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Trabalho de evento-resumo
A simple mechanical NMR analog for teaching basic principles of signal detection and processing (2023)
Trebbi, Bruno; Nunes, Luiz Antônio de Oliveira ; Azevêdo, Eduardo Ribeiro de
Source: Anais eletrônicos. Conference titles: NMR Users Meeting. Unidade: IFSC
Subjects: FÍSICA DA MATÉRIA CONDENSADA, ELETROMAGNETISMO, RESSONÂNCIA MAGNÉTICA NUCLEAR
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ABNT
TREBBI, Bruno e NUNES, Luiz Antônio de Oliveira e AZEVÊDO, Eduardo Ribeiro de. A simple mechanical NMR analog for teaching basic principles of signal detection and processing. 2023, Anais.. Campinas: Galoá, 2023. Disponível em: https://proceedings.science/nmrmeeting/19nmrmeeting-2023/papers/a-simple-mechanical-nmr-analog-for-teaching-basic-principles-of-signal-detection?lang=en. Acesso em: 19 jul. 2024.
APA
Trebbi, B., Nunes, L. A. de O., & Azevêdo, E. R. de. (2023). A simple mechanical NMR analog for teaching basic principles of signal detection and processing. In Anais eletrônicos. Campinas: Galoá. Recuperado de https://proceedings.science/nmrmeeting/19nmrmeeting-2023/papers/a-simple-mechanical-nmr-analog-for-teaching-basic-principles-of-signal-detection?lang=en
NLM
Trebbi B, Nunes LA de O, Azevêdo ER de. A simple mechanical NMR analog for teaching basic principles of signal detection and processing [Internet]. Anais eletrônicos. 2023 ;[citado 2024 jul. 19 ] Available from: https://proceedings.science/nmrmeeting/19nmrmeeting-2023/papers/a-simple-mechanical-nmr-analog-for-teaching-basic-principles-of-signal-detection?lang=en
Vancouver
Trebbi B, Nunes LA de O, Azevêdo ER de. A simple mechanical NMR analog for teaching basic principles of signal detection and processing [Internet]. Anais eletrônicos. 2023 ;[citado 2024 jul. 19 ] Available from: https://proceedings.science/nmrmeeting/19nmrmeeting-2023/papers/a-simple-mechanical-nmr-analog-for-teaching-basic-principles-of-signal-detection?lang=en
Trabalho de evento-resumo
Numerical studies of the dependence of the Z-scan signal with detection aperture (2019)
Oliveira, Paulo Cesar de; Cruz, Renato Antonio; Chaves, Anderson Silva; Catunda, Tomaz ; Moncorgé, Richard
Source: Resumos. Conference titles: Encontro de Físicos do Norte e Nordeste - EFNNE. Unidade: IFSC
Subjects: ÓPTICA (PROPRIEDADES), MATERIAIS ÓPTICOS, EMISSÃO DA LUZ
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ABNT
OLIVEIRA, Paulo Cesar de et al. Numerical studies of the dependence of the Z-scan signal with detection aperture. 2019, Anais.. São Paulo: Sociedade Brasileira de Física - SBF, 2019. Disponível em: https://sec.sbfisica.org.br/eventos/efnne/xxxiv/sys/resumos/R0397-1.pdf. Acesso em: 19 jul. 2024.
APA
Oliveira, P. C. de, Cruz, R. A., Chaves, A. S., Catunda, T., & Moncorgé, R. (2019). Numerical studies of the dependence of the Z-scan signal with detection aperture. In Resumos. São Paulo: Sociedade Brasileira de Física - SBF. Recuperado de https://sec.sbfisica.org.br/eventos/efnne/xxxiv/sys/resumos/R0397-1.pdf
NLM
Oliveira PC de, Cruz RA, Chaves AS, Catunda T, Moncorgé R. Numerical studies of the dependence of the Z-scan signal with detection aperture [Internet]. Resumos. 2019 ;[citado 2024 jul. 19 ] Available from: https://sec.sbfisica.org.br/eventos/efnne/xxxiv/sys/resumos/R0397-1.pdf
Vancouver
Oliveira PC de, Cruz RA, Chaves AS, Catunda T, Moncorgé R. Numerical studies of the dependence of the Z-scan signal with detection aperture [Internet]. Resumos. 2019 ;[citado 2024 jul. 19 ] Available from: https://sec.sbfisica.org.br/eventos/efnne/xxxiv/sys/resumos/R0397-1.pdf
Artigo de periodico
Influence of nonradiative Auger process in the lanthanide complexes lifetime near interfaces in organic light-emitting diode structures (2019)
Pereira, Alessandra; Conte, Gilmar; Faceto, Angelo Danilo; Nunes, Luiz Antônio de Oliveira; Quirino, Welber G.; Legnani, Cristiano; Gallardo, Hugo; Cremona, Marco; Bechtold, Ivan H.; Guimarães, Francisco Eduardo Gontijo
Source: Journal of Applied Physics. Unidade: IFSC
Subjects: LUMINESCÊNCIA, EMISSÃO DA LUZ, FILMES FINOS, ÓPTICA NÃO LINEAR
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ABNT
PEREIRA, Alessandra et al. Influence of nonradiative Auger process in the lanthanide complexes lifetime near interfaces in organic light-emitting diode structures. Journal of Applied Physics, v. 126, n. 16, p. 165501-1-165501-9, 2019Tradução . . Disponível em: https://doi.org/10.1063/1.5099014. Acesso em: 19 jul. 2024.
