Adhesion forces for mica and silicon oxide surfaces studied by atomic force spectroscopy

Adhesion forces for mica and silicon oxide surfaces studied by atomic force spectroscopy (2005)

Authors:
Autor USP: OLIVEIRA JUNIOR, OSVALDO NOVAIS DE - IFSC
Unidade: IFSC
Subjects: ESPECTROSCOPIA ATÔMICA; NANOTECNOLOGIA; SILÍCIO
Language: Português
Imprenta:
- Publisher: Cambridge University Press
- Publisher place: New York
- Date published: 2005
Source:
- Título: Microscopy and Microanalysis
- ISSN: 1431-9276
- Volume/Número/Paginação/Ano: v. 11, supl. S03, p. 130-133, Dec. 2005
Conference titles: Latin American Symposium on Scanning Probe Microscopy - LASPM

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ABNT

LEITE, F. L. et al. Adhesion forces for mica and silicon oxide surfaces studied by atomic force spectroscopy. Microscopy and Microanalysis. New York: Cambridge University Press. . Acesso em: 02 dez. 2025. , 2005
APA

Leite, F. L., Ziemath, E. C., Oliveira Junior, O. N. de, & Herrmann, P. S. P. (2005). Adhesion forces for mica and silicon oxide surfaces studied by atomic force spectroscopy. Microscopy and Microanalysis. New York: Cambridge University Press.
NLM

Leite FL, Ziemath EC, Oliveira Junior ON de, Herrmann PSP. Adhesion forces for mica and silicon oxide surfaces studied by atomic force spectroscopy. Microscopy and Microanalysis. 2005 ; 11 130-133.[citado 2025 dez. 02 ]
Vancouver

Leite FL, Ziemath EC, Oliveira Junior ON de, Herrmann PSP. Adhesion forces for mica and silicon oxide surfaces studied by atomic force spectroscopy. Microscopy and Microanalysis. 2005 ; 11 130-133.[citado 2025 dez. 02 ]