Pavanello, Marcelo Antonio 
; Martino, João Antonio ; Simoen, Eddy ; Claeys, Cor
Source: International Symposium on Silicon-on-Insulator Technology and Devices XII: proceedings. Conference titles: International Symposium on Silicon-on-Insulator Technology and Devices. Unidade: EP
Subjects: MICROELETRÔNICA, CIRCUITOS INTEGRADOS
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PAVANELLO, Marcelo Antonio et al. Analysis of deep submicrometer bulk and fully depleted soi nmosfet analog operation at cryogenic temperatures. International Symposium on Silicon-on-Insulator Technology and Devices XII: proceedings. Tradução . Pennington: The Electrochemical Society, 2005. . . Acesso em: 15 nov. 2025.APA
Pavanello, M. A., Martino, J. A., Simoen, E., & Claeys, C. (2005). Analysis of deep submicrometer bulk and fully depleted soi nmosfet analog operation at cryogenic temperatures. In International Symposium on Silicon-on-Insulator Technology and Devices XII: proceedings. Pennington: The Electrochemical Society.NLM
Pavanello MA, Martino JA, Simoen E, Claeys C. Analysis of deep submicrometer bulk and fully depleted soi nmosfet analog operation at cryogenic temperatures. In: International Symposium on Silicon-on-Insulator Technology and Devices XII: proceedings. Pennington: The Electrochemical Society; 2005. [citado 2025 nov. 15 ]Vancouver
Pavanello MA, Martino JA, Simoen E, Claeys C. Analysis of deep submicrometer bulk and fully depleted soi nmosfet analog operation at cryogenic temperatures. In: International Symposium on Silicon-on-Insulator Technology and Devices XII: proceedings. Pennington: The Electrochemical Society; 2005. [citado 2025 nov. 15 ]
