Fonte: Applied Surface Science. Unidade: IFSC
Assuntos: FILMES FINOS, ESPECTROSCOPIA RAMAN, VIDRO, TUNGSTÊNIO
ABNT
MONTANARI, Bianca et al. Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy. Applied Surface Science, v. 254, n. 17, p. 5552-5556, 2008Tradução . . Disponível em: https://doi.org/10.1016/j.apsusc.2008.02.107. Acesso em: 09 nov. 2025.APA
Montanari, B., Barbosa, A. J., Ribeiro, S. J. L., Messaddeq, Y., Poirier, G., & Siu Li, M. (2008). Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy. Applied Surface Science, 254( 17), 5552-5556. doi:10.1016/j.apsusc.2008.02.107NLM
Montanari B, Barbosa AJ, Ribeiro SJL, Messaddeq Y, Poirier G, Siu Li M. Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy [Internet]. Applied Surface Science. 2008 ; 254( 17): 5552-5556.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1016/j.apsusc.2008.02.107Vancouver
Montanari B, Barbosa AJ, Ribeiro SJL, Messaddeq Y, Poirier G, Siu Li M. Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy [Internet]. Applied Surface Science. 2008 ; 254( 17): 5552-5556.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1016/j.apsusc.2008.02.107
