Adhesion forces for mica and silicon oxide surfaces studied by atomic force spectroscopy (2005)
Leite, F. L.; Ziemath, Ervino Carlos; Oliveira Junior, Osvaldo Novais de 
; Herrmann, P. S. P.
Source: Microscopy and Microanalysis. Conference titles: Latin American Symposium on Scanning Probe Microscopy - LASPM. Unidade: IFSC
Subjects: ESPECTROSCOPIA ATÔMICA, NANOTECNOLOGIA, SILÍCIO
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ABNT
LEITE, F. L. et al. Adhesion forces for mica and silicon oxide surfaces studied by atomic force spectroscopy. Microscopy and Microanalysis. New York: Cambridge University Press. . Acesso em: 13 nov. 2025. , 2005APA
Leite, F. L., Ziemath, E. C., Oliveira Junior, O. N. de, & Herrmann, P. S. P. (2005). Adhesion forces for mica and silicon oxide surfaces studied by atomic force spectroscopy. Microscopy and Microanalysis. New York: Cambridge University Press.NLM
Leite FL, Ziemath EC, Oliveira Junior ON de, Herrmann PSP. Adhesion forces for mica and silicon oxide surfaces studied by atomic force spectroscopy. Microscopy and Microanalysis. 2005 ; 11 130-133.[citado 2025 nov. 13 ]Vancouver
Leite FL, Ziemath EC, Oliveira Junior ON de, Herrmann PSP. Adhesion forces for mica and silicon oxide surfaces studied by atomic force spectroscopy. Microscopy and Microanalysis. 2005 ; 11 130-133.[citado 2025 nov. 13 ]
