Large area element mapping by ion beam analysis techniques (2014)
- Authors:
- USP affiliated authors: SILVA, TIAGO FIORINI DA - IF ; RODRIGUES, CLEBER LIMA - IF ; ADDED, NEMITALA - IF ; TABACNIKS, MANFREDO HARRI - IF ; RIZZUTTO, MARCIA DE ALMEIDA - IF
- School: IF
- Subjects: FÍSICA NUCLEAR; IONS
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: SBF
- Conference title: Reunião de Trabalho sobre Física Nuclear no Brasil
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ABNT
SILVA, Tiago Fiorini da; RODRIGUES, Cleber Lima; CURADO, Jessica Fleury; et al. Large area element mapping by ion beam analysis techniques. Anais.. São Paulo: [s.n.], 2014.Disponível em: -
APA
Silva, T. F. da, Rodrigues, C. L., Curado, J. F., Santos, S. B. dos, Campos, P. H. O. V. de, Allegro, P. R. P., et al. (2014). Large area element mapping by ion beam analysis techniques. In SBF. São Paulo. Recuperado de http://www.sbf1.sbfisica.org.br/eventos/rtfnb/xxxvii/sys/resumos/R0029-1.pdf -
NLM
Silva TF da, Rodrigues CL, Curado JF, Santos SB dos, Campos PHOV de, Allegro PRP, Kajiya EAM, Added N, Tabacniks MH, Rizzutto M de A. Large area element mapping by ion beam analysis techniques [Internet]. SBF. 2014 ;Available from: http://www.sbf1.sbfisica.org.br/eventos/rtfnb/xxxvii/sys/resumos/R0029-1.pdf -
Vancouver
Silva TF da, Rodrigues CL, Curado JF, Santos SB dos, Campos PHOV de, Allegro PRP, Kajiya EAM, Added N, Tabacniks MH, Rizzutto M de A. Large area element mapping by ion beam analysis techniques [Internet]. SBF. 2014 ;Available from: http://www.sbf1.sbfisica.org.br/eventos/rtfnb/xxxvii/sys/resumos/R0029-1.pdf - Study of sputtering processes, on metallic thin films, due to low energy ion implantation
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