APA
Pereira, A., Conte, G., Faceto, A. D., Nunes, L. A. de O., Quirino, W. G., Legnani, C., et al. (2019). Influence of nonradiative Auger process in the lanthanide complexes lifetime near interfaces in organic light-emitting diode structures. Journal of Applied Physics, 126( 16), 165501-1-165501-9. doi:10.1063/1.5099014
NLM
Pereira A, Conte G, Faceto AD, Nunes LA de O, Quirino WG, Legnani C, Gallardo H, Cremona M, Bechtold IH, Guimarães FEG. Influence of nonradiative Auger process in the lanthanide complexes lifetime near interfaces in organic light-emitting diode structures [Internet]. Journal of Applied Physics. 2019 ; 126( 16): 165501-1-165501-9.[citado 2024 jul. 19 ] Available from: https://doi.org/10.1063/1.5099014
Vancouver
Pereira A, Conte G, Faceto AD, Nunes LA de O, Quirino WG, Legnani C, Gallardo H, Cremona M, Bechtold IH, Guimarães FEG. Influence of nonradiative Auger process in the lanthanide complexes lifetime near interfaces in organic light-emitting diode structures [Internet]. Journal of Applied Physics. 2019 ; 126( 16): 165501-1-165501-9.[citado 2024 jul. 19 ] Available from: https://doi.org/10.1063/1.5099014
Trabalho de evento-resumo
Common engineering students' difficulties with DC electric circuits in an inquiry-based laboratory (2018)
Sanches, Victor Travagin; Costa, Gláucia Gruninger Gomes; Santos, Jéssica Fabiana Mariano dos; Catunda, Tomaz
Source: Proceedings. Conference titles: International Conference on Alive Engineering Education - ICAEEdu. Unidades: IFSC, ENSINO CIÊNCIAS, EESC
Subjects: CIRCUITOS ELÉTRICOS, EXPERIMENTOS CIENTÍFICOS, ENSINO, APRENDIZAGEM
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ABNT
SANCHES, Victor Travagin et al. Common engineering students' difficulties with DC electric circuits in an inquiry-based laboratory. 2018, Anais.. Goiânia: Universidade Federal de Goiás - UFG, 2018. Disponível em: https://files.cercomp.ufg.br/weby/up/920/o/ICAEEdu-2018-Proceedings-ISBN_-978-85-495-0267-4-Online-Resource.pdf. Acesso em: 19 jul. 2024.
APA
Sanches, V. T., Costa, G. G. G., Santos, J. F. M. dos, & Catunda, T. (2018). Common engineering students' difficulties with DC electric circuits in an inquiry-based laboratory. In Proceedings. Goiânia: Universidade Federal de Goiás - UFG. Recuperado de https://files.cercomp.ufg.br/weby/up/920/o/ICAEEdu-2018-Proceedings-ISBN_-978-85-495-0267-4-Online-Resource.pdf
NLM
Sanches VT, Costa GGG, Santos JFM dos, Catunda T. Common engineering students' difficulties with DC electric circuits in an inquiry-based laboratory [Internet]. Proceedings. 2018 ;[citado 2024 jul. 19 ] Available from: https://files.cercomp.ufg.br/weby/up/920/o/ICAEEdu-2018-Proceedings-ISBN_-978-85-495-0267-4-Online-Resource.pdf
Vancouver
Sanches VT, Costa GGG, Santos JFM dos, Catunda T. Common engineering students' difficulties with DC electric circuits in an inquiry-based laboratory [Internet]. Proceedings. 2018 ;[citado 2024 jul. 19 ] Available from: https://files.cercomp.ufg.br/weby/up/920/o/ICAEEdu-2018-Proceedings-ISBN_-978-85-495-0267-4-Online-Resource.pdf
Artigo de periodico
Analysis of engineering students' common di culties with DC electric circuits in an inquiry-based laboratory (2018)
Sanches, Victor Travagin; Costa, Gláucia Gomes Grüninger; Santos, Jéssica Fabiana Mariano dos; Catunda, Tomaz
Source: International Journal on Alive Engineering Education. Unidades: IFSC, ENSINO CIÊNCIAS, EESC
Subjects: CIRCUITOS ELÉTRICOS, LABORATÓRIOS, FÍSICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SANCHES, Victor Travagin et al. Analysis of engineering students' common di culties with DC electric circuits in an inquiry-based laboratory. International Journal on Alive Engineering Education, v. 2, n. 5, p. 14-22, 2018Tradução . . Disponível em: https://doi.org/10.5216/ijaeedu.v5i2.54738. Acesso em: 19 jul. 2024.
APA
Sanches, V. T., Costa, G. G. G., Santos, J. F. M. dos, & Catunda, T. (2018). Analysis of engineering students' common di culties with DC electric circuits in an inquiry-based laboratory. International Journal on Alive Engineering Education, 2( 5), 14-22. doi:10.5216/ijaeedu.v5i2.54738
NLM
Sanches VT, Costa GGG, Santos JFM dos, Catunda T. Analysis of engineering students' common di culties with DC electric circuits in an inquiry-based laboratory [Internet]. International Journal on Alive Engineering Education. 2018 ; 2( 5): 14-22.[citado 2024 jul. 19 ] Available from: https://doi.org/10.5216/ijaeedu.v5i2.54738
Vancouver
Sanches VT, Costa GGG, Santos JFM dos, Catunda T. Analysis of engineering students' common di culties with DC electric circuits in an inquiry-based laboratory [Internet]. International Journal on Alive Engineering Education. 2018 ; 2( 5): 14-22.[citado 2024 jul. 19 ] Available from: https://doi.org/10.5216/ijaeedu.v5i2.54738

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