New opportunities in X-ray characterization of semiconductors (2003)
Source: Book of Abstracts. Conference titles: International Conference on Defects in Semiconductors. Unidade: IF
Subjects: SEMICONDUTORES, RAIOS X
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MORELHÃO, Sérgio Luiz. New opportunities in X-ray characterization of semiconductors. 2003, Anais.. Amsterdam: Elsevier Science, 2003. . Acesso em: 18 out. 2024.APA
Morelhão, S. L. (2003). New opportunities in X-ray characterization of semiconductors. In Book of Abstracts. Amsterdam: Elsevier Science.NLM
Morelhão SL. New opportunities in X-ray characterization of semiconductors. Book of Abstracts. 2003 ;[citado 2024 out. 18 ]Vancouver
Morelhão SL. New opportunities in X-ray characterization of semiconductors. Book of Abstracts. 2003 ;[citado 2024 out. 18 ]