Physical characterization and reliability aspects of MuGFETs (2007)
Claeys, Cor 
; Simoen, Eddy ; Rafi, J.M.; Pavanello, Marcelo Antonio ; Martino, João Antonio
Fonte: SBMicro 2007. Nome do evento: International Symposium on Microelectronics Technology and Devices SBMICRO. Unidade: EP
Assunto: MICROELETRÔNICA
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ABNT
CLAEYS, Cor et al. Physical characterization and reliability aspects of MuGFETs. 2007, Anais.. Pennington: The Electrochemical Society, 2007. . Acesso em: 15 nov. 2025.APA
Claeys, C., Simoen, E., Rafi, J. M., Pavanello, M. A., & Martino, J. A. (2007). Physical characterization and reliability aspects of MuGFETs. In SBMicro 2007. Pennington: The Electrochemical Society.NLM
Claeys C, Simoen E, Rafi JM, Pavanello MA, Martino JA. Physical characterization and reliability aspects of MuGFETs. SBMicro 2007. 2007 ;[citado 2025 nov. 15 ]Vancouver
Claeys C, Simoen E, Rafi JM, Pavanello MA, Martino JA. Physical characterization and reliability aspects of MuGFETs. SBMicro 2007. 2007 ;[citado 2025 nov. 15 ]
