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Filtros : "Optical Engineering" "FILMES FINOS" Limpar

Filtros

Artigo de periodico
Suitable Er3+-doped tellurite glass-based plasmonic structures for nanophotonic device applications (2018)
Rivera, Victor Anthony Garcia; Ferri, Fabio A.; Gehlen, Marcelo Henrique ; Nunes, Luiz Antônio de Oliveira ; Marega Junior, Euclydes
Source: Optical Engineering. Unidades: IQSC, IFSC
Subjects: VIDRO, FOTOLUMINESCÊNCIA, FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
RIVERA, Victor Anthony Garcia et al. Suitable Er3+-doped tellurite glass-based plasmonic structures for nanophotonic device applications. Optical Engineering, v. 57, n. 8, p. 085102-1-085102-6, 2018Tradução . . Disponível em: https://doi.org/10.1117/1.OE.57.8.085102. Acesso em: 05 dez. 2025.
APA
Rivera, V. A. G., Ferri, F. A., Gehlen, M. H., Nunes, L. A. de O., & Marega Junior, E. (2018). Suitable Er3+-doped tellurite glass-based plasmonic structures for nanophotonic device applications. Optical Engineering, 57( 8), 085102-1-085102-6. doi:10.1117/1.OE.57.8.085102
NLM
Rivera VAG, Ferri FA, Gehlen MH, Nunes LA de O, Marega Junior E. Suitable Er3+-doped tellurite glass-based plasmonic structures for nanophotonic device applications [Internet]. Optical Engineering. 2018 ; 57( 8): 085102-1-085102-6.[citado 2025 dez. 05 ] Available from: https://doi.org/10.1117/1.OE.57.8.085102
Vancouver
Rivera VAG, Ferri FA, Gehlen MH, Nunes LA de O, Marega Junior E. Suitable Er3+-doped tellurite glass-based plasmonic structures for nanophotonic device applications [Internet]. Optical Engineering. 2018 ; 57( 8): 085102-1-085102-6.[citado 2025 dez. 05 ] Available from: https://doi.org/10.1117/1.OE.57.8.085102
Artigo de periodico
Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors (2013)
Wood, Thomas; Le Rouzo, Judikaël; Flory, François; Coudray, Paul; Mastelaro, Valmor Roberto ; Pelissari, Pedro; Zílio, Sérgio Carlos
Source: Optical Engineering. Unidade: IFSC
Subjects: ÓPTICA, FILMES FINOS, BLENDAS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
WOOD, Thomas et al. Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors. Optical Engineering, v. 52, n. 9, p. 094104-1-094104-10, 2013Tradução . . Disponível em: https://doi.org/10.1117/1.OE.52.9.094104. Acesso em: 05 dez. 2025.
APA
Wood, T., Le Rouzo, J., Flory, F., Coudray, P., Mastelaro, V. R., Pelissari, P., & Zílio, S. C. (2013). Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors. Optical Engineering, 52( 9), 094104-1-094104-10. doi:10.1117/1.OE.52.9.094104
NLM
Wood T, Le Rouzo J, Flory F, Coudray P, Mastelaro VR, Pelissari P, Zílio SC. Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors [Internet]. Optical Engineering. 2013 ; 52( 9): 094104-1-094104-10.[citado 2025 dez. 05 ] Available from: https://doi.org/10.1117/1.OE.52.9.094104
Vancouver
Wood T, Le Rouzo J, Flory F, Coudray P, Mastelaro VR, Pelissari P, Zílio SC. Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors [Internet]. Optical Engineering. 2013 ; 52( 9): 094104-1-094104-10.[citado 2025 dez. 05 ] Available from: https://doi.org/10.1117/1.OE.52.9.094104

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