On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering (2013)
- Autor:
- Autor USP: ZANATTA, ANTONIO RICARDO - IFSC
- Unidade: IFSC
- Subjects: TERRAS RARAS; DIELÉTRICOS (PROPRIEDADES); MATERIAIS CERÂMICOS
- Language: Inglês
- Imprenta:
- Publisher: University of Trento
- Publisher place: Trento
- Date published: 2013
- Source:
- Título do periódico: Program
- Conference titles: International Conference on the Structure of Non Crystalline Materials - NCM
-
ABNT
ZANATTA, Antonio Ricardo. On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering. 2013, Anais.. Trento: University of Trento, 2013. . Acesso em: 29 set. 2024. -
APA
Zanatta, A. R. (2013). On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering. In Program. Trento: University of Trento. -
NLM
Zanatta AR. On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering. Program. 2013 ;[citado 2024 set. 29 ] -
Vancouver
Zanatta AR. On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering. Program. 2013 ;[citado 2024 set. 29 ] - Effect of Ga incorporation on photoinduced phenomena in Ge-S glasses
- Síntese e caracterização de padrões micro-estruturados
- Optoelectronic and structural characteristics of Er-doped amorphous AIN films
- Aluminium-induced nanocrystalline Ge formation at low temperatures
- Photoluminescence of a-GeN alloys doped with different rare-earth ions
- X-ray photoelectron spectroscopy of amorphous A1N alloys prepared by reactive rf sputtering
- Laser interference structuring of a-Ge films on GaAs
- Neutral dangling bond depletion in amorphous SiN films induced by magnetic rare-earth elements
- Photoluminescence of a-GeN alloys doped with different rare-earth ions
- Comprehensive spectroscopic study of nitrogenated carbon nanotubes
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas