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Filtros : "Microscopy and Microanalysis" "Gliemann, H." Limpar

Filtros

Artigo de periodico
Characterization of PMMA/PVB blend films by means of AFM (2005)
Almeida, Arlete Tavares; Gliemann, H.; Schimmel, Thomas; Petri, Denise Freitas Siqueira
Fonte: Microscopy and Microanalysis. Unidade: IQ
Assuntos: POLÍMEROS (MATERIAIS), MICROSCOPIA, FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
ALMEIDA, Arlete Tavares et al. Characterization of PMMA/PVB blend films by means of AFM. Microscopy and Microanalysis, v. 11, p. 70-73, 2005Tradução . . Acesso em: 16 nov. 2025.
APA
Almeida, A. T., Gliemann, H., Schimmel, T., & Petri, D. F. S. (2005). Characterization of PMMA/PVB blend films by means of AFM. Microscopy and Microanalysis, 11, 70-73.
NLM
Almeida AT, Gliemann H, Schimmel T, Petri DFS. Characterization of PMMA/PVB blend films by means of AFM. Microscopy and Microanalysis. 2005 ; 11 70-73.[citado 2025 nov. 16 ]
Vancouver
Almeida AT, Gliemann H, Schimmel T, Petri DFS. Characterization of PMMA/PVB blend films by means of AFM. Microscopy and Microanalysis. 2005 ; 11 70-73.[citado 2025 nov. 16 ]
Artigo de periodico
Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data (2005)
Pancera, Sabrina Montero; Gliemann, H.; Petri, Denise Freitas Siqueira ; Schimmel, Thomas
Fonte: Microscopy and Microanalysis. Unidade: IQ
Assuntos: ADSORÇÃO, MICROSCOPIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
PANCERA, Sabrina Montero et al. Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data. Microscopy and Microanalysis, v. 11, p. 70-73, 2005Tradução . . Acesso em: 16 nov. 2025.
APA
Pancera, S. M., Gliemann, H., Petri, D. F. S., & Schimmel, T. (2005). Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data. Microscopy and Microanalysis, 11, 70-73.
NLM
Pancera SM, Gliemann H, Petri DFS, Schimmel T. Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data. Microscopy and Microanalysis. 2005 ; 11 70-73.[citado 2025 nov. 16 ]
Vancouver
Pancera SM, Gliemann H, Petri DFS, Schimmel T. Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data. Microscopy and Microanalysis. 2005 ; 11 70-73.[citado 2025 nov. 16 ]

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