Structural defects and electronic phase diagram of topological insulator bismuth telluride epitaxial films (2018)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- DOI: 10.1088/2053-1591/aadeb7
- Subjects: DIFRAÇÃO POR RAIOS X; SEMICONDUTORES; CRISTALOGRAFIA DE RAIOS X
- Language: Inglês
- Imprenta:
- Source:
- Título: Materials Research Express
- Volume/Número/Paginação/Ano: v. 5, n. 11, p. 116410, nov. 2018
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
FORNARI, C. I et al. Structural defects and electronic phase diagram of topological insulator bismuth telluride epitaxial films. Materials Research Express, v. no 2018, n. 11, p. 116410, 2018Tradução . . Disponível em: http://iopscience.iop.org/article/10.1088/2053-1591/aadeb7. Acesso em: 14 out. 2024. -
APA
Fornari, C. I., Rappl, P. H. O., Fornari, G., Travelho, J. S., Castro, S. de, Pirralho, M. J. P., et al. (2018). Structural defects and electronic phase diagram of topological insulator bismuth telluride epitaxial films. Materials Research Express, no 2018( 11), 116410. doi:10.1088/2053-1591/aadeb7 -
NLM
Fornari CI, Rappl PHO, Fornari G, Travelho JS, Castro S de, Pirralho MJP, Pena FS, Peres ML, Abramof E, Morelhao SL. Structural defects and electronic phase diagram of topological insulator bismuth telluride epitaxial films [Internet]. Materials Research Express. 2018 ; no 2018( 11): 116410.[citado 2024 out. 14 ] Available from: http://iopscience.iop.org/article/10.1088/2053-1591/aadeb7 -
Vancouver
Fornari CI, Rappl PHO, Fornari G, Travelho JS, Castro S de, Pirralho MJP, Pena FS, Peres ML, Abramof E, Morelhao SL. Structural defects and electronic phase diagram of topological insulator bismuth telluride epitaxial films [Internet]. Materials Research Express. 2018 ; no 2018( 11): 116410.[citado 2024 out. 14 ] Available from: http://iopscience.iop.org/article/10.1088/2053-1591/aadeb7 - High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
- Enhanced X-ray phase determination by three-beam diffraction
- Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry
- Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity
- An x-ray diffractometer for accurate structural invariant phase determination
- Invariant phase determination by genetic algorithm
- General recursive solution for one-dimensional quantum potentials: a simple tool for applied physics
- An x-ray topography study of the dendritic web silicon growth process
- Structure refinement of in pure and doped single crystals by synchrotron X-ray Renninger scanning
- O Professor Sergio Morelhão fala sobre "Física Quântica e Neurociência" [Palestra]
Informações sobre o DOI: 10.1088/2053-1591/aadeb7 (Fonte: oaDOI API)
Download do texto completo
Tipo | Nome | Link | |
---|---|---|---|
Fornari_2018_Mater._Res._... | Direct link |
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas