stainless steel [Internet]. Diamond and Related Materials. 2003 ; 12( 3-7): 749-752.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/s0925-9635(02)00270-4
Artigo de periodico
Microestrutural and transport properties of LaNi'O IND. 3-'delta'' filmes grown on Si(111) by chemical solution deposition (2003)
Escote, M T; Pontes, F M; Leite, E R; Varela, J A; Jardim, R. F.; Longo, E
Source: Thin Solid Films. Unidade: IF
Assunto: FILMES FINOS
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ABNT
ESCOTE, M T et al. Microestrutural and transport properties of LaNi'O IND. 3-'delta'' filmes grown on Si(111) by chemical solution deposition. Thin Solid Films, 2003Tradução . . Disponível em: http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TW0-49XNX6F-7-9&_cdi=5548&_orig=browse&_coverDate=11%2F24%2F2003&_sk=995549998&view=c&wchp=dGLbVlb-zSkWb&_acct=C000049650&_version=1&_userid=972067&md5=74ae4e335bf92c1a1757dd75aaf359a4&ie=f.pdf. Acesso em: 01 nov. 2024.
APA
Escote, M. T., Pontes, F. M., Leite, E. R., Varela, J. A., Jardim, R. F., & Longo, E. (2003). Microestrutural and transport properties of LaNi'O IND. 3-'delta'' filmes grown on Si(111) by chemical solution deposition. Thin Solid Films. Recuperado de http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TW0-49XNX6F-7-9&_cdi=5548&_orig=browse&_coverDate=11%2F24%2F2003&_sk=995549998&view=c&wchp=dGLbVlb-zSkWb&_acct=C000049650&_version=1&_userid=972067&md5=74ae4e335bf92c1a1757dd75aaf359a4&ie=f.pdf
NLM
Escote MT, Pontes FM, Leite ER, Varela JA, Jardim RF, Longo E. Microestrutural and transport properties of LaNi'O IND. 3-'delta'' filmes grown on Si(111) by chemical solution deposition [Internet]. Thin Solid Films. 2003 ;[citado 2024 nov. 01 ] Available from: http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TW0-49XNX6F-7-9&_cdi=5548&_orig=browse&_coverDate=11%2F24%2F2003&_sk=995549998&view=c&wchp=dGLbVlb-zSkWb&_acct=C000049650&_version=1&_userid=972067&md5=74ae4e335bf92c1a1757dd75aaf359a4&ie=f.pdf
Vancouver
Escote MT, Pontes FM, Leite ER, Varela JA, Jardim RF, Longo E. Microestrutural and transport properties of LaNi'O IND. 3-'delta'' filmes grown on Si(111) by chemical solution deposition [Internet]. Thin Solid Films. 2003 ;[citado 2024 nov. 01 ] Available from: http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TW0-49XNX6F-7-9&_cdi=5548&_orig=browse&_coverDate=11%2F24%2F2003&_sk=995549998&view=c&wchp=dGLbVlb-zSkWb&_acct=C000049650&_version=1&_userid=972067&md5=74ae4e335bf92c1a1757dd75aaf359a4&ie=f.pdf
Trabalho de evento-resumo
Structural characterization of Titanium atoms in BaO-'B IND.2''O IND.3'-Ti'O IND.2' glass-ceramics and thin films (2003)
Mastelaro, Valmor Roberto ; Feitosa, Carlos A. C.; Maia, Lauro J.; Bernardi, Maria Inês Basso; Hernandes, Antônio Carlos ; Ibanez, Alain; Michalowicz, Alain
Source: Program. Conference titles: International Conference on X-ray Absorption Fine Structure - XAFS. Unidade: IFSC
Subjects: CERÂMICA, FILMES FINOS, ÓPTICA
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ABNT
MASTELARO, Valmor Roberto et al. Structural characterization of Titanium atoms in BaO-'B IND.2''O IND.3'-Ti'O IND.2' glass-ceramics and thin films. 2003, Anais.. Malmo: Malmo Congress Bureau, 2003. . Acesso em: 01 nov. 2024.
APA
Mastelaro, V. R., Feitosa, C. A. C., Maia, L. J., Bernardi, M. I. B., Hernandes, A. C., Ibanez, A., & Michalowicz, A. (2003). Structural characterization of Titanium atoms in BaO-'B IND.2''O IND.3'-Ti'O IND.2' glass-ceramics and thin films. In Program. Malmo: Malmo Congress Bureau.
