Navia, Alan Rodrigo; Sonnenberg, Victor 
; Marques, Angelo Eduardo Battistini; Santos Filho, Sebastião Gomes dos ; Martino, João Antonio
Fonte: SBMicro 2000 : proceedings. Nome do evento: International Conference on Microelectronics and Packaging. Unidade: EP
Assunto: CIRCUITOS INTEGRADOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
NAVIA, Alan Rodrigo et al. Electrical characterization of thin nickel films obtained from electroless plating onto aluminum gate of MOS capacitors. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 16 nov. 2025.APA
Navia, A. R., Sonnenberg, V., Marques, A. E. B., Santos Filho, S. G. dos, & Martino, J. A. (2000). Electrical characterization of thin nickel films obtained from electroless plating onto aluminum gate of MOS capacitors. In SBMicro 2000 : proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.NLM
Navia AR, Sonnenberg V, Marques AEB, Santos Filho SG dos, Martino JA. Electrical characterization of thin nickel films obtained from electroless plating onto aluminum gate of MOS capacitors. SBMicro 2000 : proceedings. 2000 ;[citado 2025 nov. 16 ]Vancouver
Navia AR, Sonnenberg V, Marques AEB, Santos Filho SG dos, Martino JA. Electrical characterization of thin nickel films obtained from electroless plating onto aluminum gate of MOS capacitors. SBMicro 2000 : proceedings. 2000 ;[citado 2025 nov. 16 ]
