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Filtros : "JASINEVICIUS, RENATO GOULART" "2008" Removido: "Brasil" Limpar

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Artigo de periodico
The influence of crystallographic orientation on the generation of multiple structural phases generation in silicon by cyclic microindentation (2008)
Jasinevicius, Renato Goulart; Duduch, Jaime Gilberto; Pizani, Paulo Sérgio
Source: Materials Letters. Unidade: EESC
Assunto: ESTRUTURA DOS SÓLIDOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
JASINEVICIUS, Renato Goulart e DUDUCH, Jaime Gilberto e PIZANI, Paulo Sérgio. The influence of crystallographic orientation on the generation of multiple structural phases generation in silicon by cyclic microindentation. Materials Letters, v. 62, n. 6-7, p. 812-815, 2008Tradução . . Disponível em: https://doi.org/10.1016/j.matlet.2007.06.071. Acesso em: 02 out. 2024.
APA
Jasinevicius, R. G., Duduch, J. G., & Pizani, P. S. (2008). The influence of crystallographic orientation on the generation of multiple structural phases generation in silicon by cyclic microindentation. Materials Letters, 62( 6-7), 812-815. doi:10.1016/j.matlet.2007.06.071
NLM
Jasinevicius RG, Duduch JG, Pizani PS. The influence of crystallographic orientation on the generation of multiple structural phases generation in silicon by cyclic microindentation [Internet]. Materials Letters. 2008 ; 62( 6-7): 812-815.[citado 2024 out. 02 ] Available from: https://doi.org/10.1016/j.matlet.2007.06.071
Vancouver
Jasinevicius RG, Duduch JG, Pizani PS. The influence of crystallographic orientation on the generation of multiple structural phases generation in silicon by cyclic microindentation [Internet]. Materials Letters. 2008 ; 62( 6-7): 812-815.[citado 2024 out. 02 ] Available from: https://doi.org/10.1016/j.matlet.2007.06.071
Artigo de periodico
Phase transformation and residual stress probed by Raman spectroscopy in diamond-turned single crystal silicon (2008)
Jasinevicius, Renato Goulart; Duduch, Jaime Gilberto; Montanari, Luciana; Pizani, Paulo Sérgio
Source: Proceedings of Institution of Mechanical Engineers. Part B. Journal of Engineering Manufacture. Unidade: EESC
Subjects: MUDANÇA DE FASE, ESPECTROSCOPIA RAMAN
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
JASINEVICIUS, Renato Goulart et al. Phase transformation and residual stress probed by Raman spectroscopy in diamond-turned single crystal silicon. Proceedings of Institution of Mechanical Engineers. Part B. Journal of Engineering Manufacture, v. 222, n. 9, p. 1065-1073, 2008Tradução . . Disponível em: https://doi.org/10.1243/09544054JEM1161. Acesso em: 02 out. 2024.
APA
Jasinevicius, R. G., Duduch, J. G., Montanari, L., & Pizani, P. S. (2008). Phase transformation and residual stress probed by Raman spectroscopy in diamond-turned single crystal silicon. Proceedings of Institution of Mechanical Engineers. Part B. Journal of Engineering Manufacture, 222( 9), 1065-1073. doi:10.1243/09544054JEM1161
NLM
Jasinevicius RG, Duduch JG, Montanari L, Pizani PS. Phase transformation and residual stress probed by Raman spectroscopy in diamond-turned single crystal silicon [Internet]. Proceedings of Institution of Mechanical Engineers. Part B. Journal of Engineering Manufacture. 2008 ; 222( 9): 1065-1073.[citado 2024 out. 02 ] Available from: https://doi.org/10.1243/09544054JEM1161
Vancouver
Jasinevicius RG, Duduch JG, Montanari L, Pizani PS. Phase transformation and residual stress probed by Raman spectroscopy in diamond-turned single crystal silicon [Internet]. Proceedings of Institution of Mechanical Engineers. Part B. Journal of Engineering Manufacture. 2008 ; 222( 9): 1065-1073.[citado 2024 out. 02 ] Available from: https://doi.org/10.1243/09544054JEM1161

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