Large areas elemental mapping by ion beam analysis techniques (2015)
- Authors:
- USP affiliated authors: SILVA, TIAGO FIORINI DA - IF ; RODRIGUES, CLEBER LIMA - IF ; ADDED, NEMITALA - IF ; TABACNIKS, MANFREDO HARRI - IF ; RIZZUTTO, MARCIA DE ALMEIDA - IF ; CAMPOS, PEDRO HERZILIO OTTONI VIVIANI DE - IF ; MORO, MARCOS VINICIUS - IF ; CURADO, JESSICA FLEURY - IF ; ALLEGRO, PAULA RANGEL PESTANA - IF ; SANTOS, SUENE BERNARDES DOS - IF
- School: IF
- Subjects: FÍSICA NUCLEAR; IONS; MATERIAIS; FÍSICA DE PARTÍCULAS; DIFRAÇÃO POR RAIOS X; ESPECTROMETRIA; ARQUEOMETRIA
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Journal of Physics: Conference Series (JPCS)
- ISSN: 1742-6596
- Volume/Número/Paginação/Ano: v. 630, número do artigo: 012016, Proceedings Paper, online
- Conference title: Brazilian Meeting on Nuclear Physics
-
ABNT
SILVA, Tiago Fiorini da; RODRIGUES, Cleber; CURADO, Jessica Fleury; et al. Large areas elemental mapping by ion beam analysis techniques. Journal of Physics: Conference Series (JPCS)[S.l: s.n.], 2015.Disponível em: -
APA
Silva, T. F. da, Rodrigues, C., Curado, J. F., Campos, P. H. O. V., Allegro, P., Moro, M. V., et al. (2015). Large areas elemental mapping by ion beam analysis techniques. Journal of Physics: Conference Series (JPCS). Bristol. Recuperado de https://doi.org/10.1088/1742-6596/630/1/012016 -
NLM
Silva TF da, Rodrigues C, Curado JF, Campos PHOV, Allegro P, Moro MV, Santos SB dos, Kajiya EAM, Added N, Tabacniks M, Rizzutto MA. Large areas elemental mapping by ion beam analysis techniques [Internet]. Journal of Physics: Conference Series (JPCS). 2015 ; 630Available from: https://doi.org/10.1088/1742-6596/630/1/012016 -
Vancouver
Silva TF da, Rodrigues C, Curado JF, Campos PHOV, Allegro P, Moro MV, Santos SB dos, Kajiya EAM, Added N, Tabacniks M, Rizzutto MA. Large areas elemental mapping by ion beam analysis techniques [Internet]. Journal of Physics: Conference Series (JPCS). 2015 ; 630Available from: https://doi.org/10.1088/1742-6596/630/1/012016 - Study of sputtering processes, on metallic thin films, due to low energy ion implantation
- Hydrogen loss of high dose ion beam irradiated polycarbonate foils
- In-air RBS measurements at the LAMFI external beam setup
- Elemental thin film depth profiles by using self-consistent ion beam analysis – MultiSIMNRA: a new computational tool
- Self-consistent ion beam analysis: An approach by multi-objective optimization
- Characterization of a nitrogen-implanted iron using ERDA
- An indirect investigation of hardness of ancient swords by non-destructive techniques.
- MultiSIMNRA: a computational tool for self-consistent ion beam analysis using SIMNRA
- High sensitivity boron quantification in bulk silicon using the 'ANTPOT. 11 B(p,'alfa'IND. 0')'ANTPOT.8'BE' nuclear reaction
- Study of boron detection limit using the in-air PIGE setup at LAMFI-USP
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