NLM
Mastelaro VR, Feitosa CAC, Maia LJ, Bernardi MIB, Hernandes AC, Ibanez A, Michalowicz A. Structural characterization of Titanium atoms in BaO-'B IND.2''O IND.3'-Ti'O IND.2' glass-ceramics and thin films. Program. 2003 ;[citado 2024 nov. 01 ]
Vancouver
Mastelaro VR, Feitosa CAC, Maia LJ, Bernardi MIB, Hernandes AC, Ibanez A, Michalowicz A. Structural characterization of Titanium atoms in BaO-'B IND.2''O IND.3'-Ti'O IND.2' glass-ceramics and thin films. Program. 2003 ;[citado 2024 nov. 01 ]
Artigo de periodico
Structural investigation of Si-rich amorphous silicon oxynitride films (2003)
Scopel, Wanderla Luis ; Fantini, Márcia Carvalho de Abreu ; Alayo Chávez, Marco Isaías ; Pereyra, Inés
Source: Thin Solids Films. Unidades: IF, EP
Subjects: FILMES FINOS, FOTOLUMINESCÊNCIA
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ABNT
SCOPEL, Wanderla Luis et al. Structural investigation of Si-rich amorphous silicon oxynitride films. Thin Solids Films, v. 425, n. 1-2, p. 275-281, 2003Tradução . . Disponível em: https://doi.org/10.1016/s0040-6090(02)01053-2. Acesso em: 01 nov. 2024.
APA
Scopel, W. L., Fantini, M. C. de A., Alayo Chávez, M. I., & Pereyra, I. (2003). Structural investigation of Si-rich amorphous silicon oxynitride films. Thin Solids Films, 425( 1-2), 275-281. doi:10.1016/s0040-6090(02)01053-2
NLM
Scopel WL, Fantini MC de A, Alayo Chávez MI, Pereyra I. Structural investigation of Si-rich amorphous silicon oxynitride films [Internet]. Thin Solids Films. 2003 ; 425( 1-2): 275-281.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/s0040-6090(02)01053-2
Vancouver
Scopel WL, Fantini MC de A, Alayo Chávez MI, Pereyra I. Structural investigation of Si-rich amorphous silicon oxynitride films [Internet]. Thin Solids Films. 2003 ; 425( 1-2): 275-281.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/s0040-6090(02)01053-2
Artigo de periodico
Structural electrical and optical properties of undoped and indium doped ZnO thin films prepared by the pyrosol process at different temperatures (2002)
Tokumoto, M S; Smith, A; Santilli, Celso Valentim; Pulcinelli, Sandra Helena; Craievich, Aldo Felix; Elkaim, E
Source: Thin Solid Films. Unidade: IF
Subjects: FILMES FINOS, MATERIAIS (PROPRIEDADES ELÉTRICAS)
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ABNT
TOKUMOTO, M S et al. Structural electrical and optical properties of undoped and indium doped ZnO thin films prepared by the pyrosol process at different temperatures. Thin Solid Films, v. 416, n. 1-2, p. 284-293, 2002Tradução . . Disponível em: https://doi.org/10.1016/s0040-6090(02)00531-x. Acesso em: 01 nov. 2024.
APA
Tokumoto, M. S., Smith, A., Santilli, C. V., Pulcinelli, S. H., Craievich, A. F., & Elkaim, E. (2002). Structural electrical and optical properties of undoped and indium doped ZnO thin films prepared by the pyrosol process at different temperatures. Thin Solid Films, 416( 1-2), 284-293. doi:10.1016/s0040-6090(02)00531-x
NLM
Tokumoto MS, Smith A, Santilli CV, Pulcinelli SH, Craievich AF, Elkaim E. Structural electrical and optical properties of undoped and indium doped ZnO thin films prepared by the pyrosol process at different temperatures [Internet]. Thin Solid Films. 2002 ; 416( 1-2): 284-293.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/s0040-6090(02)00531-x
Vancouver
Tokumoto MS, Smith A, Santilli CV, Pulcinelli SH, Craievich AF, Elkaim E. Structural electrical and optical properties of undoped and indium doped ZnO thin films prepared by the pyrosol process at different temperatures [Internet]. Thin Solid Films. 2002 ; 416( 1-2): 284-293.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/s0040-6090(02)00531-x
Artigo de periodico
Local structure and bonds of amorphous silicon oxynitride thin films (2002)
Scopel, Wanderla Luis ; Fantini, Márcia Carvalho de Abreu ; Alayo Chávez, Marco Isaías ; Pereyra, Inés
Source: Thin Solid Films. Unidades: IF, EP
Subjects: ESPECTROSCOPIA DE RAIO X, ESPECTROMETRIA, FILMES FINOS
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ABNT
SCOPEL, Wanderla Luis et al. Local structure and bonds of amorphous silicon oxynitride thin films. Thin Solid Films, v. 413, n. 1-2, p. 59-64, 2002Tradução . . Disponível em: https://doi.org/10.1016/s0040-6090(02)00346-2. Acesso em: 01 nov. 2024.
