Rodrigues, Debora Cristina da Silva; Oliveira, Gabriel Ferrari de; Romero, André Luis dos Santos 
; Vieira, Nirton Cristi Silva ; Vivas, Marcelo Gonçalves
Source: Sensors and Actuators A. Unidade: IFSC
Subjects: SENSORES QUÍMICOS, FILMES FINOS, DIELÉTRICOS
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RODRIGUES, Debora Cristina da Silva et al. Surface plasmon resonance spectrometer in the double prism configuration: fast characterization of the thickness and dielectric constant dispersion of thin films. Sensors and Actuators A, v. 381, n. Ja 2025, p. 116067-1-116067-11 + supplementary material, 2025Tradução . . Disponível em: https://doi.org/10.1016/j.sna.2024.116067. Acesso em: 08 out. 2025.APA
Rodrigues, D. C. da S., Oliveira, G. F. de, Romero, A. L. dos S., Vieira, N. C. S., & Vivas, M. G. (2025). Surface plasmon resonance spectrometer in the double prism configuration: fast characterization of the thickness and dielectric constant dispersion of thin films. Sensors and Actuators A, 381( Ja 2025), 116067-1-116067-11 + supplementary material. doi:10.1016/j.sna.2024.116067NLM
Rodrigues DC da S, Oliveira GF de, Romero AL dos S, Vieira NCS, Vivas MG. Surface plasmon resonance spectrometer in the double prism configuration: fast characterization of the thickness and dielectric constant dispersion of thin films [Internet]. Sensors and Actuators A. 2025 ; 381( Ja 2025): 116067-1-116067-11 + supplementary material.[citado 2025 out. 08 ] Available from: https://doi.org/10.1016/j.sna.2024.116067Vancouver
Rodrigues DC da S, Oliveira GF de, Romero AL dos S, Vieira NCS, Vivas MG. Surface plasmon resonance spectrometer in the double prism configuration: fast characterization of the thickness and dielectric constant dispersion of thin films [Internet]. Sensors and Actuators A. 2025 ; 381( Ja 2025): 116067-1-116067-11 + supplementary material.[citado 2025 out. 08 ] Available from: https://doi.org/10.1016/j.sna.2024.116067
