Pavanello, Marcelo Antonio 
; Martino, João Antonio ; Simoen, Eddy ; Claeys, Cor
Fonte: Microelectronic Technology and Devices SBMicro 2004. Proceedings, v. 2003-9. Nome do evento: International Symposium on Microelectronics Technology and Devices SBMICRO. Unidade: EP
Assunto: MICROELETRÔNICA
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ABNT
PAVANELLO, Marcelo Antonio et al. Evaluation of the channel engineering impact on the analog performance of deep-submicrometer partially depleted SOI MOSFETS at low temperatures. 2004, Anais.. Pennington: The Electrochemical Society, 2004. . Acesso em: 15 nov. 2025.APA
Pavanello, M. A., Martino, J. A., Simoen, E., & Claeys, C. (2004). Evaluation of the channel engineering impact on the analog performance of deep-submicrometer partially depleted SOI MOSFETS at low temperatures. In Microelectronic Technology and Devices SBMicro 2004. Proceedings, v. 2003-9. Pennington: The Electrochemical Society.NLM
Pavanello MA, Martino JA, Simoen E, Claeys C. Evaluation of the channel engineering impact on the analog performance of deep-submicrometer partially depleted SOI MOSFETS at low temperatures. Microelectronic Technology and Devices SBMicro 2004. Proceedings, v. 2003-9. 2004 ;[citado 2025 nov. 15 ]Vancouver
Pavanello MA, Martino JA, Simoen E, Claeys C. Evaluation of the channel engineering impact on the analog performance of deep-submicrometer partially depleted SOI MOSFETS at low temperatures. Microelectronic Technology and Devices SBMicro 2004. Proceedings, v. 2003-9. 2004 ;[citado 2025 nov. 15 ]