APA
Scopel, W. L., Fantini, M. C. de A., Alayo Chávez, M. I., & Pereyra, I. (2002). Local structure and bonds of amorphous silicon oxynitride thin films. Thin Solid Films, 413( 1-2), 59-64. doi:10.1016/s0040-6090(02)00346-2
NLM
Scopel WL, Fantini MC de A, Alayo Chávez MI, Pereyra I. Local structure and bonds of amorphous silicon oxynitride thin films [Internet]. Thin Solid Films. 2002 ; 413( 1-2): 59-64.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/s0040-6090(02)00346-2
Vancouver
Scopel WL, Fantini MC de A, Alayo Chávez MI, Pereyra I. Local structure and bonds of amorphous silicon oxynitride thin films [Internet]. Thin Solid Films. 2002 ; 413( 1-2): 59-64.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/s0040-6090(02)00346-2
Artigo de periodico
Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity (2002)
Morelhão, Sérgio Luiz; Brito, Giancarlo Esposito de Souza; Abramof, Eduardo
Source: Journal of Alloys and Compounds. Unidade: IF
Subjects: SUPERFÍCIE FÍSICA, FILMES FINOS
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ABNT
MORELHÃO, Sérgio Luiz e BRITO, Giancarlo Esposito de Souza e ABRAMOF, Eduardo. Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity. Journal of Alloys and Compounds, v. 344, n. 102, p. 207-211, 2002Tradução . . Disponível em: https://doi.org/10.1016/s0925-8388(02)00342-0. Acesso em: 01 nov. 2024.
APA
Morelhão, S. L., Brito, G. E. de S., & Abramof, E. (2002). Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity. Journal of Alloys and Compounds, 344( 102), 207-211. doi:10.1016/s0925-8388(02)00342-0
NLM
Morelhão SL, Brito GE de S, Abramof E. Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity [Internet]. Journal of Alloys and Compounds. 2002 ; 344( 102): 207-211.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/s0925-8388(02)00342-0
Vancouver
Morelhão SL, Brito GE de S, Abramof E. Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity [Internet]. Journal of Alloys and Compounds. 2002 ; 344( 102): 207-211.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1016/s0925-8388(02)00342-0
Trabalho de evento-resumo
Langmuir monolayers and deposited lb films of poly (o-metoxyaniline) (1992)
Mattoso, L H C; Ferreira, M.; Gonçalves, Débora ; Bulhoes, L O S; Oliveira Junior, Osvaldo Novais de ; Faria, Roberto Mendonça
Source: Book of Abstracts. Conference titles: International Conference on Science and Technology of Synthetic Metals. Unidade: IFSC
Subjects: FILMES FINOS, MATÉRIA CONDENSADA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MATTOSO, L H C et al. Langmuir monolayers and deposited lb films of poly (o-metoxyaniline). 1992, Anais.. Goteborg: Instituto de Física de São Carlos, Universidade de São Paulo, 1992. . Acesso em: 01 nov. 2024.
APA
Mattoso, L. H. C., Ferreira, M., Gonçalves, D., Bulhoes, L. O. S., Oliveira Junior, O. N. de, & Faria, R. M. (1992). Langmuir monolayers and deposited lb films of poly (o-metoxyaniline). In Book of Abstracts. Goteborg: Instituto de Física de São Carlos, Universidade de São Paulo.
NLM
Mattoso LHC, Ferreira M, Gonçalves D, Bulhoes LOS, Oliveira Junior ON de, Faria RM. Langmuir monolayers and deposited lb films of poly (o-metoxyaniline). Book of Abstracts. 1992 ;[citado 2024 nov. 01 ]
Vancouver
Mattoso LHC, Ferreira M, Gonçalves D, Bulhoes LOS, Oliveira Junior ON de, Faria RM. Langmuir monolayers and deposited lb films of poly (o-metoxyaniline). Book of Abstracts. 1992 ;[citado 2024 nov. 01 ]

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