Large areas elemental mapping by ion beam analysis techniques (2015)
- Authors:
- USP affiliated authors: SILVA, TIAGO FIORINI DA - IF ; RODRIGUES, CLEBER LIMA - IF ; ADDED, NEMITALA - IF ; TABACNIKS, MANFREDO HARRI - IF ; RIZZUTTO, MARCIA DE ALMEIDA - IF ; CAMPOS, PEDRO HERZILIO OTTONI VIVIANI DE - IF ; MORO, MARCOS VINICIUS - IF ; CURADO, JESSICA FLEURY - IF ; ALLEGRO, PAULA RANGEL PESTANA - IF ; SANTOS, SUENE BERNARDES DOS - IF
- Unidade: IF
- DOI: 10.1088/1742-6596/630/1/012016
- Subjects: FÍSICA NUCLEAR; IONS; MATERIAIS; FÍSICA DE PARTÍCULAS; DIFRAÇÃO POR RAIOS X; ESPECTROMETRIA; ARQUEOMETRIA
- Language: Inglês
- Imprenta:
- Source:
- Título: Journal of Physics: Conference Series (JPCS)
- ISSN: 1742-6596
- Volume/Número/Paginação/Ano: v. 630, número do artigo: 012016, Proceedings Paper, online
- Conference titles: Brazilian Meeting on Nuclear Physics
- Este periódico é de acesso aberto
- Este artigo NÃO é de acesso aberto
-
ABNT
SILVA, Tiago Fiorini da et al. Large areas elemental mapping by ion beam analysis techniques. Journal of Physics: Conference Series (JPCS). Bristol: Instituto de Física, Universidade de São Paulo. Disponível em: https://doi.org/10.1088/1742-6596/630/1/012016. Acesso em: 13 fev. 2026. , 2015 -
APA
Silva, T. F. da, Rodrigues, C. L., Curado, J. F., Campos, P. H. O. V. de, Allegro, P. R. P., Moro, M. V., et al. (2015). Large areas elemental mapping by ion beam analysis techniques. Journal of Physics: Conference Series (JPCS). Bristol: Instituto de Física, Universidade de São Paulo. doi:10.1088/1742-6596/630/1/012016 -
NLM
Silva TF da, Rodrigues CL, Curado JF, Campos PHOV de, Allegro PRP, Moro MV, Santos SB dos, Kajiya EA de M, Added N, Tabacniks MH, Rizzutto M de A. Large areas elemental mapping by ion beam analysis techniques [Internet]. Journal of Physics: Conference Series (JPCS). 2015 ; 630[citado 2026 fev. 13 ] Available from: https://doi.org/10.1088/1742-6596/630/1/012016 -
Vancouver
Silva TF da, Rodrigues CL, Curado JF, Campos PHOV de, Allegro PRP, Moro MV, Santos SB dos, Kajiya EA de M, Added N, Tabacniks MH, Rizzutto M de A. Large areas elemental mapping by ion beam analysis techniques [Internet]. Journal of Physics: Conference Series (JPCS). 2015 ; 630[citado 2026 fev. 13 ] Available from: https://doi.org/10.1088/1742-6596/630/1/012016 - Study of sputtering processes, on metallic thin films, due to low energy ion implantation
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Informações sobre o DOI: 10.1088/1742-6596/630/1/012016 (Fonte: oaDOI API)
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