Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy (2008)
- Authors:
- Autor USP: LI, MAXIMO SIU - IFSC
- Unidade: IFSC
- DOI: 10.1016/j.apsusc.2008.02.107
- Subjects: FILMES FINOS; ESPECTROSCOPIA RAMAN; VIDRO; TUNGSTÊNIO
- Language: Inglês
- Imprenta:
- Source:
- Título: Applied Surface Science
- ISSN: 0169-4332
- Volume/Número/Paginação/Ano: v. 254, n. 17, p. 5552-5556, June 2008
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
MONTANARI, Bianca et al. Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy. Applied Surface Science, v. 254, n. 17, p. 5552-5556, 2008Tradução . . Disponível em: https://doi.org/10.1016/j.apsusc.2008.02.107. Acesso em: 14 nov. 2024. -
APA
Montanari, B., Barbosa, A. J., Ribeiro, S. J. L., Messaddeq, Y., Poirier, G., & Siu Li, M. (2008). Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy. Applied Surface Science, 254( 17), 5552-5556. doi:10.1016/j.apsusc.2008.02.107 -
NLM
Montanari B, Barbosa AJ, Ribeiro SJL, Messaddeq Y, Poirier G, Siu Li M. Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy [Internet]. Applied Surface Science. 2008 ; 254( 17): 5552-5556.[citado 2024 nov. 14 ] Available from: https://doi.org/10.1016/j.apsusc.2008.02.107 -
Vancouver
Montanari B, Barbosa AJ, Ribeiro SJL, Messaddeq Y, Poirier G, Siu Li M. Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absortion spectroscopy [Internet]. Applied Surface Science. 2008 ; 254( 17): 5552-5556.[citado 2024 nov. 14 ] Available from: https://doi.org/10.1016/j.apsusc.2008.02.107 - Efficient manufacture of CaMoO4:Tb3+ nanospheres by ultrasonic spray pyrolysis
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Informações sobre o DOI: 10.1016/j.apsusc.2008.02.107 (Fonte: oaDOI API)
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