Structural investigation of cobalt oxide films grown by reactive DC magnetron sputtering (2019)
- Authors:
- Autor USP: ZANATTA, ANTONIO RICARDO - IFSC
- Unidade: IFSC
- Subjects: TECNOLOGIA DE MICRO-ONDAS; FILMES FINOS; COBALTO
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Publisher: Sociedade Brasileira de Pesquisa em Materiais - SBPMat
- Publisher place: Rio de Janeiro
- Date published: 2019
- Source:
- Título: Program
- Conference titles: Brazilian MRS Meeting
-
ABNT
AZEVEDO NETO, Nilton Francelosi et al. Structural investigation of cobalt oxide films grown by reactive DC magnetron sputtering. 2019, Anais.. Rio de Janeiro: Sociedade Brasileira de Pesquisa em Materiais - SBPMat, 2019. . Acesso em: 14 jul. 2025. -
APA
Azevedo Neto, N. F., Affonço, L. J., Angélico, J. C., Zanatta, A. R., Soares, M. M., & Silva, J. H. D. da. (2019). Structural investigation of cobalt oxide films grown by reactive DC magnetron sputtering. In Program. Rio de Janeiro: Sociedade Brasileira de Pesquisa em Materiais - SBPMat. -
NLM
Azevedo Neto NF, Affonço LJ, Angélico JC, Zanatta AR, Soares MM, Silva JHD da. Structural investigation of cobalt oxide films grown by reactive DC magnetron sputtering. Program. 2019 ;[citado 2025 jul. 14 ] -
Vancouver
Azevedo Neto NF, Affonço LJ, Angélico JC, Zanatta AR, Soares MM, Silva JHD da. Structural investigation of cobalt oxide films grown by reactive DC magnetron sputtering. Program. 2019 ;[citado 2025 jul. 14 ] - Photoluminescence and structural study of Sm and Tb-doped TiOx thin films
- Optical analysis of cobalt oxide thin films deposited by reactive sputtering
- The metal-induced crystallization of amorphous Si and Ge thin films: fundamentals and advancements
- Defect-mediated excitation of Yb ions in amorphous SiN films
- A critical review on the conversion degree of resin monomers by direct analyses
- The mechanisms behind the enhancement of the near-infrared light emission due to Er+Yb ions in an optical microcavity
- Influence of nickel concentration on the metal-induced crystallization of amorphous silicon thin films
- On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering
- Laser-induced generation of micrometer-sized luminescent patterns on rare-earth-doped amorphous films
- Técnicas de espectroscopia óptica 1: espalhamento Raman
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas