Combination of x-ray absorption spectroscopy and Rutherford backscattering for the analysis of amorphous Si-based thin films

Combination of x-ray absorption spectroscopy and Rutherford backscattering for the analysis of amorphous Si-based thin films (2000)

Authors:
USP affiliated authors: FANTINI, MARCIA CARVALHO DE ABREU - IF ; TABACNIKS, MANFREDO HARRI - IF
Unidade: IF
Assunto: FÍSICA
Language: Inglês
Imprenta:
- Publisher place: São Pedro
- Date published: 2000
Conference titles: Seminário Latino-Americano de Análises por Técnicas de Raios X

A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas

ABNT

FANTINI, Márcia Carvalho de Abreu; PRADO, Rogerio Junqueira; SCOPEL, Wanderla Luis; TABACNIKS, Manfredo Harri. Combination of x-ray absorption spectroscopy and Rutherford backscattering for the analysis of amorphous Si-based thin films. Anais.. São Pedro: [s.n.], 2000.
APA

Fantini, M. C. de A., Prado, R. J., Scopel, W. L., & Tabacniks, M. H. (2000). Combination of x-ray absorption spectroscopy and Rutherford backscattering for the analysis of amorphous Si-based thin films. In . São Pedro.
NLM

Fantini MC de A, Prado RJ, Scopel WL, Tabacniks MH. Combination of x-ray absorption spectroscopy and Rutherford backscattering for the analysis of amorphous Si-based thin films. 2000 ;
Vancouver

Fantini MC de A, Prado RJ, Scopel WL, Tabacniks MH. Combination of x-ray absorption spectroscopy and Rutherford backscattering for the analysis of amorphous Si-based thin films. 2000 ;