Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data (2005)
- Authors:
- Autor USP: PETRI, DENISE FREITAS SIQUEIRA - IQ
- Unidade: IQ
- Subjects: ADSORÇÃO; MICROSCOPIA
- Language: Inglês
- Imprenta:
- Source:
- Título: Microscopy and Microanalysis
- ISSN: 1431-9276
- Volume/Número/Paginação/Ano: v. 11, supp. 3, p. 70-73, 2005
-
ABNT
PANCERA, Sabrina Montero et al. Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data. Microscopy and Microanalysis, v. 11, p. 70-73, 2005Tradução . . Acesso em: 17 out. 2024. -
APA
Pancera, S. M., Gliemann, H., Petri, D. F. S., & Schimmel, T. (2005). Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data. Microscopy and Microanalysis, 11, 70-73. -
NLM
Pancera SM, Gliemann H, Petri DFS, Schimmel T. Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data. Microscopy and Microanalysis. 2005 ; 11 70-73.[citado 2024 out. 17 ] -
Vancouver
Pancera SM, Gliemann H, Petri DFS, Schimmel T. Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data. Microscopy and Microanalysis. 2005 ; 11 70-73.[citado 2024 out. 17 ] - Amino-terminated self-assembled monolayers on 'Si''O IND. 2' and their interaction with chromophores, proteins and ionomers
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