Hybrid reciprocal space for X-ray diffraction in epitaxic layers (2007)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- DOI: 10.1107/s002188980701521x
- Assunto: DIFRAÇÃO POR RAIOS X
- Language: Inglês
- Imprenta:
- Source:
- Título: Journal of Applied Crystallography
- ISSN: 0021-8898
- Volume/Número/Paginação/Ano: v. 40, pt. 3, p. 546-551, 2007
- Este periódico é de assinatura
- Este artigo é de acesso aberto
- URL de acesso aberto
- Cor do Acesso Aberto: green
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ABNT
MORELHÃO, Sérgio Luiz e DOMAGALA, Jarek Z. Hybrid reciprocal space for X-ray diffraction in epitaxic layers. Journal of Applied Crystallography, v. 40, p. 546-551, 2007Tradução . . Disponível em: https://doi.org/10.1107/s002188980701521x. Acesso em: 05 out. 2024. -
APA
Morelhão, S. L., & Domagala, J. Z. (2007). Hybrid reciprocal space for X-ray diffraction in epitaxic layers. Journal of Applied Crystallography, 40, 546-551. doi:10.1107/s002188980701521x -
NLM
Morelhão SL, Domagala JZ. Hybrid reciprocal space for X-ray diffraction in epitaxic layers [Internet]. Journal of Applied Crystallography. 2007 ; 40 546-551.[citado 2024 out. 05 ] Available from: https://doi.org/10.1107/s002188980701521x -
Vancouver
Morelhão SL, Domagala JZ. Hybrid reciprocal space for X-ray diffraction in epitaxic layers [Internet]. Journal of Applied Crystallography. 2007 ; 40 546-551.[citado 2024 out. 05 ] Available from: https://doi.org/10.1107/s002188980701521x - High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
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Informações sobre o DOI: 10.1107/s002188980701521x (Fonte: oaDOI API)
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