An improved model for the triangular SOI misalignment test structure (2004)
Giacomini, Renato Camargo; Martino, João Antonio 
Fonte: Microelectronics technology and devices SBMicro 2004. Proceedings, v. 2004-03. Nome do evento: Symposium on Microelectronics Technology and Devices SBMICRO. Unidade: EP
Assuntos: MICROELETRÔNICA, ELETROQUÍMICA, CIRCUITOS INTEGRADOS MOS
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GIACOMINI, Renato Camargo e MARTINO, João Antonio. An improved model for the triangular SOI misalignment test structure. 2004, Anais.. Pennington: The Electrochemical Society, 2004. . Acesso em: 16 nov. 2025.APA
Giacomini, R. C., & Martino, J. A. (2004). An improved model for the triangular SOI misalignment test structure. In Microelectronics technology and devices SBMicro 2004. Proceedings, v. 2004-03. Pennington: The Electrochemical Society.NLM
Giacomini RC, Martino JA. An improved model for the triangular SOI misalignment test structure. Microelectronics technology and devices SBMicro 2004. Proceedings, v. 2004-03. 2004 ;[citado 2025 nov. 16 ]Vancouver
Giacomini RC, Martino JA. An improved model for the triangular SOI misalignment test structure. Microelectronics technology and devices SBMicro 2004. Proceedings, v. 2004-03. 2004 ;[citado 2025 nov. 16 ]
