Pusep, Yuri A 
; Silva, S W; Galzerani, J C; Lubyshev, D I; Basmaji, Pierre
Source: Scientific Program and Abstracts. Conference titles: Simposio Latino-Americano de Fisica do Estado Solido. Unidade: IFSC
Subjects: MATÉRIA CONDENSADA, MATÉRIA CONDENSADA (PROPRIEDADES ELÉTRICAS), MATÉRIA CONDENSADA
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ABNT
PUSEP, Yuri A et al. Atomic-scale characterization of interfaces in the 'GA''AS' / 'AL''GA''AS' superlattices by raman and fourier transform infrared spectroscopies. 1995, Anais.. Porto Alegre: Ufrgs, 1995. . Acesso em: 28 nov. 2025.APA
Pusep, Y. A., Silva, S. W., Galzerani, J. C., Lubyshev, D. I., & Basmaji, P. (1995). Atomic-scale characterization of interfaces in the 'GA''AS' / 'AL''GA''AS' superlattices by raman and fourier transform infrared spectroscopies. In Scientific Program and Abstracts. Porto Alegre: Ufrgs.NLM
Pusep YA, Silva SW, Galzerani JC, Lubyshev DI, Basmaji P. Atomic-scale characterization of interfaces in the 'GA''AS' / 'AL''GA''AS' superlattices by raman and fourier transform infrared spectroscopies. Scientific Program and Abstracts. 1995 ;[citado 2025 nov. 28 ]Vancouver
Pusep YA, Silva SW, Galzerani JC, Lubyshev DI, Basmaji P. Atomic-scale characterization of interfaces in the 'GA''AS' / 'AL''GA''AS' superlattices by raman and fourier transform infrared spectroscopies. Scientific Program and Abstracts. 1995 ;[citado 2025 nov. 28 ]
