Source: Microscopy and Microanalysis. Unidade: IQ
Subjects: ADSORÇÃO, MICROSCOPIA
ABNT
PANCERA, Sabrina Montero et al. Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data. Microscopy and Microanalysis, v. 11, p. 70-73, 2005Tradução . . Acesso em: 17 out. 2024.APA
Pancera, S. M., Gliemann, H., Petri, D. F. S., & Schimmel, T. (2005). Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data. Microscopy and Microanalysis, 11, 70-73.NLM
Pancera SM, Gliemann H, Petri DFS, Schimmel T. Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data. Microscopy and Microanalysis. 2005 ; 11 70-73.[citado 2024 out. 17 ]Vancouver
Pancera SM, Gliemann H, Petri DFS, Schimmel T. Adsorption behaviour of creatine phosphokinase onto silicon wafers: comparison between ellipsometric and atomic force microscopy data. Microscopy and Microanalysis. 2005 ; 11 70-73.[citado 2024 out. 17 ]