Large areas elemental mapping by ion beam analysis techniques (2015)
- Authors:
- USP affiliated authors: SILVA, TIAGO FIORINI DA - IF ; RODRIGUES, CLEBER LIMA - IF ; ADDED, NEMITALA - IF ; TABACNIKS, MANFREDO HARRI - IF ; RIZZUTTO, MARCIA DE ALMEIDA - IF ; CAMPOS, PEDRO HERZILIO OTTONI VIVIANI DE - IF ; MORO, MARCOS VINICIUS - IF ; CURADO, JESSICA FLEURY - IF ; ALLEGRO, PAULA RANGEL PESTANA - IF ; SANTOS, SUENE BERNARDES DOS - IF
- School: IF
- Subjects: FÍSICA NUCLEAR; IONS; MATERIAIS; FÍSICA DE PARTÍCULAS; DIFRAÇÃO POR RAIOS X; ESPECTROMETRIA; ARQUEOMETRIA
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Journal of Physics: Conference Series (JPCS)
- ISSN: 1742-6596
- Volume/Número/Paginação/Ano: v. 630, número do artigo: 012016, Proceedings Paper, online
- Conference title: Brazilian Meeting on Nuclear Physics
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ABNT
SILVA, Tiago Fiorini da et al. Large areas elemental mapping by ion beam analysis techniques. Journal of Physics: Conference Series (JPCS). Bristol: Instituto de Física, Universidade de São Paulo. Disponível em: https://doi.org/10.1088/1742-6596/630/1/012016. Acesso em: 26 jun. 2022. , 2015 -
APA
Silva, T. F. da, Rodrigues, C., Curado, J. F., Campos, P. H. O. V., Allegro, P., Moro, M. V., et al. (2015). Large areas elemental mapping by ion beam analysis techniques. Journal of Physics: Conference Series (JPCS). Bristol: Instituto de Física, Universidade de São Paulo. Recuperado de https://doi.org/10.1088/1742-6596/630/1/012016 -
NLM
Silva TF da, Rodrigues C, Curado JF, Campos PHOV, Allegro P, Moro MV, Santos SB dos, Kajiya EAM, Added N, Tabacniks M, Rizzutto MA. Large areas elemental mapping by ion beam analysis techniques [Internet]. Journal of Physics: Conference Series (JPCS). 2015 ; 630[citado 2022 jun. 26 ] Available from: https://doi.org/10.1088/1742-6596/630/1/012016 -
Vancouver
Silva TF da, Rodrigues C, Curado JF, Campos PHOV, Allegro P, Moro MV, Santos SB dos, Kajiya EAM, Added N, Tabacniks M, Rizzutto MA. Large areas elemental mapping by ion beam analysis techniques [Internet]. Journal of Physics: Conference Series (JPCS). 2015 ; 630[citado 2022 jun. 26 ] Available from: https://doi.org/10.1088/1742-6596/630/1/012016 - Study of sputtering processes, on metallic thin films, due to low energy ion implantation
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