Experimental behavior of line-TFET applied to low-dropout voltage regulator (2022)
Silva, Wenita de Lima; Agopian, Paula Ghedini Der 
; Martino, João Antonio
Source: SBMICRO: proceedings. Conference titles: Symposium on Microelectronics Technology. Unidade: EP
Subjects: SEMICONDUTORES, ESTABILIDADE, CIRCUITOS ANALÓGICOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SILVA, Wenita de Lima e AGOPIAN, Paula Ghedini Der e MARTINO, João Antonio. Experimental behavior of line-TFET applied to low-dropout voltage regulator. 2022, Anais.. [s.L.]: IEEE, 2022. Disponível em: https://doi.org/10.1109/SBMICRO55822.2022.9881041. Acesso em: 05 dez. 2025.APA
Silva, W. de L., Agopian, P. G. D., & Martino, J. A. (2022). Experimental behavior of line-TFET applied to low-dropout voltage regulator. In SBMICRO: proceedings. [s.L.]: IEEE. doi:10.1109/SBMICRO55822.2022.9881041NLM
Silva W de L, Agopian PGD, Martino JA. Experimental behavior of line-TFET applied to low-dropout voltage regulator [Internet]. SBMICRO: proceedings. 2022 ;[citado 2025 dez. 05 ] Available from: https://doi.org/10.1109/SBMICRO55822.2022.9881041Vancouver
Silva W de L, Agopian PGD, Martino JA. Experimental behavior of line-TFET applied to low-dropout voltage regulator [Internet]. SBMICRO: proceedings. 2022 ;[citado 2025 dez. 05 ] Available from: https://doi.org/10.1109/SBMICRO55822.2022.9881041
