Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors (2013)
- Authors:
- USP affiliated authors: MASTELARO, VALMOR ROBERTO - IFSC ; ZILIO, SÉRGIO CARLOS - IFSC
- Unidade: IFSC
- DOI: 10.1117/1.OE.52.9.094104
- Subjects: ÓPTICA; FILMES FINOS; BLENDAS
- Language: Inglês
- Imprenta:
- Publisher place: Bellingham
- Date published: 2013
- Source:
- Título: Optical Engineering
- ISSN: 0091-3286
- Volume/Número/Paginação/Ano: v. 52, n. 9, p. 094104-1-094104-10, Sept. 2013
- Este periódico é de assinatura
- Este artigo é de acesso aberto
- URL de acesso aberto
- Cor do Acesso Aberto: green
- Licença: other-oa
-
ABNT
WOOD, Thomas et al. Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors. Optical Engineering, v. 52, n. 9, p. 094104-1-094104-10, 2013Tradução . . Disponível em: https://doi.org/10.1117/1.OE.52.9.094104. Acesso em: 02 jan. 2026. -
APA
Wood, T., Le Rouzo, J., Flory, F., Coudray, P., Mastelaro, V. R., Pelissari, P., & Zílio, S. C. (2013). Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors. Optical Engineering, 52( 9), 094104-1-094104-10. doi:10.1117/1.OE.52.9.094104 -
NLM
Wood T, Le Rouzo J, Flory F, Coudray P, Mastelaro VR, Pelissari P, Zílio SC. Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors [Internet]. Optical Engineering. 2013 ; 52( 9): 094104-1-094104-10.[citado 2026 jan. 02 ] Available from: https://doi.org/10.1117/1.OE.52.9.094104 -
Vancouver
Wood T, Le Rouzo J, Flory F, Coudray P, Mastelaro VR, Pelissari P, Zílio SC. Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors [Internet]. Optical Engineering. 2013 ; 52( 9): 094104-1-094104-10.[citado 2026 jan. 02 ] Available from: https://doi.org/10.1117/1.OE.52.9.094104 - Comparison of refractive indices measured by m-lines and ellipsometry: application to polymer blend and ceramic thin films for gas sensors
- Ozone and nitrogen dioxide gas sensor based on a nanostructured SrTi0.85Fe0.15O3 thin film
- XANES study Sr1-yLayTi1-xFexO3 of thin film applied as ozone gas sensor
- Gas sensing properties of Sr'Ti IND. (1-x)''Fe IND. x''O IND. 3' thin films
- Ozone gas sensor based on nanocrystalline SrTi1-xFexO3 thin films
- Nanocrystalline SrTi1-xFexO3 films: ozone and nitrogen dioxide sensing properties
- Gas sensing properties of Sr'Ti IND. 1-x''Fe IND. x''O IND. 3' thin films
- Construcao de filtro birrefringente de placas inclinadas para laser de corante
- Calculo e construcao de filtro birrefringente para uso intracavidade em laser de corante continuo
- Refratômetro diferencial para medida simultânea de brix e sacarose
Informações sobre o DOI: 10.1117/1.OE.52.9.094104 (Fonte: oaDOI API)
Download do texto completo
| Tipo | Nome | Link | |
|---|---|---|---|
| PROD021305_2411779.pdf |
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
