Zanatta, Antonio Ricardo 
; Cemin, F.; Echeverrigaray, F. G.; Alvarez, F.
Source: Journal of Materials Research and Technology. Unidade: IFSC
Subjects: FILMES FINOS, TITÂNIO, ESPECTROSCOPIA RAMAN
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ZANATTA, Antonio Ricardo et al. On the relationship between the Raman scattering features and the Ti-related chemical states of TixOyNz films. Journal of Materials Research and Technology, v. 14, p. 864-870, 2021Tradução . . Disponível em: https://doi.org/10.1016/j.jmrt.2021.06.090. Acesso em: 08 out. 2025.APA
Zanatta, A. R., Cemin, F., Echeverrigaray, F. G., & Alvarez, F. (2021). On the relationship between the Raman scattering features and the Ti-related chemical states of TixOyNz films. Journal of Materials Research and Technology, 14, 864-870. doi:10.1016/j.jmrt.2021.06.090NLM
Zanatta AR, Cemin F, Echeverrigaray FG, Alvarez F. On the relationship between the Raman scattering features and the Ti-related chemical states of TixOyNz films [Internet]. Journal of Materials Research and Technology. 2021 ; 14 864-870.[citado 2025 out. 08 ] Available from: https://doi.org/10.1016/j.jmrt.2021.06.090Vancouver
Zanatta AR, Cemin F, Echeverrigaray FG, Alvarez F. On the relationship between the Raman scattering features and the Ti-related chemical states of TixOyNz films [Internet]. Journal of Materials Research and Technology. 2021 ; 14 864-870.[citado 2025 out. 08 ] Available from: https://doi.org/10.1016/j.jmrt.2021.06.090
