On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering (2013)
- Autor:
- Autor USP: ZANATTA, ANTONIO RICARDO - IFSC
- Unidade: IFSC
- Subjects: TERRAS RARAS; DIELÉTRICOS (PROPRIEDADES); MATERIAIS CERÂMICOS
- Language: Inglês
- Imprenta:
- Publisher: University of Trento
- Publisher place: Trento
- Date published: 2013
- Source:
- Título do periódico: Program
- Conference titles: International Conference on the Structure of Non Crystalline Materials - NCM
-
ABNT
ZANATTA, Antonio Ricardo. On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering. 2013, Anais.. Trento: University of Trento, 2013. . Acesso em: 25 abr. 2024. -
APA
Zanatta, A. R. (2013). On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering. In Program. Trento: University of Trento. -
NLM
Zanatta AR. On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering. Program. 2013 ;[citado 2024 abr. 25 ] -
Vancouver
Zanatta AR. On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering. Program. 2013 ;[citado 2024 abr. 25 ] - Structural investigation of cobalt oxide films grown by reactive DC magnetron sputtering
- Espectroscopia óptica de vidros fluoroindatos dopados com íons 'Er POT.3+' e 'Yb POT.3+'
- Optoelectronic properties of Er-doped amorphous GaAsN films
- AIN aloys prepared by reactive radio frequency sputtering
- Pulsed laser crystallization of SiGe alloys on GaAs
- Photoluminescence of Sm and Er doped amorphous AIN
- Photoelectron spectroscopic study of amoprhous GaAsN films
- Microcrystalline silicon with high electron field-effect mobility deposited at '230 GRAUS'
- Laser-induced generation of micrometer-sized luminescent patterns on rare-earth-doped amorphous films
- Photon and electron excitation of rare-earth-doped amorphous SiN films
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