On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering (2013)
- Autor:
- Autor USP: ZANATTA, ANTONIO RICARDO - IFSC
- Unidade: IFSC
- Subjects: TERRAS RARAS; DIELÉTRICOS (PROPRIEDADES); MATERIAIS CERÂMICOS
- Language: Inglês
- Imprenta:
- Publisher: University of Trento
- Publisher place: Trento
- Date published: 2013
- Source:
- Título: Program
- Conference titles: International Conference on the Structure of Non Crystalline Materials - NCM
-
ABNT
ZANATTA, Antonio Ricardo. On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering. 2013, Anais.. Trento: University of Trento, 2013. . Acesso em: 27 dez. 2025. -
APA
Zanatta, A. R. (2013). On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering. In Program. Trento: University of Trento. -
NLM
Zanatta AR. On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering. Program. 2013 ;[citado 2025 dez. 27 ] -
Vancouver
Zanatta AR. On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering. Program. 2013 ;[citado 2025 dez. 27 ] - Photoluminescence and structural study of Sm and Tb-doped TiOx thin films
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