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Artigo de periodico
Direct observation of tetragonal distortion in epitaxial structures through secondary peak split in a synchrotron radiation renninger scan (2010)
Menezes, Alan S de; Santos, Adenilson Oliveira dos; Almeida, Juliana M A; Bortoleto, José R R; Cotta, Mônica A; Morelhão, Sérgio Luiz; Cardoso, Lisandro P
Source: Crystal Growth & Design. Unidade: IF
Assunto: DIFRAÇÃO POR RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MENEZES, Alan S de et al. Direct observation of tetragonal distortion in epitaxial structures through secondary peak split in a synchrotron radiation renninger scan. Crystal Growth & Design, v. 10, n. 8, p. 3436-3441, 2010Tradução . . Disponível em: http://pubs.acs.org/doi/pdf/10.1021/cg100146x. Acesso em: 18 out. 2024.
APA
Menezes, A. S. de, Santos, A. O. dos, Almeida, J. M. A., Bortoleto, J. R. R., Cotta, M. A., Morelhão, S. L., & Cardoso, L. P. (2010). Direct observation of tetragonal distortion in epitaxial structures through secondary peak split in a synchrotron radiation renninger scan. Crystal Growth & Design, 10( 8), 3436-3441. Recuperado de http://pubs.acs.org/doi/pdf/10.1021/cg100146x
NLM
Menezes AS de, Santos AO dos, Almeida JMA, Bortoleto JRR, Cotta MA, Morelhão SL, Cardoso LP. Direct observation of tetragonal distortion in epitaxial structures through secondary peak split in a synchrotron radiation renninger scan [Internet]. Crystal Growth & Design. 2010 ; 10( 8): 3436-3441.[citado 2024 out. 18 ] Available from: http://pubs.acs.org/doi/pdf/10.1021/cg100146x
Vancouver
Menezes AS de, Santos AO dos, Almeida JMA, Bortoleto JRR, Cotta MA, Morelhão SL, Cardoso LP. Direct observation of tetragonal distortion in epitaxial structures through secondary peak split in a synchrotron radiation renninger scan [Internet]. Crystal Growth & Design. 2010 ; 10( 8): 3436-3441.[citado 2024 out. 18 ] Available from: http://pubs.acs.org/doi/pdf/10.1021/cg100146x
Trabalho de evento-anais periodico
Direct observation of tetragonal distortion in epitaxial structures through secondary peak split in a synchrotron radiation renninger scan (2010)
Menezes, Alan S de; Santos, Adenilson O dos; Almeida, Juliana M A; Bortoleto, José R R; Cotta, Monica A; Morelhão, Sérgio Luiz; Cardoso, Lisandro Pavie
Source: Crystal Growth & Design. Conference titles: 40th Anniversary Conference of the British Association for Crystal Growth (BACG). Unidade: IF
Subjects: EPITAXIA POR FEIXE MOLECULAR, RADIAÇÃO SINCROTRON
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MENEZES, Alan S de et al. Direct observation of tetragonal distortion in epitaxial structures through secondary peak split in a synchrotron radiation renninger scan. Crystal Growth & Design. Washington, DC: The Society. Disponível em: http://pubs.acs.org/doi/pdf/10.1021/cg100146x. Acesso em: 18 out. 2024. , 2010
APA
Menezes, A. S. de, Santos, A. O. dos, Almeida, J. M. A., Bortoleto, J. R. R., Cotta, M. A., Morelhão, S. L., & Cardoso, L. P. (2010). Direct observation of tetragonal distortion in epitaxial structures through secondary peak split in a synchrotron radiation renninger scan. Crystal Growth & Design. Washington, DC: The Society. Recuperado de http://pubs.acs.org/doi/pdf/10.1021/cg100146x
NLM
Menezes AS de, Santos AO dos, Almeida JMA, Bortoleto JRR, Cotta MA, Morelhão SL, Cardoso LP. Direct observation of tetragonal distortion in epitaxial structures through secondary peak split in a synchrotron radiation renninger scan [Internet]. Crystal Growth & Design. 2010 ; 10( 8): 3436-3441.[citado 2024 out. 18 ] Available from: http://pubs.acs.org/doi/pdf/10.1021/cg100146x
Vancouver
Menezes AS de, Santos AO dos, Almeida JMA, Bortoleto JRR, Cotta MA, Morelhão SL, Cardoso LP. Direct observation of tetragonal distortion in epitaxial structures through secondary peak split in a synchrotron radiation renninger scan [Internet]. Crystal Growth & Design. 2010 ; 10( 8): 3436-3441.[citado 2024 out. 18 ] Available from: http://pubs.acs.org/doi/pdf/10.1021/cg100146x
Artigo de periodico
Synchrotron X-ray imaging via ultra-small-angle scattering: principles of quantitative analysis and application in studying bone integration to synthetic grafting materials (2010)
Morelhão, Sérgio Luiz; Coelho, Paulo G; Hönnicke, Marcelo G
Source: European Biophysics Journal. Unidade: IF
Assunto: DIFRAÇÃO POR RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MORELHÃO, Sérgio Luiz e COELHO, Paulo G e HÖNNICKE, Marcelo G. Synchrotron X-ray imaging via ultra-small-angle scattering: principles of quantitative analysis and application in studying bone integration to synthetic grafting materials. European Biophysics Journal, v. 39, n. 5, p. 861-865, 2010Tradução . . Disponível em: https://doi.org/10.1007/s00249-009-0541-y. Acesso em: 18 out. 2024.
APA
Morelhão, S. L., Coelho, P. G., & Hönnicke, M. G. (2010). Synchrotron X-ray imaging via ultra-small-angle scattering: principles of quantitative analysis and application in studying bone integration to synthetic grafting materials. European Biophysics Journal, 39( 5), 861-865. doi:10.1007/s00249-009-0541-y
NLM
Morelhão SL, Coelho PG, Hönnicke MG. Synchrotron X-ray imaging via ultra-small-angle scattering: principles of quantitative analysis and application in studying bone integration to synthetic grafting materials [Internet]. European Biophysics Journal. 2010 ; 39( 5): 861-865.[citado 2024 out. 18 ] Available from: https://doi.org/10.1007/s00249-009-0541-y
Vancouver
Morelhão SL, Coelho PG, Hönnicke MG. Synchrotron X-ray imaging via ultra-small-angle scattering: principles of quantitative analysis and application in studying bone integration to synthetic grafting materials [Internet]. European Biophysics Journal. 2010 ; 39( 5): 861-865.[citado 2024 out. 18 ] Available from: https://doi.org/10.1007/s00249-009-0541-y

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