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Filtros : "JASINEVICIUS, RENATO GOULART" "Suiça" Removido: "2011" Limpar

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  • Artigo de periodico

    Diffraction gratings fabricated in DLC thin films (2010)

    Cirino, Giuseppe Antonio; Mansano, Ronaldo Domingues ; Verdonck, Patrick Bernard; Jasinevicius, Renato Goulart; Gonçalves Neto, Luiz

    Source: Surface and Coatings Technology. Unidades: EP, EESC

    Subjects: HOLOGRAMAS, ANÁLISE DE FOURIER, ÓPTICA

    Acesso à fonteAcesso à fonteDOIHow to cite
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    • ABNT

      CIRINO, Giuseppe Antonio et al. Diffraction gratings fabricated in DLC thin films. Surface and Coatings Technology, v. 204, n. 18-19, p. 2966-2970, 2010Tradução . . Disponível em: https://doi.org/10.1016/j.surfcoat.2010.02.037. Acesso em: 02 out. 2024.

    • APA

      Cirino, G. A., Mansano, R. D., Verdonck, P. B., Jasinevicius, R. G., & Gonçalves Neto, L. (2010). Diffraction gratings fabricated in DLC thin films. Surface and Coatings Technology, 204( 18-19), 2966-2970. doi:10.1016/j.surfcoat.2010.02.037

    • NLM

      Cirino GA, Mansano RD, Verdonck PB, Jasinevicius RG, Gonçalves Neto L. Diffraction gratings fabricated in DLC thin films [Internet]. Surface and Coatings Technology. 2010 ; 204( 18-19): 2966-2970.[citado 2024 out. 02 ] Available from: https://doi.org/10.1016/j.surfcoat.2010.02.037

    • Vancouver

      Cirino GA, Mansano RD, Verdonck PB, Jasinevicius RG, Gonçalves Neto L. Diffraction gratings fabricated in DLC thin films [Internet]. Surface and Coatings Technology. 2010 ; 204( 18-19): 2966-2970.[citado 2024 out. 02 ] Available from: https://doi.org/10.1016/j.surfcoat.2010.02.037

  • Artigo de periodico

    Influence of cutting conditions scaling in the machining of semiconductors crystals with single point diamond tool (2006)

    Jasinevicius, Renato Goulart

    Source: Journal of Materials Processing Technology. Unidade: EESC

    Assunto: SEMICONDUTORES

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    • ABNT

      JASINEVICIUS, Renato Goulart. Influence of cutting conditions scaling in the machining of semiconductors crystals with single point diamond tool. Journal of Materials Processing Technology, v. 179, n. 1-3, p. 11-116, 2006Tradução . . Disponível em: https://doi.org/10.1016/j.jmatprotec.2006.03.106. Acesso em: 02 out. 2024.

    • APA

      Jasinevicius, R. G. (2006). Influence of cutting conditions scaling in the machining of semiconductors crystals with single point diamond tool. Journal of Materials Processing Technology, 179( 1-3), 11-116. doi:10.1016/j.jmatprotec.2006.03.106

    • NLM

      Jasinevicius RG. Influence of cutting conditions scaling in the machining of semiconductors crystals with single point diamond tool [Internet]. Journal of Materials Processing Technology. 2006 ; 179( 1-3): 11-116.[citado 2024 out. 02 ] Available from: https://doi.org/10.1016/j.jmatprotec.2006.03.106

    • Vancouver

      Jasinevicius RG. Influence of cutting conditions scaling in the machining of semiconductors crystals with single point diamond tool [Internet]. Journal of Materials Processing Technology. 2006 ; 179( 1-3): 11-116.[citado 2024 out. 02 ] Available from: https://doi.org/10.1016/j.jmatprotec.2006.03.106

  • Artigo de periodico

    Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering (2006)

    Pizani, Paulo Sérgio; Jasinevicius, Renato Goulart; Zanatta, Ricardo Antonio

    Source: Defect and Diffusion Forum. Unidades: EESC, IFSC

    Subjects: SILICONE, ESPECTROSCOPIA RAMAN, MUDANÇA DE FASE

    How to cite
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    • ABNT

      PIZANI, Paulo Sérgio e JASINEVICIUS, Renato Goulart e ZANATTA, Ricardo Antonio. Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering. Defect and Diffusion Forum, v. 258-260, p. 276-281, 2006Tradução . . Acesso em: 02 out. 2024.

    • APA

      Pizani, P. S., Jasinevicius, R. G., & Zanatta, R. A. (2006). Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering. Defect and Diffusion Forum, 258-260, 276-281.

    • NLM

      Pizani PS, Jasinevicius RG, Zanatta RA. Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering. Defect and Diffusion Forum. 2006 ; 258-260 276-281.[citado 2024 out. 02 ]

    • Vancouver

      Pizani PS, Jasinevicius RG, Zanatta RA. Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering. Defect and Diffusion Forum. 2006 ; 258-260 276-281.[citado 2024 out. 02 ]
  • 1

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